Apparatus for determining a gap between a proximity probe component and a conductive target material
First Claim
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1. An apparatus for determining a gap between a proximity probe component and a conductive target material, said apparatus comprising in combination:
- a network including a first electrical component and said proximity probe component serially connected;
a signal generating means operatively coupled to said network for driving a current through said serially connected components;
means for sampling a first voltage impressed across said network and a second voltage impressed across said proximity probe component into digitized voltages;
means for convolving each said digitized voltage with a digital waveform for forming a first complex number and a second complex number correlative to said first voltage impressed across said network and said second voltage impressed across said proximity probe component respectively;
means for determining a ratio of said second complex number to a difference between said first and said second complex numbers, and means for calculating an electrical impedance of said proximity probe component as a function of said ratio wherein said electrical impedance of said proximity probe component is digitally measured, and means for correlating said digitally measured electrical impedance of said proximity probe component to a value defining a gap between said proximity probe component and the conductive target material.
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Abstract
A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.
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10 Claims
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1. An apparatus for determining a gap between a proximity probe component and a conductive target material, said apparatus comprising in combination:
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a network including a first electrical component and said proximity probe component serially connected;
a signal generating means operatively coupled to said network for driving a current through said serially connected components;
means for sampling a first voltage impressed across said network and a second voltage impressed across said proximity probe component into digitized voltages;
means for convolving each said digitized voltage with a digital waveform for forming a first complex number and a second complex number correlative to said first voltage impressed across said network and said second voltage impressed across said proximity probe component respectively;
means for determining a ratio of said second complex number to a difference between said first and said second complex numbers, and means for calculating an electrical impedance of said proximity probe component as a function of said ratio wherein said electrical impedance of said proximity probe component is digitally measured, and means for correlating said digitally measured electrical impedance of said proximity probe component to a value defining a gap between said proximity probe component and the conductive target material. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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Specification