Semiconductor run-to-run control system with state and model parameter estimation
First Claim
1. A method for controlling a manufacturing process, includes:
- processing using a process input and producing a process output;
storing the process input in a database;
storing at least one measurement of the process output in the database associated with each process input;
iterating over data from the database to estimate one or more coefficients for a model;
if one or more measurements is missing from the database during model coefficient estimation, replacing the missing measurements for the database based on a prediction from said model;
updating said model with said coefficient estimates;
iterating over data from the database to estimate a process state;
if one or more measurements is missing from the database during process state estimation, replacing the missing measurements for the database based on a prediction from said model; and
updating said model with said process state estimate.
4 Assignments
0 Petitions
Accused Products
Abstract
A method for a run-to-run (R2R) control system includes processing materials using a process input and producing a process output, storing the process input in a database, the storing including using a timestamp, and storing at least one measurement of the process output in the database aligned with each process input using the timestamp. The method further includes iterating over the data in the database to estimate one or more coefficients for a model, and, if one or more measurements is missing, replacing the missing measurements based on a prediction from said model. The model is updated with said coefficient estimates. The method additionally includes iterating over the data from the database to estimate a process state, and, if one or more of the measurements is missing from the database, replacing the missing measurements based on prediction from the model. The model is updated with said process state estimate. A controller may receive the updated model and utilize the model to produce the next process input. The updated model may also be utilized to generate an estimate for a measurable process variable, wherein the estimate can be compared to an actual measurement to determine if the estimate is within confidence limits. If the estimate is not within confidence limits, a fault is indicated.
77 Citations
37 Claims
-
1. A method for controlling a manufacturing process, includes:
-
processing using a process input and producing a process output;
storing the process input in a database;
storing at least one measurement of the process output in the database associated with each process input;
iterating over data from the database to estimate one or more coefficients for a model;
if one or more measurements is missing from the database during model coefficient estimation, replacing the missing measurements for the database based on a prediction from said model;
updating said model with said coefficient estimates;
iterating over data from the database to estimate a process state;
if one or more measurements is missing from the database during process state estimation, replacing the missing measurements for the database based on a prediction from said model; and
updating said model with said process state estimate. - View Dependent Claims (3, 4, 5, 6, 7, 8, 9, 10, 12, 13, 14, 35)
-
-
2. A method for controlling a manufacturing process, includes:
-
processing using a process input and producing a process output;
storing the process input in a database;
storing at least one measurement of the process output in the database associated with each process input;
iterating over data from the database to estimate one or more coefficients for a model;
if one or more measurements is missing from the database during model coefficient estimation, replacing the missing measurements for the database based on a prediction from said model;
updating said model with said coefficient estimates;
iterating over data from the database to estimate a process state;
if one or more measurements is missing from the database during process state estimation, replacing the missing measurements for the database based on a prediction from said model; and
updating said model with said process state estimate; and
wherein if actual measurements become available a time period after model coefficient estimation or process state estimation, for said one or more measurements which was missing, replacing the predicted measurements for the previously missing measurements with said actual measurements, storing said actual measurements in said database, and utilizing said actual measurements in subsequent model coefficient estimation and process state estimation. - View Dependent Claims (11)
-
-
15. A method for controlling a manufacturing process, includes:
-
processing using a process input and producing a process output;
storing the process input in a database;
storing at least one measurement of the process output in the database associated with each process input;
iterating over data from the database to estimate one or more coefficients for a model, wherein a constrained quadratic optimization is solved at each iteration of said data;
if one or more measurements is missing from the database during model coefficient estimation, replacing the missing measurements for the database based on a prediction from said model;
updating said model with said coefficient estimates;
iterating over data from the database to estimate a process state, wherein a constrained quadratic optimization is solved at each iteration of said data;
if one or more measurements is missing from the database during process state estimation, replacing the missing measurements for the database based on a prediction from said model; and
updating said model with said process state estimate. - View Dependent Claims (17, 18, 19, 20, 21, 22, 23, 24, 26, 27, 36)
-
-
16. A method for controlling a manufacturing process, includes:
-
processing using a process input and producing a process output;
storing the process input in a database;
storing at least one measurement of the process output in the database associated with each process input;
iterating over data from the database to estimate one or more coefficients for a model, wherein a constrained quadratic optimization is solved at each iteration of said data;
if one or more measurements is missing from the database during model coefficient estimation, replacing the missing measurements for the database based on a prediction from said model;
updating said model with said coefficient estimates;
iterating over data from the database to estimate a process state, wherein a constrained quadratic optimization is solved at each iteration of said data;
if one or more measurements is missing from the database during process state estimation, replacing the missing measurements for the database based on a prediction from said model; and
updating said model with said process state estimate; and
wherein if actual measurements become available a time period after model coefficient estimation or process state estimation, for said one or more measurements which was missing, replacing the predicted measurements for the previously missing measurements with said actual measurements, storing said actual measurements in said database, and utilizing said actual measurements in subsequent model coefficient estimation and process state estimation. - View Dependent Claims (25)
-
-
28. A method for controlling a manufacturing process, includes:
-
providing a database with process input data and associated process output data;
iterating over data from the database to estimate one or more coefficients for a model;
if one or more measurements is missing from the database during model coefficient estimation, replacing the missing measurements for the database based on a prediction from said model;
updating said model with said coefficient estimates;
iterating over data from the database to estimate a process state;
if one or more measurements is missing from the database during process state estimation, replacing the missing measurements for the database based on a prediction from said model; and
updating said model with said process state estimate. - View Dependent Claims (30, 31, 33, 34, 37)
-
-
29. A method for controlling a manufacturing process, includes:
-
providing a database with process input data and associated process output data;
iterating over data from the database to estimate one or more coefficients for a model;
if one or more measurements is missing from the database during model coefficient estimation, replacing the missing measurements for the database based on a prediction from said model;
updating said model with said coefficient estimates;
iterating over data from the database to estimate a process state;
if one or more measurements is missing from the database during process state estimation, replacing the missing measurements for the database based on a prediction from said model; and
updating said model with said process state estimate; and
wherein if actual measurements become available a time period after model coefficient estimation or process state estimation, for said one or more measurements which was missing, replacing the predicted measurements for the previously missing measurements with said actual measurements, storing said actual measurements in said database, and utilizing said actual measurements in subsequent model coefficient estimation and process state estimation. - View Dependent Claims (32)
-
Specification