Capacitive pressure-responsive devices and their fabrication

• US 6,704,185 B2
• Filed: 11/05/2002
• Issued: 03/09/2004
• Est. Priority Date: 02/23/2000
• Status: Expired due to Fees

• Current Assignee: Dimitris Konstantin Tsoukalas, National Centre For Scientific Research, Pascal Jean Michel Normand
• Original Assignee: Dimitris Konstantin Tsoukalas, National Centre For Scientific Research, Pascal Jean Michel Normand
• Inventors: Goustouridis, Dimitrios Mattheos, Chatzandroulis, Stavros Emmanuel, Normand, Pascal Jean Michel, Tsoukalas, Dimitris Konstantin
• Primary Examiner(s): Reichard, Dean A.
• Assistant Examiner(s): Ha, Nguyen T.
• Application Number:
  US10/204,738
• Publication Number:
  US 20030107868A1
• Time in Patent Office: 490 Days
• Field of Search: 361/283.1, 361/303, 361/305, 361/283, 361/283.3, 361/283.4, 438/48, 438/53, 438/455, 438/456
• US Class Current: 361/283.1
• CPC Class Codes: G01L 1/148 using semiconductive material, e.g. silicon
• CPC Class Codes: G01L 9/0073 using a semiconductive diaphragm

Abstract

A method for making capacitive silicon pressure sensors and pressure switches with high long-term stability involves fabrication by wafer bonding of a silicon substrate wafer with another silicon wafer where a highly boron-doped diaphragm is defined by a self-aligned doping process through a window defined on an insulating layer. The long-term stability of the device is secured by anisotropically etching the window, e.g. by reactive ion etching, so as to create vertical window walls. The flatness of the diaphragm can be secured by the provision of an insulating film on the backside of the substrate wafer that compensates the stress on the silicon diaphragm created by the insulating layer present between the two wafers. The cavity formed by the window may contain gas or it may be evacuated in which case the fabrication method may also involve a process step facilitating the evacuation of the cavity and sealing the same using metal employed for making electrical connections.

Claims

1. A process for the production of a capacitive pressure-responsive device comprising a first relatively flexible electrode structure and a second relatively rigid or immobile electrode structure having opposed surfaces with a spacing layer therebetween, the spacing layer being formed with a window which defines a cavity between the two electrode structures to allow the spacing therebetween to vary in dependence upon external pressure, characterised in that the window is formed by a dry anisotropic etching technique, especially anisotropic plasma or reactive ion etching, so that the side walls of the windows are substantially free of any localised undercut region in the vicinity of the interface with the first relatively flexible electrode structure, the process comprising the steps of:

(a) forming the spacing layer on a wafer of a semiconductor material, optionally n or p type silicon, which forms one of the electrode structures;

(b) forming said window in the spacing layer by said dry anisotropic etching technique;

(c) doping the semiconductor wafer with a material (optionally boron) through the window to form a doped region overlying and extending beyond the perimeter of the window;

(d) assembling the first electrode structure with a second relatively rigid electrode structure so that the window forms a cavity between the two electrode structures; and

(e) selectively etching the semiconductor wafer to remove those regions which are not so doped or only lightly doped thereby forming a first relatively flexible electrode structure including said spacing layer.

2. A process as claimed in claim 1 in which the second electrode structure comprises a wafer of semiconductor material which has been doped to form a conductive layer and, optionally, having an insulating layer in superimposed relation with the conductive layer thereof, the first and second electrode structures being assembled together with the spacing layer contacting the conductive layer or the insulating layer if present.

3. A process as claimed in claim 1 including providing the less flexible electrode structure with a stress compensating layer of material on that side thereof remote from the spacing layer.

4. A process as claimed in claim 1 including the steps of forming a passageway in the spacing layer via which the cavity can be evacuated, evacuating the cavity via said passageway and subsequently sealing the passageway by means of conductive contact material to maintain the cavity in a state of evacuation.

5. A capacitive pressure-responsive device comprising a first relatively flexible electrode structure and a second relatively immobile or rigid electrode structure having opposed surfaces with a spacing layer therebetween, the spacing layer being formed with a window which defines a cavity between the two electrode structures to allow the spacing therebetween to vary in dependence upon external pressure, characterised in that the window is produced by a dry anisotropic etching technique, especially anisotropic plasma or reactive ion etching, with side walls which are substantially free of any localised undercut region in the vicinity of the interface with the first relatively flexible electrode structure, in which the relatively rigid or immobile electrode structure has a layer of stress compensating material on that side thereof which is remote from the spacing layer.

6. A device as claimed in claim 5 in which the spacing layer is formed integrally with the flexible electrode structure.

7. A device as claimed in claim 5 in which the relatively rigid electrode structure includes a conductive layer which contacts the spacing layer directly or in which the relatively rigid or immobile electrode structure includes a conductive layer and an insulating layer interposed between the conductive layer and the spacing layer.

8. A device as claimed in claim 5 in which the cavity is at least partially evacuated.

9. A device as claimed in claim 8 in which the cavity is linked to the exterior through a passageway formed in the spacing layer, the passageway being sealed by a conductive contact material, such as aluminium, to maintain the cavity in its state of evacuation.

10. A device as claimed in claim 5 in which the spacing layer comprises silicon oxide.

11. A process for the production of a capacitive pressure-responsive device comprising first and second electrode structures having opposed surfaces with a spacing layer there between, the spacing layer being formed with a window which defines a cavity between the two electrode structures to allow the spacing therebetween to vary in dependence upon external pressure, the process including providing a spacing layer on one of the electrode structures formed with a window, characterized by the steps of forming a passageway in the spacing layer via which the cavity can be evacuated, evacuating the cavity via said passageway and subsequently sealing the passageway by means of conductive contact material to maintain the cavity in a state of evacuation.

12. A process for the production of a capacitive pressure-responsive device comprising a first relatively flexible electrode structure and a second relatively rigid or immobile electrode structure having opposed surfaces with a spacing layer therebetween, the process comprising the steps of:

providing the second electrode structure with a stress compensating layer of material on that side thereof remote from the spacing layer; and

forming the spacing layer with a window which defines a cavity between the two electrode structures to allow the spacing there between to vary in dependence upon external pressure;

characterized in that the window is formed by a dry anisotropic etching technique, especially anisotropic plasma or reactive ion etching, so that the side walls of the windows are substantially free of any localized undercut region in the vicinity of the interface with the first relatively flexible electrode structure.

13. A process for the production of a capacitive pressure-responsive device comprising a first relatively flexible electrode structure and a second relatively rigid or immobile electrode structure having opposed surfaces with a spacing layer therebetween, the process comprising the steps of:

forming the spacing layer with a window which defines a cavity between the two electrode structures to allow the spacing there between to vary in dependence upon external pressure;

forming a passageway in the spacing layer via which the cavity can be evacuated;

evacuating the cavity via the passageway;

and subsequently sealing the passageway by means of conductive contact material to maintain the cavity in a state of evacuation;

characterised in that the window is formed by a dry anisotropic etching technique, especially anisotropic plasma or reactive ion etching, so that the side walls of the windows are substantially free of any localised undercut region in the vicinity of the interface with the first relatively flexible electrode structure.

14. A capacitive pressure-responsive device comprising a first relatively flexible electrode structure and a second relatively rigid or immobile electrode structure having opposed surfaces with a spacing layer therebetween, the spacing layer being formed with a window which defines a cavity between the two electrode structures to allow the spacing therebetween to vary in dependence upon external pressure, in which the cavity is at least partially evacuated and linked to the exterior through a passageway formed in the spacing layer, the passageway being sealed by a conductive contact material, such as aluminum, to maintain the cavity in its state of evacuation, and

characterised in that the window is produced by a dry anisotropic etching technique, especially anisotropic plasma or reactive ion etching, with side walls which are substantially free of any localised undercut region in the vicinity of the interface with the first relatively flexible electrode structure.