Optical probes and methods for spectral analysis

• US 6,753,966 B2
• Filed: 03/09/2001
• Issued: 06/22/2004
• Est. Priority Date: 03/10/2000
• Status: Active Grant

• Current Assignee: Textron Systems Corporation (Textron Inc)
• Original Assignee: Textron Systems Corporation (Textron Inc)
• Inventors: Von Rosenberg, Charles W.
• Primary Examiner(s): Lee, Michael G.
• Assistant Examiner(s): FRANKLIN, JAMARA ALZAIDA
• Application Number:
  US09/803,131
• Publication Number:
  US 20020039186A1
• Time in Patent Office: 1,201 Days
• Field of Search: 235/435, 356/402, 356/417, 356/73, 356/336, 356/338, 356/432, 356/433, 356/436, 385/12
• US Class Current: 356/432
• CPC Class Codes: G01J 2003/2866 Markers; Calibrating of scan
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0213 using attenuators
• CPC Class Codes: G01J 3/0218 using optical fibers
• CPC Class Codes: G01J 3/0227 using notch filters
• CPC Class Codes: G01J 3/0232 using shutters
• CPC Class Codes: G01J 3/0256 Compact construction
• CPC Class Codes: G01J 3/0262 Constructional arrangements for removing stray light
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51
• CPC Class Codes: G01J 3/502 using a dispersive element, e.g. grating, prism
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/3577 for analysing liquids, e.g. polluted water
• CPC Class Codes: G01N 21/359 using near infrared light
• CPC Class Codes: G01N 21/8507 Probe photometers, i.e. with optical measuring part dipped into fluid sample
• CPC Class Codes: G01N 33/10 Starch-containing substances, e.g. dough

Abstract

The present invention relates to spectral analysis systems and methods for determining physical and chemical properties of a sample by measuring the optical characteristics of light emitted from the sample. In one embodiment, a probe head for use with a spectrometer includes a reflector for illuminating a sample volume disposed circumferentially about the light source of the probe head. In another embodiment, a probe head includes an optical blocking element for forcing the optical path between the light source and an optical pick-up optically connected to the spectrometer into the sample. The probe head also includes a reference shutter for selectively blocking light emitted from the sample from reaching the optical pick-up to facilitate calibration of the spectrometer.

Claims

1. A probe head for use with a spectrometer to analyze a material, the probe head comprising:

a light source arranged to irradiate a sample volume of the material proximate the probe head;

an optical pick-up arranged to receive light emitted from the irradiated sample volume and transmit the emitted light to the spectrometer,

a shaft having a longitudinal axis and housing the light source and the optical pick-up, and

a reflector positioned within the shaft and having a first reflective surface for reflecting light from the light source through a wall of the shaft and into the sample volume to irradiate the sample volume, and having a second reflective surface for reflecting light emitted from the sample to the optical pick-up.

2. The probe head of claim 1, wherein the first reflective surface and the second reflective surface are each generally linear in shape.

3. The probe head of claim 1, wherein the first reflective surface and the second reflective surface are each generally elliptical in shape.

4. The probe head of claim 1, wherein the shaft includes:

a first window formed in the walls of the shaft for transmitting light reflected from the first reflective surface into the sample volume, and

a second window formed in the walls of the shaft for transmitting light emitted from the sample volume to the second reflective surface.

5. The probe head of claim 4, wherein the first window and the second window are generally annular in shape.

6. The probe head of claim 5, wherein the first window and the second window are each selectively transmissive about their circumferences.

7. The probe head of claim 1, wherein the first reflective surface is oriented to reflect at least a portion of the light from the light source in a direction generally perpendicular to the longitudinal axis of the shaft.

8. A probe head for use with a spectrometer to analyze a material, the probe head comprising:

a shaft extending along a longitudinal axis;

a light source arranged within the shaft;

a reflector arranged within the shaft a longitudinal distance from the light source to reflect at least a portion of the light from the light source in a direction generally perpendicular to the longitudinal axis of the shaft to irradiate a sample volume of the material proximate the probe head; and

an optical pick-up arranged within the shaft to receive light emitted from the irradiated sample volume and transmit the received light to the spectrometer.

9. The probe head of claim 8, wherein the reflector includes a passage for permitting light from the light source to be directly received by the optical pick-up.

10. The probe head of claim 9, wherein the passage is an optical fiber.

11. The probe head of claim 10, wherein the passage is an open tube formed in the reflector.

12. The probe head of claim 11, further comprising a first shutter for selectively blocking the passage.

13. The probe head of claim 8, further comprising an optical blocking element positioned in the optical path between the light source and the optical pick-up to force the optical path into the sample material.

14. The probe head of claim 8, further comprising a shutter for selectively blocking light emitted from the sample volume from reaching the optical pick-up to facilitate calibration of the spectrometer.

15. A method of spectroscopically analyzing a material comprising:

inserting a probe head of a spectrometer into the material along an insertion axis, the probe head emitting light at least generally perpendicular to the insertion axis,

moving the probe head along the insertion axis within the material to irradiate, with the probe head, a sample volume of the material, the sample volume extending at least partially about the circumference of the probe head, and

analyzing light reflected from the sample volume of material.

16. A probe head for use with a spectrometer to analyze a flowing material, the probe head comprising:

a light source arranged to irradiate a sample volume of the flowing material proximate the probe head;

an optical pick-up arranged to receive light emitted from the irradiated sample volume; and

a planing element shaped to cause the probe head to skim the surface of the flowing material when in contact with the flowing material.

17. The probe head of claim 16, wherein the planing element has a convex surface for contacting the flowing material.

18. The probe head of claim 17, further comprising a constant force generator for applying a constant force to the probe head to maintain the planing element in contact with the surface of the flowing material.

19. The probe head of claim 18, wherein the constant force generator is a spring, or a pneumatic element.

20. A probe assembly for use with a spectrometer to analyze a flowing material, the probe head comprising:

a housing, having arranged therein, two or more probe heads for use with a spectrometer, wherein each of the probe heads are simultaneously able to irradiate and collect spectral information on the flowing material, and include

(a) a light source arranged to irradiate a sample volume of the flowing material proximate the probe head, and

(b) an optical pick-up arranged to receive light emitted from the irradiated sample volume;

wherein the housing is shaped for disposal of the probe assembly in the path of the flowing material.

21. The probe assembly of claim 20, wherein the housing is aerodynamically shaped to minimize turbulence of the flowing material within the sample volume.

22. The probe assembly of claim 21, wherein the housing is shaped like an air foil having a leading edge, the leading edge being oriented to face the flowing material.

23. The probe assembly of claim 20, wherein the probe heads are arranged along a common axis within the housing.

24. The probe assembly of claim 20, wherein the probe heads are arranged along two or more common axes to create a two-dimensional array of probe heads.

25. The probe assembly of claim 20, wherein each optical pick-up is connected by way of a common optical fiber element to the spectrometer.