Micromechanical apparatus for measurement of forces

• US 6,739,201 B1
• Filed: 09/20/2000
• Issued: 05/25/2004
• Est. Priority Date: 09/20/2000
• Status: Expired due to Term

• Current Assignee: National Technology & Engineering Solutions Of Sandia LLC (Honeywell International Inc.)
• Original Assignee: Sandia Corporation (Martin Marietta Corporation)
• Inventors: Tanner, Danelle Mary, Allen, James Joe
• Primary Examiner(s): Lefkowitz, Edward
• Assistant Examiner(s): DAVIS, OCTAVIA L
• Application Number:
  US09/665,978
• Time in Patent Office: 1,343 Days
• Field of Search: 337/06, 338/32, 324/662, 738/26, 735/143.2, 738/225.9, 73/540.1, 735/040.4, 735/148, 73/13.8, 310/307
• US Class Current: 73/826
• CPC Class Codes: G01N 15/1456 without spatial resolution of the texture or inner structure of the particle, e.g. processing of pulse signals
• CPC Class Codes: G01N 2203/0023 Bending
• CPC Class Codes: G01N 2203/0286 Miniature specimen; Testing on microregions of a specimen
• CPC Class Codes: G01N 3/20 by applying steady bending forces G01N3/26, G01N3/28 take precedence

Abstract

A new class of micromechanical dynamometers has been disclosed which are particularly suited to fabrication in parallel with other microelectromechanical apparatus. Forces in the microNewton regime and below can be measured with such dynamometers which are based on a high-compliance deflection element (e.g. a ring or annulus) suspended above a substrate for deflection by an applied force, and one or more distance scales for optically measuring the deflection.

Claims

1. A micromechanical dynamometer, comprising:

a) a substrate;

b) a ring-shaped high-compliance deflection element comprising at least one anchor site and at least one input site;

c) one anchor for each anchor site, extending between the substrate and said anchor site;

d) a force coupler transferring force from an external source to the at least one input site; and

,

e) at least one distance scale for optically measuring a deflection of the high-compliance deflection element in response to the force provided from the external source, with the distance scale being functionally attached to the high-compliance deflection element.

2. The dynamometer of claim 1, wherein the high-compliance deflection element comprises crystalline silicon, polycrystalline silicon, amorphous silicon, silicon oxide, silicon nitride, amorphous diamond, or a sol-gel glass.

3. The dynamometer of claim 1, wherein the high-compliance deflection element comprises an annulus of material, said annulus having the shape of a polygon, and essentially constant thickness normal to said polygon.

4. The dynamometer of claim 3, wherein said high-compliance deflection element has a line of mirror symmetry.

5. The dynamometer of claim 3, wherein said polygon is a regular polygon.

6. The dynamometer of claim 1, wherein the high-compliance deflection element comprises a circular annulus having a rectangular cross-section of essentially constant dimensions throughout.

7. The dynamometer of claim 1, wherein each distance scale operates in combination with an indicator which is mechanically coupled to a displacement of the high-compliance deflection element.

8. The dynamometer of claim 7, wherein each indicator is coupled to a different point on the deflection element.

9. The dynamometer of claim 7, wherein each distance scale is optically readable so that displacement of the indicator can thereby be quantified optically.

10. The dynamometer of claim 1, further comprising a calibration force input.

11. The dynamometer of claim 10, wherein the calibration force input is integral with the force coupler.

12. The dynamometer of claim 1, further comprising a deflection element restraint system.

13. The dynamometer of claim 12, wherein said restraint system comprises motion guides.

14. The dynamometer of claim 13, wherein said restraint system comprises ring constraints.