Method and structure for calibrating scatterometry-based metrology tool used to measure dimensions of features on a semiconductor device
First Claim
1. A method, comprising:
- measuring a critical dimension of at least one production feature formed above a wafer using a scatterometry tool;
measuring at least one of a plurality of grating structures formed above said wafer using said scatterometry tool, each of said grating structures having a different critical dimension; and
correcting said measured critical dimension of said at least one production feature based upon said measurement of said at least one of said grating structures.
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Abstract
The present invention is generally directed to a method and a structure for calibrating a scatterometry-based metrology tool used to measure dimensions of features on a semiconductor device. In one illustrative embodiment, the method comprises measuring a critical dimension of at least one production feature formed above a wafer using a scatterometry tool, measuring at least one of a plurality of grating structures formed above the wafer using the scatterometry tool, each of the grating structures having a different critical dimension, and correcting the measured critical dimension of the at least one production feature based upon the measurement of the at least one grating structure. In further embodiments, the method comprises forming a plurality of production features above a wafer, forming a plurality of grating structures above the wafer, each of the grating structures comprised of a plurality of features each having a target critical dimension that thereby defines a critical dimension of the grating structure, each of the grating structures having a different critical dimension, measuring a critical dimension of at least one of the production features using a scatterometry tool, measuring at least one of the grating structures using the scatterometry tool to determine a measured critical dimension of at least one feature of the at least one grating structure, and correcting the measured critical dimension of the at least one production feature based upon a comparison between the measured critical dimension of the at least one feature on the at least one grating structure and the target critical dimension of the feature on the at least one grating structure.
40 Citations
32 Claims
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1. A method, comprising:
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measuring a critical dimension of at least one production feature formed above a wafer using a scatterometry tool;
measuring at least one of a plurality of grating structures formed above said wafer using said scatterometry tool, each of said grating structures having a different critical dimension; and
correcting said measured critical dimension of said at least one production feature based upon said measurement of said at least one of said grating structures. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method, comprising:
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measuring a critical dimension of at least one production feature formed above a wafer using a scatterometry tool;
measuring at least one of a plurality of grating structures formed above said wafer using said scatterometry tool, each of said grating structures having a different critical dimension, said critical dimension of each of said grating structures being defined by a critical dimension of features that comprise said grating structure; and
correcting said measured critical dimension of said at least one production feature based upon said measurement of said at least one of said grating structures. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. A method, comprising:
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measuring a critical dimension of at least one production feature formed above a wafer using a scatterometry tool;
measuring at least one of a plurality of grating structures formed above said wafer using said scatterometry tool, each of said grating structures having a different critical dimension, said critical dimension of each of said grating structures being defined by a critical dimension of features that comprise said grating structure, said critical dimensions of said grating structures varying from one another by a fixed increment, a first of said plurality of grating structures having a critical dimension of a first size that is a nominal critical dimension for said at least one production feature, at least one of said plurality of grating structures having a critical dimension of a second size, said second size being greater than said first size, the remainder of said plurality of grating structures having a critical dimension that is less than said first size; and
correcting said measured critical dimension of said at least one production feature based upon said measurement of said at least one of said grating structures. - View Dependent Claims (18, 19, 20, 21, 22)
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23. A method, comprising:
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forming a plurality of production features above a wafer;
forming a plurality of grating structures above said wafer, each of said grating structures comprised of a plurality of features each having a target critical dimension that thereby defines a critical dimension of said each of said grating structures, each of said grating structures having a different critical dimension;
measuring a critical dimension of at least one of said production features using a scatterometry tool;
measuring at least one of said grating structures using said scatterometry tool to determine a measured critical dimension of at least one feature of at least one of said grating structures; and
correcting said measured critical dimension of said at least one production feature based upon a comparison between said measured critical dimension of said at least one feature on said at least one of said grating structures and said target critical dimension of said feature on said at least one grating structure. - View Dependent Claims (24, 25, 26, 27, 28, 29, 30, 31, 32)
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Specification