ARC fault or ground fault or ARC fault/ground fault trip signal generator and trip unit employing the same

• US 6,707,651 B2
• Filed: 06/03/2002
• Issued: 03/16/2004
• Est. Priority Date: 06/03/2002
• Status: Active Grant

• Current Assignee: Eaton Intelligent Power Limited (Eaton Corporation PLC.)
• Original Assignee: Eaton Corp. (Wisconsin) (Eaton Corporation PLC.)
• Inventors: Miller, Theodore J., Elms, Robert T.
• Primary Examiner(s): Sircus, Brian
• Assistant Examiner(s): Benenson, Boris
• Application Number:
  US10/160,912
• Publication Number:
  US 20030223161A1
• Time in Patent Office: 652 Days
• Field of Search: 361/42, 361/43, 361/44, 361/45, 361/46, 361/47, 361/49, 361/50
• US Class Current: 361/42
• CPC Class Codes: H02H 1/0015 Using arc detectors
• CPC Class Codes: H02H 1/06 Arrangements for supplying operative power power supply arrangements in general G05F, H02M
• CPC Class Codes: H02H 3/334 with means to produce an artificial unbalance for other protection or monitoring reasons or remote control H02H3/338 takes precedence

Abstract

A trip signal generator for an arc fault or ground fault trip unit includes two inputs electrically interconnected with the two outputs of arc fault and ground fault detection circuits. A second input is electrically interconnected with an anode of a semiconductor switching device, such as a triac or SCR, which drives a trip coil of a trip solenoid. A circuit monitors the outputs of a power supply and provides an output when the outputs of the power supply are operational. A trip logic circuit drives a gate of the semiconductor switching device when the outputs of the power supply are operational, when one of the two first inputs is active, and when the second input is inactive.

Claims

1. A trip unit for an arc fault or ground fault circuit breaker, said trip unit comprising:

a trip actuator having a trip coil;

a semiconductor switching device driving said trip coil, said semiconductor switching device including a gate and an output electrically interconnected with said trip coil;

an arc fault or ground fault detection circuit including at least one output having an arc fault or ground fault detection signal;

a power supply having an output; and

a trip signal generator comprising;

at least one first input electrically interconnected with said at least one output of said arc fault or ground fault detection circuit,

a second input electrically interconnected with said output of said semiconductor switching device,

a power supply monitor monitoring the output of said power supply, said power supply monitor having an output, and

a circuit having an output electrically interconnected with the gate of said semiconductor switching device, said circuit comprising;

a first switch controlled by said second input and electrically interconnected with said output of said semiconductor switching device, said first switch having an output,

a second switch controlled by the output of said first switch and powered from the output of said power supply monitor, said second switch having an output,

a third switch controlled by the output of said second switch, said third switch powered from the output of said power supply, said third switch having said output electrically interconnected with the gate of said semiconductor switching device, and

at least one fourth switch controlled by said at least one first input electrically interconnected with said at least one output of said arc fault or ground fault detection circuit, said at least one fourth switch enabling said third switch.

2. The trip unit of claim 1 wherein said arc fault or ground fault detection circuit includes a first output having an arc fault detection signal and a second output having a ground fault detection signal;

and wherein said trip signal generator comprises two first inputs, with one of said first inputs electrically interconnected with said first output and with another one of said first inputs electrically interconnected with said second output.

3. The trip unit of claim 1 wherein said arc fault or ground fault detection circuit includes an output having an arc fault detection signal;

and wherein said trip signal generator comprises one first input, which is electrically interconnected with said output having an arc fault detection signal.

4. The trip unit of claim 1 wherein said arc fault or ground fault detection circuit includes an output having a ground fault detection signal;

and wherein said trip signal generator comprises one first input, which is electrically interconnected with said output having a ground fault detection signal.

5. The trip unit of claim 1 wherein said semiconductor switching device is a triac;

and wherein said output of said circuit is electrically interconnected with said gate of said triac.

6. The trip unit of claim 5 wherein said output of said circuit is electrically interconnected with said gate of said triac by a resistor.

7. The trip unit of claim 6 wherein said output of said circuit sources a current of at least about 5 mA to said gate of said triac through said resistor.

8. The trip unit of claim 1 wherein said semiconductor switching device is an SCR;

and wherein said output of said circuit is electrically interconnected with said gate of said SCR.

9. The trip unit of claim 8 wherein said output of said circuit is electrically interconnected with said gate of said SCR by a resistor.

10. The trip unit of claim 9 wherein said output of said circuit sources a current of at least about 200 μ

A to said gate of said SCR through said resistor.

11. The trip unit of claim 1 wherein said trip signal generator is an integrated circuit.

12. The trip unit of claim 1 wherein said integrated circuit is a bipolar integrated circuit.

13. The trip unit of claim 1 wherein said second input of said trip signal generator is electrically interconnected with said output of said semiconductor switching device by a resistor.

14. A trip signal generator for an arc fault or ground fault trip unit comprising a trip actuator having a trip coil, a semiconductor switching device driving said trip coil, said semiconductor switching device including a gate and an output electrically interconnected with said trip coil, an arc fault or ground fault detection circuit including at least one output having an arc fault or ground fault detection signal, and a power supply with an output, said trip signal generator comprising:

at least one first input electrically interconnected with said at least one output of said arc fault or ground fault detection circuit,

a second input electrically interconnected with said output of said semiconductor switching device,

a power supply monitor monitoring the output of said power supply, said power supply monitor having an output, and

a circuit having an output electrically interconnected with the gate of said semiconductor switching device, said circuit comprising;

a first switch controlled by said second input and electrically interconnected with said output of said semiconductor switching device, said first switch having an output,

a second switch controlled by the output of said first switch and powered from the output of said power supply monitor, said second switch having an output,

a third switch controlled by the output of said second switch, said third switch powered from the output of said power supply, said third switch having said output electrically interconnected with the gate of said semiconductor switching device, and

at least one fourth switch controlled by said at least one first input electrically interconnected with said at least one output of said arc fault or ground fault detection circuit, said at least one fourth switch enabling said third switch.

15. The trip signal generator of claim 14 wherein said at least one first input is two first inputs, with one of said first inputs structured to receive an arc fault detection signal, and with another one of said first inputs structured to receive a ground fault detection signal.

16. The trip signal generator of claim 14 wherein said at least one first input is one first input, which is adapted to receive an arc fault detection signal.

17. The trip signal generator of claim 14 wherein said at least one first input is one first input, which is adapted to receive a ground fault detection signal.

18. The trip signal generator of claim 14 wherein said trip signal generator is an integrated circuit.

19. The trip signal generator of claim 18 wherein said integrated circuit is a bipolar integrated circuit.

20. The trip signal generator of claim 14 wherein said semiconductor switching device further includes a cathode and an anode, which is the output of said semiconductor switching device;

wherein said first switch is a transistor having a base, an emitter and a collector, said base being electrically interconnected with said anode of said semiconductor switching device by a first resistor, said emitter being electrically interconnected with said cathode of said semiconductor switching device by a second resistor, and said collector controlling said second switch.

21. The trip signal generator of claim 14 wherein said second switch includes a first transistor, a second transistor, a third transistor and a fourth transistor, said first transistor having a base, an emitter and a collector, said base being electrically interconnected with said collector and with the output of said first switch, said emitter being powered from the output of said power supply monitor, said second transistor having a base, an emitter and a collector, said base of said second transistor being electrically interconnected with the base of said first transistor, said emitter of said second transistor being electrically interconnected with the emitter of said first transistor, said third transistor having a base, an emitter and a collector, said base of said third transistor being electrically interconnected with said collectors of said second and third transistors, said fourth transistor having a base, an emitter and a collector, said base of said fourth transistor being electrically interconnected with said collector of said fourth transistor and said emitter of said third transistor, said collector of said second transistor controlling said third switch.

22. The trip signal generator of claim 14 wherein said third switch includes a first transistor, a second transistor and a third transistor, said first transistor having a base, an emitter and a collector, said base being electrically interconnected with the output of said second switch, said emitter being enabled by said fourth switch, said collector being powered from the output of said power supply, said second transistor having a base, an emitter and a collector, said base of said second transistor being electrically interconnected with the collector of said first transistor, said emitter of said second transistor being powered from the output of said power supply, said third transistor having a base, an emitter and a collector, said base of said third transistor being electrically interconnected with the collector of said second transistor, said collector of said third transistor being powered from the output of said power supply, said emitter of said third transistor being electrically interconnected with the gate of said semiconductor switching device by a resistor.

23. The trip signal generator of claim 22 wherein said semiconductor switching device is a triac;

and wherein said resistor is selected to drive the gate of said triac.

24. The trip signal generator of claim 22 wherein said semiconductor switching device is an SCR;

and wherein said resistor is selected to drive the gate of said SCR.

25. The trip signal generator of claim 14 wherein said semiconductor switching device further includes a cathode;

and wherein said at least one fourth switch includes at least one transistor having a base, an emitter and a collector, said base being electrically interconnected with one of said at least one output of said arc fault or ground fault detection circuit, said emitter being electrically interconnected with said cathode of said semiconductor switching device, said collector enabling said third switch.

26. A trip signal generator for an arc fault or ground fault trip unit comprising a trip actuator driven by a semiconductor switching device having an anode and a gate, an arc fault or ground fault detection circuit including at least one output having an arc fault or ground fault detection signal, and a power supply with an output, said trip signal generator comprising:

at least one first input electrically interconnected with said at least one output of said arc fault or ground fault detection circuit;

a second input electrically interconnected with the anode of said semiconductor switching device;

means for monitoring the output of said power supply and providing an output when said output of said power supply is operational; and

means for driving the gate of said semiconductor switching device when said output of said power supply is operational, when said at least one first input is active, and when said second input is inactive.

27. The trip signal generator of claim 26 wherein said semiconductor switching device is a triac;

wherein said second input is structured for electrical interconnection with the anode of said triac; and

wherein said means for driving the gate of said triac generates a gate drive signal of about 5 mA.

28. The trip signal generator of claim 27 wherein said trip signal generator is structured for operation with an average current from said power supply of less than about 2 mA.

29. The trip signal generator of claim 26 wherein said means for driving the gate of said semiconductor switching device comprises a first switch controlled by said second input and electrically interconnected with said anode of said semiconductor switching device, said first switch having an output;

a second switch controlled by the output of said first switch and powered from the output of said means for monitoring, said second switch having an output;

a third switch controlled by the output of said second switch, said third switch powered from the output of said power supply, said third switch having said output electrically interconnected with the gate of said semiconductor switching device; and

at least one fourth switch controlled by said at least one first input electrically interconnected with said at least one output of said arc fault or ground fault detection circuit, said at least one fourth switch enabling said third switch.