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Integrated circuit having redundant, self-organized architecture for improving yield

  • US 6,717,869 B2
  • Filed: 04/25/2002
  • Issued: 04/06/2004
  • Est. Priority Date: 04/25/2002
  • Status: Expired due to Fees
First Claim
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1. A method for increasing the yield and/or reliability of an integrated circuit having a common circuit, said method comprising:

  • (a) connecting to the common circuit a plurality of mutually redundant clusters each having a respective processing unit and associated auxiliary components, (b) self-testing the respective processing unit in each cluster, and (c) disconnecting a faulty or unresponsive cluster from the common circuit so that failure of one cluster does not cause failure of the integrated circuit.

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