Method and apparatus for determining the reflectance of translucent objects

• US 6,721,054 B1
• Filed: 10/11/2001
• Issued: 04/13/2004
• Est. Priority Date: 04/15/1999
• Status: Expired due to Fees

• Current Assignee: David L. Spooner
• Original Assignee: David L. Spooner
• Inventors: Spooner, David L.
• Primary Examiner(s): Font, Frank G.
• Assistant Examiner(s): Brown, Khaled
• Application Number:
  US09/958,450
• Time in Patent Office: 915 Days
• Field of Search: 356/243.1, 356/243.5, 356/243.8, 356/308, 356/319, 356/326, 356/328, 356/429, 356/445, 358/504, 358/509, 250/339.07, 250/559.01, 250/559.11, 345/600
• US Class Current: 356/445
• CPC Class Codes: G01N 21/274 Calibration, base line adjustment, drift correction
• CPC Class Codes: G01N 21/4738 Diffuse reflection precedence is given to G01N21/55 - G01N21/57 if specular component is taken into consideration, e.g. also for testing fluids, fibrous materials

Abstract

A method for accurately measuring the reflectance of translucent objects by illuminating small areas of the object is disclosed. The method involves determining the lateral diffusion error by use of a predetermined set of calibration standards. The lateral diffusion error is added to the uncorrected reflectance to produce the corrected reflectance value. The method has widespread potential applications in the paper, printing, textile, coating, and food industries.

Claims

1. A method for determining a corrected reflectance value for a translucent object, the method comprising the steps of:

a) measuring a relationship between a normalized lateral diffusion error and a spatial distribution value for each of a set of calibration standards, by;

i) illuminating an illuminated area of a standard and determining a first reflectance for a measured area of the standard,

ii) illuminating only the measured area of the standard and determining a second reflectance for the measured area of the standard,

iii) calculating the normalized lateral diffusion error for the standard from the first reflectance and the second reflectance,

iv) determining the spatial distribution value for at least one of the first reflectance and the second reflectance,

v) preparing a calibration curve showing the relationship between the normalized lateral diffusion error and the spatial distribution value for each standard;

b) determining an uncorrected reflectance for a measured area of the object by;

i) illuminating an area of the object to produce the measured area of the object,

ii) measuring an uncorrected reflectance for the measured area of the object;

c) determining at least one spatial distribution value for the measured area of the object from the reflectance of at least two concentric areas of the measured area of the object;

d) determining a normalized lateral diffusion error for the uncorrected reflectance of the measured area of the object from the spatial distribution value for the measured area of the object and the calibration curve; and

e) calculating the corrected reflectance value from the uncorrected reflectance for the measured area of the object and the normalized lateral diffusion error;

in which;

the illuminated area of the standard is larger than the measured area of the standard; and

the measured area of the standard is far enough away from the edge of the illuminated area of the standard to be essentially free from diffusion effects.

2. The method of claim 1 one spatial distribution value is determined for the measured area of the object.

3. The method of claim 2 in which the object is illuminated by visible radiation.

4. The method of claim 3 in which the corrected reflectance value is determined at a single wavelength.

5. The method of claim 4 in which the object Is illuminated by a scanning light source.

6. The method of claim 5 in which the scanning light source is produced by serially illuminating the segments of a coaxially segmented fiber optical system.

7. The method of claim 1 in which the object is illuminated by visible radiation.

8. The method of claim 1 in which the corrected reflectance value is determined at a single wavelength.

9. The method of claim 1 In which the object is illuminated by a scanning light source.

10. The method of claim 9 in which the scanning light source is produced by serially illuminating the segments of a coaxially segmented fiber optical system.

11. The method of claim 1 in which the measured area of the standard is at or near the center of the illuminated area of the standard.

12. A method for determining a corrected reflectance value for a translucent object, the method comprising the steps of:

a) measuring a relationship between a normalized lateral diffusion error and a spatial distribution value for each of a set of calibration standards, by;

i) illuminating an illuminated area of a standard and determining a first reflectance for a measured area of the standard,

ii) illuminating only the measured area of the standard and determining a second reflectance for the measured area of the standard,

iii) calculating the normalized lateral diffusion error for the standard from the first reflectance and the second reflectance,

iv) determining the spatial distribution value for at least one of the first reflectance and the second reflectance,

v) preparing a calibration curve showing the relationship between the normalized lateral diffusion error and the spatial distribution value for each standard;

b) determining an uncorrected reflectance for a measured area of the object by;

i) illuminating an area of the object to produce the measured area of the object,

ii) measuring an uncorrected reflectance for the measured area of the object;

c) determining at least one spatial distribution value for the measured area of the object from the reflectance of at least two concentric areas of the measured area of the object;

d) determining a normalized lateral diffusion error for the uncorrected reflectance of the measured area of the object from the spatial distribution value for the measured area of the object and the calibration curve; and

e) calculating the corrected reflectance value from the uncorrected reflectance for the measured area of the object and the normalized lateral diffusion error;

in which;

the illuminated area of the standard is larger than the measured area of the standard;

the measured area of the standard is far enough away from the edge of the illuminated area of the standard to be essentially free from diffusion effects; and

two spatial distribution values are determined for the measured area of the object.

13. The method of claim 12 in which the object is illuminated by visible radiation.

14. The method of claim 13 in which the corrected reflectance value is determined at a single wavelength.

15. The method of claim 14 in which the object is illuminated by a scanning light source.

16. The method of claim 15 in which the scanning light source is produced by serially illuminating the segments of a coaxially segmented fiber optical system.

17. An apparatus for determining a corrected reflectance value for a translucent object, the apparatus comprising:

a light source that sequentially illuminates all regions of the object within a sampled area;

a detector that measures the intensity of the light reflected by the sequentially illuminated regions of the sampled area of the object;

a computer that;

generates a synchronizing signal that initiates the sequential illumination,

calculates an uncorrected reflectance by summing the components of a spatial light pattern produced by the sequential illumination,

derives a normalized lateral diffusion error, and

adds the normalized lateral diffusion error and the uncorrected reflectance to give the corrected reflectance;

in which the light source that sequentially illuminates all regions of the object within the sampled area comprises a coaxially segmented fiber optical system.

18. The apparatus of claim 17 in which:

the apparatus additionally comprises an output device and,

the computer sends the corrected reflectance to the output device.

19. The apparatus of claim 17 in which the coaxially segmented fiber optical system is a three channel fiber assembly consisting of a center bindle and two concentric ring bundles.

20. The apparatus of claim 17 in which the coaxially segmented fiber optical system is a fiber bundle surrounded by an adjoining coaxial ring of fibers.