Multilevel interconnect structure with low-k dielectric
First Claim
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1. A semiconductor device comprising:
- a substrate assembly; and
at least one interconnect structure on said substrate assembly, said interconnect structure comprising;
a first bilayer defining a first receptacle;
a first metal plug formed in said first receptacle;
a second bilayer defining a second receptacle above said first metal plug;
a metal layer having a portion elevated above said substrate assembly and a portion filling said second receptacle such that said metal layer is in electrical contact with said substrate assembly, and wherein said bilayers are selected from the group consisting of titanium/copper, chromium/copper, titanium nitride/copper, tantalum/copper, W/copper and WN/copper;
a gas surrounding said first and second receptacles; and
a low-k dielectric film on said metal layer.
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Abstract
A multilevel interconnect structure with a low-k dielectric constant is fabricated in an integrated circuit structure by the steps of depositing a layer of photoresist on a substrate assembly, etching the photoresist to form openings, forming a metal layer on the photoresist layer to fill the openings and then removing the photoresist layer by, for example, ashing. The metal layer is supported by the metal which filled the openings formed in the photoresist.
27 Citations
21 Claims
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1. A semiconductor device comprising:
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a substrate assembly; and
at least one interconnect structure on said substrate assembly, said interconnect structure comprising;
a first bilayer defining a first receptacle;
a first metal plug formed in said first receptacle;
a second bilayer defining a second receptacle above said first metal plug;
a metal layer having a portion elevated above said substrate assembly and a portion filling said second receptacle such that said metal layer is in electrical contact with said substrate assembly, and wherein said bilayers are selected from the group consisting of titanium/copper, chromium/copper, titanium nitride/copper, tantalum/copper, W/copper and WN/copper;
a gas surrounding said first and second receptacles; and
a low-k dielectric film on said metal layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A semiconductor device comprising:
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a substrate assembly;
a metal layer in electrical contact with at least a portion of said substrate assembly, said metal layer comprising a portion elevated above said substrate assembly;
a metal component in electrical contact with said metal layer and said at least a portion of said substrate assembly, said metal component supporting said elevated portion of said metal layer;
an adhesion promoter/diffusion barrier bilayer between said metal layer and said metal component, wherein said adhesion promoter/diffusion barrier bilayer is selected from the group consisting of titanium/copper, chromium/copper, titanium nitride/copper, tantalum/copper, W/copper and WN/copper;
a gas surrounding said metal component; and
a low-k dielectric film on said metal layer. - View Dependent Claims (20, 21)
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Specification