Optical configuration and method for differential refractive index measurements

• US 6,734,956 B2
• Filed: 05/06/2002
• Issued: 05/11/2004
• Est. Priority Date: 05/06/2002
• Status: Expired due to Fees

• Current Assignee: Reichert, Inc. (Ametek Incorporated)
• Original Assignee: Reichert, Inc. (Ametek Incorporated)
• Inventors: Cordier, Bruce R., Sharma, Keshav D., Byrne, Michael J., Atkinson, Robert C.
• Primary Examiner(s): STAFIRA, MICHAEL PATRICK
• Application Number:
  US10/139,577
• Publication Number:
  US 20030206290A1
• Time in Patent Office: 736 Days
• Field of Search: 356/436, 356/445-448, 356/128-136
• US Class Current: 356/128
• CPC Class Codes: G01N 21/4133 Refractometers, e.g. differential
• CPC Class Codes: G01N 21/43 by measuring critical angle

Abstract

An optical configuration for measuring a difference in refractive index between a first sample and a second sample comprises partitioned first and second optical interfaces symmetrically illuminated by an illumination beam to provide first and second partial beams defined by the refractive index of the first and second samples, respectively. A linear scanned array is aligned in a meridional plane of the optical configuration for detection purposes, and an optical multiplexor is provided upstream of the linear scanned array for receiving the first and second partial beams and defining first and second optical channels carrying optical signal information corresponding to the first and second partial beams. The optical multiplexor switches between optical channels, such that the linear scanned array detects either the first or second optical channel at a given time. Thus, differential measurements are possible using a single linear array. Embodiments for critical angle and surface plasmon resonance refractive index measurements are disclosed. The disclosure also relates to methods for measuring a difference in refractive index between a first sample and a second sample in accordance with the described optical configuration embodiments.

Claims

1. An optical configuration for use in measuring a difference in refractive index between a first sample and a second sample, said optical configuration comprising:

a first optical interface associated with said first sample;

a second optical interface associated with said second sample;

an illumination beam traveling along an optical path, light from said illumination beam being incident upon said first and second optical interfaces to provide a first partial beam defined by the refractive index of said first sample and a second partial beam defined by the refractive index of said second sample;

a linear scanned array comprising a plurality of photoelectric cells each providing an output pulse during a scan having an amplitude determined by the amount of illumination of the corresponding cell by incident light; and

optical multiplexing means upstream of said linear scanned array for receiving said first and second partial beams and defining first and second optical channels, said first optical channel containing optical signal information associated with said first partial beam and said second optical channel containing optical signal information associated with said second partial beam, said first partial beam exhibiting a feature indicative of said refractive index of said first sample on said array and said second partial beam exhibiting a feature indicative of said refractive index of said second sample on said array.

2. The optical configuration recited in claim 1 wherein said difference in refractive index can be determined from a difference between the respective locations of said exhibited features on said array.

3. The optical configuration according to claim 1, wherein said optical path defines a Y-Z meridional plane of said optical configuration and said first and second optical interfaces are located on opposite sides of said Y-Z meridional plane.

4. The optical configuration according to claim 3, wherein said linear scanned array is aligned in said Y-Z meridional plane.

5. The optical configuration according to claim 1, wherein said first and second optical interfaces are critical angle optical interfaces, such that said first and second partial beams exhibit respective shadowlines as features on said array.

6. The optical configuration according to claim 1, wherein said first and second optical interfaces are evanescent wave optical interfaces, such that said first and second partial beams exhibit respective resonance minimums as features on said array.

7. The optical configuration according to claim 1, wherein said optical multiplexing means comprises a liquid crystal shutter.

8. The optical configuration according to claim 7, wherein said liquid crystal shutter defines a first area arranged to receive said first partial beam and a second area arranged to receive said second partial beam, said first area of said shutter alternating between a transmitting state and an opaque state and said second area of said shutter alternating between an opaque state and a transmitting state in opposite synchronization with said first area of said shutter.

9. The optical configuration according to claim 7, wherein said liquid crystal shutter defines a first area arranged to receive said first partial beam and a second area arranged to receive said second partial beam, said first area of said shutter defining a pattern of sub-areas alternating spatially and temporally between a transmitting state and an opaque state and said second area of said shutter defining a corresponding pattern of sub-areas alternating spatially and temporally between a transmitting state and an opaque state in opposite synchronization with said pattern of sub-areas of said first area of said shutter.

10. The optical configuration according to claim 1, wherein said first and second optical interfaces are prepared on a slide selectively movable into and out of said optical path.

11. The optical configuration according to claim 4, further comprising a prism including a light entry surface, a light exit surface, and said sample surface, said illumination beam entering said prism through said light entry surface, and said first and second partial beams exiting said prism through said light exit surface.

12. The optical configuration according to claim 11, wherein said first and second optical interfaces are formed by contacting a first area of said sample surface with said first sample and contacting a second area of said sample surface with said second sample.

13. The optical configuration according to claim 12, further comprising a partition for dividing said sample surface of said prism along said Y-Z meridional plane to prevent mixing of said first sample and said second sample.

14. The optical configuration according to claim 13, wherein said partition is formed of synthetic rubber.

15. The optical configuration according to claim 11, wherein said first and second optical interfaces are formed by coupling a metal film to said sample surface, said metal film having a first area contacted by said first sample and a second area contacted by said second sample.

16. The optical configuration according to claim 15, wherein said metal film is indirectly coupled to said sample surface.

17. The optical configuration according to claim 15, wherein said metal film is directly coupled to said sample surface.

18. The optical configuration according to claim 11, further comprising an optical element after said optical multiplexing means for receiving said first and second partial beams and redirecting said first and second partial beams along converging directions toward said meridional plane.

19. The optical configuration according to claim 18, wherein said optical element is a cylinder lens.

20. The optical configuration according to claim 18, wherein said optical element is a biprism.

21. The optical configuration according to claim 11, further comprising a focusing lens for focusing said illumination beam at a point within said prism, whereby said beam of light becomes a diverging cone of light having respective symmetrical portions on opposite sides of said meridional plane to be incident upon said first and second optical interfaces.

22. The optical configuration according to claim 21, wherein said focusing lens is affixed to said light entry surface of said prism.

23. The optical configuration according to claim 1, wherein one of said first and second samples is a reference sample having a known index of refraction.

24. A method for measuring a difference in refractive index between a first sample and a second sample, said method comprising the steps of:

A) providing a transparent medium having a sample surface;

B) contacting a first area of said sample surface with said first sample and a second area of said sample surface with said second sample;

C) illuminating an interface of said transparent medium and said first sample and an interface of said transparent medium and said second sample with a beam of light having obliquely incident divergent rays to provide a first partial beam defined by the refractive index of said first sample and a second partial beam defined by the refractive index of said second sample;

D) defining first and second optical channels, said first optical channel containing optical signal information associated with said first partial beam and said second optical channel containing optical signal information associated with said second partial beam;

E) arranging a single linear scanned array of photoelectric cells to detect said optical signal information contained by said first optical channel and said optical signal information contained by said second optical channel;

F) determining a location of a first sample critical angle shadowline on said linear scanned array using said first optical channel, and a location of a second sample critical angle shadowline on said linear scanned array using said second optical channel; and

G) calculating said difference in refractive index based on a distance between said location of said first sample critical angle shadowline and said location of said second sample critical angle shadowline on said linear scanned array.

25. The method according to claim 24, wherein said step of defining first and second optical channels is performed by means of an optical multiplexor.

26. The method according to claim 25, wherein said first optical channel is defined by pulsed transmission of said first partial beam at a regular frequency, and said second optical channel is defined by pulsed transmission of said second partial beam at said regular frequency but out of timing phase with said first optical channel.

27. The method according to claim 26, wherein said optical multiplexor alternates between said first and second optical channels at a frequency that is less than the scanning frequency of said linear scanned array.

28. The method according to claim 25, wherein said first optical channel is defined by pulsed transmission of interlaced portions of said first partial beam in alternating succession, and said second optical channel is defined by pulsed transmission of interlaced portions of said second partial beam in alternating succession.

29. The method according to claim 24, wherein one of said first and second samples is a reference sample having a known index of refraction.

30. A method for measuring a difference in refractive index between a first sample and a second sample, said method comprising the steps of:

A) providing a transparent medium having a metal film adhered thereto;

B) contacting a first area of said metal film with said first sample and a second area of said metal film with said second sample;

C) illuminating an interface of said transparent medium and said metal film with a beam of light having divergent rays obliquely incident to said interface, said beam of light simultaneously irradiating said interface at a first region opposite said first area and a second region opposite said second area to provide a first partial beam defined by the refractive index of said first sample and a second partial beam defined by the refractive index of said second sample;

D) defining first and second optical channels, said first optical channel containing optical signal information associated with said first partial beam and said second optical channel containing optical signal information associated with said second partial beam;

E) arranging a single linear scanned array of photoelectric cells to detect said optical signal information contained by said first optical channel and said optical signal information contained by said second optical channel;

F) determining a location of a first resonance induced flux minimum associated with said first sample on said linear scanned array using said first optical channel, and a location of a second resonance induced flux minimum associated with said second sample on said linear scanned array using said second optical channel; and

G) calculating said difference in refractive index based on a distance between said first resonance induced flux minimum and said second resonance induced flux minimum on said linear scanned array.

31. The method according to claim 30, wherein said step of defining first and second optical channels is performed by means of an optical multiplexor.

32. The method according to claim 31, wherein said first optical channel is defined by pulsed transmission of said first partial beam at a regular frequency, and said second optical channel is defined by pulsed transmission of said second partial beam at said regular frequency but out of timing phase with said first optical channel.

33. The method according to claim 32, wherein said optical multiplexor alternates between said first and second optical channels at a frequency that is less than the scanning frequency of said linear scanned array.

34. The method according to claim 31, wherein said first optical channel is defined by pulsed transmission of interlaced portions of said first partial beam in alternating succession, and said second optical channel is defined by pulsed transmission of interlaced portions of said second partial beam in alternating succession.

35. The method according to claim 30, wherein one of said first and second samples is a reference sample having a known index of refraction.