Method and apparatus for correcting heavily damaged images

• US 6,704,458 B2
• Filed: 12/12/2000
• Issued: 03/09/2004
• Est. Priority Date: 12/29/1999
• Status: Expired due to Term

• Current Assignee: Kodak Alaris Inc (KPP (no. 2) Trustees Ltd.)
• Original Assignee: Eastman Kodak Company
• Inventors: Ford, Gordon D.
• Primary Examiner(s): ROGERS, SCOTT A
• Application Number:
  US09/735,118
• Publication Number:
  US 20010031098A1
• Time in Patent Office: 1,183 Days
• Field of Search: 382/275, 382/260, 382/261, 382/262, 382/264, 382/254, 356/237.1, 356/239.1, 356/239.7, 356/239.8, 356/237.2, 356/237.3
• US Class Current: 382/275
• CPC Class Codes: G06T 5/20 using local operators
• CPC Class Codes: G06T 5/77 Retouching; Inpainting; Scratch removal

Abstract

A system and method for correcting defects in images. A secondary defect map, defining heavily damaged portions of the image which were not corrected automatically, is generated. The secondary defect map allows the user to correct the defects by highlighting the uncorrected areas. Once the secondary defect map is generated, if the user selects the defect, it is filled in with a correction value obtained from surrounding “good” pixels only, rather than all the pixels—corrected and uncorrected—in a surrounding area.

Claims

1. A method, comprising:

providing an image correcting system for correcting an image using a first defect map;

providing a selection unit for displaying a second defect map of pixels that were not corrected using said first defect map; and

providing a method for selecting one or more defective pixels in said second defect map for correction.

2. A method according to claim 1, including providing a method for using values of nondefective pixels within a correction region surrounding said one or more defective pixels to obtain a replacement value for said one or more defective pixels.

3. A method according to claim 2, said displaying a second defect map comprising comparing one or more pixels in said first defect map with a threshold value.

4. A method according to claim 2, said displaying a second defect map comprising determining which pixels on said first defect map were not corrected using said first defect map.

5. A method for correcting an image, comprising:

generating a primary defect map to correct an image; and

displaying a secondary defect map which defines pixels of the image that were not corrected using the primary defect map.

8. A method according to claim 5, said displaying a secondary defect map comprising determining which pixels on said primary defect map were not corrected using said primary defect map.

6. A method for correcting an image;

comprising;

displaying a secondary defect map of pixels that were corrected using a primary defect map; and

using values of nondefective pixels within a correction region surrounding one or more defective pixels on said secondary defect map to obtain a replacement value for said one or more defective pixels.

7. A method for correcting an image, comprising:

displaying a secondary defect map of pixels that were corrected using a primary defect map;

said displaying a secondary defect map comprising comparing one or more pixels in said primary defect map with a threshold value.

9. A system for correcting an image, comprising:

an image input device;

an image correcting system adapted to correct said image using a first defect map;

a selection unit configured to display a second defect map of pixels that were not corrected using said first defect map;

wherein said selection unit is further configured to select one or more defective pixels in said second defect map for correction.

10. A system according to claim 9, said image correcting system configured to use values of nondefective pixels within a correction region surrounding said one or more defective pixels to obtain a replacement value for said one or more defective pixels.

11. A system according to claim 10, said selection unit adapted to compare one or more pixels in said first defect map with a threshold value.

12. A system according to claim 9, said selection unit configured to determine which pixels on said first defect map were not corrected using said first defect map.

13. A system comprising:

a selection unit adapted to display a secondary defect map of pixels that were not corrected using a primary defect map; and

a user interface operable to receive instructions from a user for choosing a user correction method for correcting the pixels of the secondary defect map.

14. A system according to claim 13, wherein the user correction method comprises using values of nondefective pixels within a correction region surrounding one or more defective pixels on said secondary defect map to obtain a replacement value for said one or more defective pixels.

15. A system according to claim 14, said selection unit adapted to compare one or more pixels in said primary defect map with a threshold value.

16. A system according to claim 14, said selection unit adapted to determine which pixels on said primary defect map were not corrected using said primary defect map.