Automated test system and method for device having circuit and ground connections

• US 6,745,146 B1
• Filed: 10/30/1998
• Issued: 06/01/2004
• Est. Priority Date: 10/30/1998
• Status: Expired due to Fees

• Current Assignee: Avaya Incorporated
• Original Assignee: Avaya Technology Corporation Miami Lakes FLA US
• Inventors: Brandenburg, Steven Todd, Merriman, Roger Alan, Brown, Edwin Zane
• Primary Examiner(s): Hoff, Marc S.
• Assistant Examiner(s): Barbee, Manuel L
• Application Number:
  US09/183,214
• Time in Patent Office: 2,041 Days
• Field of Search: 702/57-59, 702/64, 702/65, 702/116-120, 702/122, 702/123, 324/500, 324/509-11, 324/764, 324/771, 714/25, 714/46
• US Class Current: 702/123
• CPC Class Codes: G01R 27/18 Measuring resistance to earth , i.e. line to ground
• CPC Class Codes: G01R 31/12 Testing dielectric strength or breakdown voltage ; Testing or monitoring effectiveness or level of insulation, e.g. of a cable or of an apparatus, for example using partial discharge measurements; Electrostatic testing G01R31/08, G01R31/327 and G01R31/72 take precedence; measuring in plasmas G01R19/0061; measuring dielectric constants G01R27/2617; ESD, EMC or EMP testing of circuits G01R31/002
• CPC Class Codes: G01R 31/2825 in household appliances or professional audio/video equipment testing LAN's H04L43/50; testing TV systems H04N17/00; testing loudspeakers H04R29/00
• CPC Class Codes: G01R 31/50 Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections testing of sparking plugs H01T13/58
• CPC Class Codes: G01R 31/52 Testing for short-circuits, leakage current or ground faults

Abstract

An automated test system for testing a device under test includes a storage device, an input device, a processor, and a test apparatus. The storage device is operable to store a plurality of sets of test parameters, and is further operable to store a plurality of product model identifiers, each product model identifier associated with one of the plurality of sets of test parameters. The input device is operable to obtain input from an operator defining a first product model identifier from the plurality of product model identifiers. The processor is coupled to the input device and the storage device and is operable to receive the input from the input device and retrieve the set of test parameters associated with the first product model identifier from the storage device based on the input. The processor is further operable to generate a control signal that includes the retrieved set of test parameters. The test apparatus includes a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device. The test apparatus is further operably connected to receive the control signal including the retrieved set of test parameters from the processor. The test apparatus is operable to perform a first test based on the first set of test parameters.

Claims

1. A method of testing a device using a test apparatus, the device having a circuit connection and a ground connection, the test apparatus operable to generate voltages at select levels and for select times based on test parameters, the method comprising:

a) obtaining input from an operator defining a first product model identifier from a plurality of product model identifiers;

b) retrieving from a memory one of the plurality of sets of test parameters associated with the first product model identifier;

c) causing the test apparatus to execute a first test based on the retrieved set of test parameters by providing a control signal to the test apparatus over a communication link; and

d) obtaining test results from the test apparatus.

2. The method of claim 1 wherein step a) further comprises providing in a user interface the plurality of product model identifiers for selection by the operator, each product model identifier associated with one of the plurality of sets of test parameters.

3. The method of claim 1 wherein step a) further comprises providing in the user interface the plurality of product model identifiers for selection by an operator, each product model identifier associated with one of the plurality of sets of test parameters, wherein each of the plurality of sets of test parameters comprises a set of test parameters associated with one of a plurality of international standards.

4. The method of claim 2 wherein step d) further comprises obtaining test results comprising measurement data relating to a current measurement.

5. The method of claim 1 further comprising the steps of:

obtaining an identification associated with the device; and

creating a data record comprising the identification and the test results.

6. The method of claim 1 wherein step c) further comprises causing the test apparatus to execute a first test based on the plurality of test parameters, wherein executing the first test includes applying a first voltage across the circuit connection and the ground connection and performing a current measurement thereon.

7. The method of claim 6 wherein step c) further comprises causing the test apparatus to execute a second test based on the plurality of test parameters, the second test including measuring the resistance between the ground connection and a chassis connection point on the device.

8. An automated test system for testing a device, the device having a circuit connection and a ground connection, the automated test system comprising:

a storage device operable to store a plurality of sets of test parameters, the storage device further operable to store a plurality of product model identifiers, each product model identifier associated with one of the plurality of sets of test parameters;

an input device for obtaining input from an operator defining a first product model identifier from the plurality of product model identifiers;

a processor, coupled to the input device and the storage device, operable to receive the input from the input device and retrieve the set of test parameters associated with the first product model identifier from the storage device based on the input;

the processor further operable to generate a control signal that includes the retrieved set of test parameters, the processor further operable to generate a discharge control signal upon completion of a test;

a test apparatus further comprising a first connection operable to be connected to the circuit connection of the device and a second connection operable to be connected to the ground connection of the device, the test apparatus further operably connected to receive the control signal including the retrieved set of test parameters from the processor, the test apparatus operable to perform a first test based on the first set of test parameters;

a barrier circuit operable to detect movement in the vicinity of the device, the barrier operably connected to cause the test apparatus to stop performing a first test on the device upon detection of movement in the vicinity of the device; and

a discharge circuit coupled to the processor and operable to be coupled to the ground connection and the circuit connection of the device;

the discharge circuit including a shunt resistor, the discharge circuit operable to connect the discharge circuit between the ground connection and the circuit connection upon receipt of a discharge control signal from the processor.

9. The system of claim 8 wherein the test apparatus is further operably connected to obtain test measurement data.

10. The system of claim 9 wherein the test apparatus is further operably connected to provide a test result signal including information representative of the test measurement data to the processor.

11. The system of claim 10 further comprising a display connected to the processor, the display operable to display information based on said information representative of the test measurement data.

12. The system of claim 10 wherein the input device is further operable to obtain an identification associated with the device, and wherein the processor is further operable to generate a data file based on the information representative of the test measurement data and associated with said identification.