Warpage measurement system and methods

• US 6,711,828 B2
• Filed: 12/05/2001
• Issued: 03/30/2004
• Est. Priority Date: 12/05/2001
• Status: Expired due to Term

• Current Assignee: First Data Corporation (Fiserv Incorporated)
• Original Assignee: First Data Corporation (Fiserv Incorporated)
• Inventors: Yates, Sandra S., Ussery, Clarence A., Fuentes, Gil V., McCune, Andrew S.
• Primary Examiner(s): Fulton, Christopher W.
• Assistant Examiner(s): JOHNSON, AMY COHEN
• Application Number:
  US10/001,979
• Publication Number:
  US 20030101608A1
• Time in Patent Office: 846 Days
• Field of Search: 33/1.V, 338/32, 338/33, 336/791, 335/49, 335/55, 335/51--54, 335/33
• US Class Current: 33/533
• CPC Class Codes: B65H 2220/01 indicating an entity as a function of which control, adjustment or change is performed, i.e. input
• CPC Class Codes: B65H 2220/03 indicating an entity which is measured, estimated, evaluated, calculated or determined but which does not constitute an entity which is adjusted or changed by the control process per se
• CPC Class Codes: B65H 2220/11 indicating that the input or output entities exclusively relate to machine elements
• CPC Class Codes: B65H 2511/15 Height, e.g. of stack
• CPC Class Codes: B65H 2511/22 Distance
• CPC Class Codes: B65H 2701/1916 Envelopes and articles of mail
• CPC Class Codes: B65H 2801/06 Office-type machines, e.g. photocopiers
• CPC Class Codes: B65H 31/00 Pile receivers carriers used for associating, collating or gathering articles B65H39/00
• CPC Class Codes: B65H 43/00 Use of control, checking, or safety devices, e.g. automatic devices comprising an element for sensing a variable
• CPC Class Codes: G01B 5/061 height gauges

Abstract

A method for measuring the height variability of a stack of materials comprises placing a stack of materials onto a holder that comprises a base and at least two sides extending from the base such that the stack of materials rests on the base and is generally flush with the sides. A distance of a top of the stack of materials relative to a fixed plane is measured at various locations along the top of the stack of materials. The height variability of the stack is determined based on the measurements.

Claims

1. A method for determining warpage by measuring the height variability along a plurality of locations at the top surface of a stack of materials, the method comprising:

placing a stack of materials onto a holder that comprises a base and at least two sides extending from the base such that the stack of materials rests on the base and is generally flush with the sides;

measuring a distance of the top surface of the stack of materials relative to a fixed plane, separately at each of the locations along the top of the stack of materials; and

determining the height variability of the stack based on the differences in the measurements at the plurality of locations.

2. A method as in claim 1, wherein the sides are perpendicular to the base and to each other to define a corner between two of the sides, and further comprising placing the stack of materials onto the base such that an edge of the stack of materials fits into the corner.

3. A method as in claim 1, wherein the fixed plane is defined by the base, and further comprising distance markers on the sides, and wherein the distances are measured by determining the location of the top of the stack of materials relative to the markers.

4. A method as in claim 1, wherein the holder further includes a lid that is parallel to the base, and wherein the lid defines the fixed plane.

5. A method as in claim 4, wherein the lid includes a plurality of openings, and wherein the distances are measured by placing a distance measurement instrument through the openings until contacting the top of the stack of materials.

6. A method as in claim 1, wherein the materials comprise paper products that are selected from a group consisting of sheets, envelopes and folded inserts.

7. A method as in claim 1, further comprising applying acceptance criteria to the determined variability, wherein the stack of materials comprise envelopes that have an acceptable variability if the determined variability is less than about 0.125 inch to about 0.0625 inch for up to about 100 pieces of materials in the stack.

8. A method as in claim 1, wherein an x axis and a y axis is defined where the sides contact the base, and wherein the height variability is determined at locations along the top of the stack that are parallel to the x axis and the y axis.

9. A method as in claim 1, wherein the distances are measured electronically, and further comprising processing the distances with a processor to determine the variability.

10. A measuring system for determining warpage in a stack of material, comprising:

a holder comprising a base and at least two sides extending from the base wherein the holder is adapted to hold the stack of materials such that the stack of materials is generally flush with the two sides;

a measuring device that is configured to measure the distance between each of a plurality of locations on a top of the stack of materials and a fixed plane, whereby the height variability of the stack of materials may be calculated from differences in the measurements; and

a positioning device that is configured to permit the measuring device to be positioned at each of the locations along the top surface of the stack of materials.

11. A system as in claim 10, wherein the two sides are perpendicular to the base and to each other to define a corner, wherein the corner is adapted to receive an edge of the stack of materials.

12. A system as in claim 10, wherein the fixed plane is defined by the base, and further comprising distance markers disposed on the sides to permit the distance of the top of the stack of materials relative to the base to be measured.

13. A system as in claim 10, wherein the holder further includes a lid that is parallel to the base, and wherein the lid defines the fixed plane.

14. A system as in claim 13, wherein the lid includes a plurality of openings, wherein the positioning device comprises the lid, and wherein the measuring device is configured to be placed through the openings to measure the distance between the lid and the top of the stack of materials.

15. A system as in claim 10, wherein the materials comprise paper materials that are selected from a group consisting of sheets, envelopes and folded inserts.

16. A system as in claim 10, wherein an x axis and a y axis are defined where the sides contact the base, and wherein the measuring device is configured to measure the distances at locations along the stack that are parallel to the x axis and the y axis.

17. A system as in claim 10, wherein the measuring device is configured to produce the measurements in electronic form, and further comprising a processor that is configured to calculate the height variability based on the measurements.