Method and apparatus for detecting failure in solar cell module, and solar cell module

• US 6,717,519 B2
• Filed: 10/21/2002
• Issued: 04/06/2004
• Est. Priority Date: 04/08/1998
• Status: Expired due to Fees

• Current Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Original Assignee: Canon Kabushiki Kaisha (Canon Inc.)
• Inventors: Takehara, Nobuyoshi, Manabe, Naoki, Kobayashi, Takuma
• Primary Examiner(s): Hofsass, Jeffery
• Assistant Examiner(s): Previl, Daniel
• Application Number:
  US10/274,146
• Publication Number:
  US 20030063008A1
• Time in Patent Office: 533 Days
• Field of Search: 340/635, 340/636, 340/664, 340/660, 340/661, 340/662, 340/663, 340/501, 340/507, 340/513, 340/514, 340/870.16, 340/870.17, 340/870.29, 320/149, 320/150, 320/151, 320/122, 429/50, 429/61
• US Class Current: 340/635
• CPC Class Codes: H01L 31/044 including bypass diodes bypass diodes in the junction box H02S40/34
• CPC Class Codes: H02S 50/10 Testing of PV devices, e.g. of PV modules or single PV cells testing of semiconductor devices during manufacturing H01L22/00
• CPC Class Codes: Y02E 10/50 Photovoltaic [PV] energy

Abstract

The temperature of a bypass diode of a solar cell module is measured by a temperature detector from the exterior of the solar cell module, and the results of temperature detection of each bypass diode are mutually compared to detect the presence or absence of failure in the solar cell module. Also at least one solar cell in the solar cell module is covered with a light shielding plate, then a current flowing in the bypass diode bypassing to the covered solar cell is detected, and a failed solar cell module is detected from the result of the current detection. Also the solar cell module is provided with a temperature detector capable of detecting the temperature of the bypass diode and the temperature of an internal portion of the solar cell module other than the bypass diode. In this way, it is possible to detect a failure in the solar cell module easily and precisely, and also to detect short circuit failure in the solar cell.

Claims

1. A failure detecting method of detecting a failure in a solar cell module, which comprises detecting a temperature of a bypass diode in a solar cell module from an exterior of the solar cell module, and detecting a presence or absence of a failure of the solar cell module based on a result of the temperature detection.

2. A failure detecting method according to claim 1, wherein the detection of the presence or absence of the failure in the solar cell module is executed by mutual comparison of results of the temperature detection on each bypass diode.

3. A failure detecting method according to claim 1, wherein the temperature detection is executed by a temperature detection means of non-contact type.

4. A failure detecting method according to claim 1, wherein the temperature detection is executed by a temperature detection means of contact type.

5. A failure detecting method according to claim 1, wherein the solar cell module comprises, in a vicinity of the bypass diode, means for preventing temperature rise resulting from a cause other than a current.

6. A failure detecting apparatus for detecting a failure in a solar cell module, comprising a temperature detection means for detecting a temperature of a bypass diode in a solar cell module from an exterior of the solar cell module.

7. A failure detecting apparatus according to claim 6, further comprising means for detecting a presence or absence of a failure in the solar cell module by mutual comparison of results of temperature detection on each bypass diode.

8. A failure detecting apparatus according to claim 6, wherein the temperature detection means is of non-contact type.

9. A failure detecting apparatus according to claim 6, wherein the temperature detection means is of contact type.

10. A solar cell module comprising a temperature detection means provided therein for detecting a temperature of a bypass diode in the solar cell module and a temperature of an internal portion of the solar cell module other than the bypass diode.

11. A solar cell module according to claim 10, wherein the temperature detection means is means for simultaneously detecting the temperature of the bypass diode in the solar cell module and the temperature of the internal portion of the solar cell module other than the bypass diode.

12. A solar cell module according to claim 10, wherein the temperature detection means is a visual temperature detection means.

13. A solar cell module according to claim 12, wherein the color changing member is means for showing a reversible color change in response to a temperature change.

14. A solar cell module according to claim 10, wherein the temperature detection means is a color changing member for showing a color change in response to a temperature change.