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System and method for non-contact electrical testing employing a CAM derived reference

  • US 6,759,850 B2
  • Filed: 03/27/2002
  • Issued: 07/06/2004
  • Est. Priority Date: 03/28/2001
  • Status: Expired due to Fees
First Claim
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1. A tester for electrically testing a board under test (BUT) for defects, comprising:

  • a sensor operative to provide detection outputs corresponding to a sensed electrical characteristic for selected locations on a BUT; and

    a defect processor configured to receive;

    said detection outputs, and a reference representing anticipated values corresponding to the detection outputs for the selected BUT locations, said reference including anticipated values that are calculated from information representing said BUT and that take into account an electric effect of said sensor; and

    said defect processor being operative to output an indication of a possible electrical defect in said BUT by comparing said detection outputs to said reference anticipated values.

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