Method and system for automating data storage array components testing with integrated work order dispatching

• US 6,754,605 B1
• Filed: 04/15/2003
• Issued: 06/22/2004
• Est. Priority Date: 04/15/2003
• Status: Active Grant

• Current Assignee: NetApp, Inc.
• Original Assignee: LSI Logic Corporation (Broadcom, Inc.)
• Inventors: Mortensen, Justin B., Hagerott, Steven G., Pate, James D.
• Primary Examiner(s): Bui, Bryan
• Application Number:
  US10/414,126
• Time in Patent Office: 434 Days
• Field of Search: 702/117, 702/118, 702/119, 702/108, 702/113, 702/115, 702/182, 702/183, 714/10, 714/20, 714/25, 714/30, 714/42, 711/111-113, 709/201, 709/203, 709/220, 709/240
• US Class Current: 702/115
• CPC Class Codes: G01R 31/2893 Handling, conveying or loading, e.g. belts, boats, vacuum fingers G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H01L21/67
• CPC Class Codes: G11C 29/56 External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
• CPC Class Codes: G11C 29/56016 Apparatus features

Abstract

The present invention is directed to a method and system for automating data storage array components testing. A serial number of a data storage array component (i.e., product) is used to determine if the product is of high priority (rank) in comparison with other products in a queue and there is any test cell available for testing the product. Next, if a test is required, the product type and test requirements of the product are retrieved from a database based on the serial number, and the product is routed to the test cell from an assembly line. Then the product and a storage component interface module of the test cell are positioned so that the product and the storage component interface module face each other. The storage component interface module is chosen based on the test requirements retrieved from the database. Next the product is docked into the storage component interface so that the product is connected to the storage component interface module. Then the test is run to completion. The product is then routed down the assembly line to packaging and the customer.

Claims

1. A method for automating data storage array components testing, comprising:

obtaining a serial number of a data storage array component;

processing said serial number through a shop order dispatch system to determine if said serial number is of high priority in comparison with other data storage array components in a queue and if there is any test cell available for testing said data storage array component;

retrieving a product type and test requirements from a database based on said serial number when said serial number is of high priority and when there is a test cell available for testing said data storage array component;

routing said data storage array component to said test cell from an assembly line when a test is required for said data storage array component;

positioning said data storage array component and a storage component interface module of a storage component interface of said test cell so that said data storage array component and said storage component interface module face each other, wherein said storage component interface module is chosen based on said test requirements;

docking said data storage array component into said storage component interface so that said data storage array component is connected to said storage component interface module; and

running said test.

2. The method of claim 1, wherein said obtaining step further comprising reading a RFID tag on said data storage array component by a RFID scanner to obtain said serial number.

3. The method of claim 1, wherein said obtaining step further comprising reading a bar code on said data storage array component by a bar code scanner to obtain said serial number.

4. The method of claim 1, further comprising routing said data storage array component to a buffer area when said serial number is of low priority.

5. The method of claim 4, further comprising keeping said data storage array component in said buffer area when there is no test cell available for testing said data storage array component.

6. The method of claim 4, further comprising releasing said data storage array component into work flow when there is a test cell available for testing said data storage array component.

7. The method of claim 1, further comprising routing said data storage array component to a buffer area when there is no test cell available.

8. The method of claim 1, further comprising sending results of said test to said database after said test is finished.

9. The method of claim 1, further comprising notifying said shop order dispatch system of a status of said test cell after said test is finished.

10. The method of claim 1, further comprising undocking and routing said data storage array component back to said assembly line after said test is finished.

11. The method of claim 10, further comprising placing said data storage array component into work flow when said data storage array component passes said test.

12. The method of claim 10, further comprising placing said data storage array component into a re-work station when said data storage array component does not pass said test.

13. A system for automating data storage array components testing, comprising:

means for obtaining a serial number of a data storage array component;

means for processing said serial number through a shop order dispatch system to determine if said serial number is of high priority in comparison with other data storage array components in a queue and if there is any test cell available for testing said data storage array component;

means for retrieving a product type and test requirements from a database based on said serial number when said serial number is of high priority and when there is a test cell available for testing said data storage array component;

means for routing said data storage array component to said test cell from an assembly line when a test is required for said data storage array component;

means for positioning said data storage array component and a storage component interface module of a storage component interface of said test cell so that said data storage array component and said storage component interface module face each other, wherein said storage component interface module is chosen based on said test requirements;

means for docking said data storage array component into said storage component interface so that said data storage array component is connected to said storage component interface module; and

means for running said test.

14. The system of claim 13, wherein said means for obtaining further comprising means for reading a RFID tag on said data storage array component by a RFID scanner to obtain said serial number.

15. The system of claim 13, wherein said means for obtaining further comprising means for reading a bar code on said data storage array component by a bar code scanner to obtain said serial number.

16. The system of claim 13, further comprising means for routing said data storage array component to a buffer area when said serial number is of low priority.

17. The system of claim 16, further comprising means for keeping said data storage array component in said buffer area when there is no test cell available for testing said data storage array component.

18. The system of claim 16, further comprising means for releasing said data storage array component into work flow when there is a test cell available for testing said data storage array component.

19. The system of claim 13, further comprising means for routing said data storage array component to a buffer area when there is no test cell available.

20. The system of claim 13, further comprising means for sending results of said test to said database after said test is finished.

21. The system of claim 13, further comprising means for notifying said shop order dispatch system of a status of said test cell after said test is finished.

22. The system of claim 13, further comprising means for undocking and routing said data storage array component back to said assembly line after said test is finished.

23. The system of claim 22, further comprising means for placing said data storage array component into work flow when said data storage array component passes said test.

24. The system of claim 22, further comprising means for placing said data storage array component into a re-work station when said data storage array component does not pass said test.

25. A computer-readable medium having computer-executable instructions for performing a method comprising:

obtaining a serial number of a data storage array component;

processing said serial number through a shop order dispatch system to determine if said serial number is of high priority in comparison with other data storage array components in a queue and if there is any test cell available for testing said data storage array component;

retrieving a product type and test requirements from a database based on said serial number when said serial number is of high priority and when there is a test cell available for testing said data storage array component;

routing said data storage array component to said test cell from an assembly line when a test is required for said data storage array component;

positioning said data storage array component and a storage component interface module of a storage component interface of said test cell so that said data storage array component and said storage component interface module face each other, wherein said storage component interface module is chosen based on said test requirements;

docking said data storage array component into said storage component interface so that said data storage array component is connected to said storage component interface module; and

running said test.

26. The computer-readable medium of claim 25, wherein said obtaining step of said method further comprising reading a RFID tag on said data storage array component by a RFID scanner to obtain said serial number.

27. The computer-readable medium of claim 25, wherein said obtaining step of said method further comprising reading a bar code on said data storage array component by a bar code scanner to obtain said serial number.

28. The computer-readable medium of claim 25, wherein said method further comprising routing said data storage array component to a buffer area when said serial number is not of high priority.

29. The computer-readable medium of claim 28, wherein said method further comprising keeping said data storage array component in said buffer area when there is no test cell available for testing said data storage array component.

30. The computer-readable medium of claim 28, wherein said method further comprising releasing said data storage array component into work flow when there is a test cell available for testing said data storage array component.

31. The computer-readable medium of claim 25, wherein said method further comprising routing said data storage array component to a buffer area when there is no test cell available.

32. The computer-readable medium of claim 25, wherein said method further comprising sending results of said test to said database after said test is finished.

33. The computer-readable medium of claim 25, wherein said method further comprising notifying said shop order dispatch system of a status of said test cell after said test is finished.

34. The computer-readable medium of claim 25, wherein said method further comprising undocking and routing said data storage array component back to said assembly line after said test is finished.

35. The computer-readable medium of claim 34, wherein said method further comprising placing said data storage array component into work flow when said data storage array component passes s aid test.

36. The computer-readable medium of claim 34, wherein said method further comprising placing said data storage array component into a re-work station when said data storage array component does not pass said test.

37. A system for automating data storage array components testing, comprising:

an assembly line;

means for obtaining a serial number of a data storage array component on said assembly line; and

a test cell for testing said data storage array component based on said serial number, said test cell connected to said assembly line.

38. The system of claim 37, wherein said means for obtaining comprising a RFID scanner for reading a RFID tag on said data storage array component to obtain said serial number.

39. The system of claim 37, wherein said means for obtaining comprising a bar code scanner for reading a bar code on said data storage array component to obtain said serial number.

40. The system of claim 37, further comprising a re-work area to which said storage array component is routed from said assembly line after said storage array component fails said test.

41. The system of claim 37, further comprising a database for storing said serial number, a product type and test requirements of said storage array component.

42. A system for automating data storage array components testing, comprising:

an assembly line;

means for obtaining a serial number of a data storage array component on said assembly line;

a test cell for testing said data storage array component based on said serial number, said test cell connected to said assembly line; and

a shop order dispatch system for determining whether said serial number is of high priority in comparison with other data storage array components in a queue and whether there is any test cells available for testing said data storage array component.

43. The system of claim 42, further comprising a buffer zone to which said data storage array component is routed from said assembly line when said serial number is of low priority.

44. The system of claim 42, further comprising a buffer zone to which said data storage array component is routed from said assembly line when there is no test cells available for testing said data storage array component.

45. A system for automating data storage array components testing, comprising:

an assembly line;

means for obtaining a serial number of a data storage array component on said assembly line; and

a test cell for testing said data storage array component based on said serial number, said test cell connected to said assembly line, said test cell comprising;

a storage component interface comprising a plurality of storage component interface modules;

a plurality of storage array network targets communicatively coupled to said storage component interface; and

a rotating carousel for positioning said storage array component into said storage component interface so that said storage array component is connected to one of said a plurality of storage component interface modules for testing.

46. The system of claim 45, wherein said storage component interface is in a circular shape.

47. The system of claim 45, wherein said one of said a plurality of storage component interface modules comprising:

a first surface including at least one of power source on/off switches, serial ports, Ethernet connectors, power source connectors, and Fibre Channel ports; and

a second surface through which wiring harness for said at least one of power source on/off switches, serial ports, Ethernet connectors, power source connectors, and Fibre Channel ports is connected to one of said a plurality of storage array network targets.

48. A system for automating data storage array components testing, comprising:

an assembly line;

means for obtaining a serial number of a data storage array component on said assembly line; and

a test cell for testing said data storage array component based on said serial number, said test cell connected to said assembly line, said test cell comprising;

a storage component interface comprising a plurality of storage component interface modules;

a plurality of storage array network targets communicatively coupled to said storage component interface; and

a sliding means for placing one of said a plurality of storage component interface modules said storage into a position so that said storage array component is connected to said one of said a plurality of storage component interface modules for testing.

49. The system of claim 48, wherein said storage component interface is movable vertically.

50. The system of claim 48, wherein said storage component interface module comprising:

a first surface including at least one of power source on/off switches, serial ports, Ethernet connectors, power source connectors, and Fibre Channel ports; and

a second surface through which wiring harness for said at least one of power source on/off switches, serial ports, Ethernet connectors, power source connectors, and Fibre Channel ports is connected to one of said a plurality of storage array network targets.

51. A storage component interface module, comprising:

a first surface including a plurality of ports for connecting to a data storage array component for testing said data storage array component;

wherein wiring for testing said data storage array component is provided via said first surface.

52. The storage component interface module of claim 51, wherein said a plurality of ports are male connectors.

53. The storage component interface module of claim 51, wherein said a plurality of ports are female connectors.

54. The storage component interface module of claim 51, wherein said a plurality of ports include at least one of power source on/off switches, serial ports, Ethernet connectors, power source connectors, and Fibre Channel ports.

55. The storage component interface module of claim 51, further comprising:

a second surface through which wiring harness for said a plurality of ports is connected to a storage array network target.

56. The storage component interface module of claim 55, wherein said a plurality of ports include at least one of power source on/off switches, serial ports, Ethernet connectors, power source connectors, and Fibre Channel ports.

57. The storage component interface module of claim 55, wherein said second surface is opposite said first surface.