System and method for non-contact electrical testing employing a CAM derived reference
First Claim
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1. A tester for electrically testing a board under test (BUT) for defects, comprising:
- a sensor operative to provide detection outputs corresponding to a sensed electrical characteristic for selected locations on a BUT; and
a defect processor configured to receive;
said detection outputs, and a reference representing anticipated values corresponding to the detection outputs for the selected BUT locations, said reference including anticipated values that are calculated from information representing said BUT and that take into account an electric effect of said sensor; and
said defect processor being operative to output an indication of a possible electrical defect in said BUT by comparing said detection outputs to said reference anticipated values.
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Abstract
A system and method for electrically testing electrical circuits in which electromagnetic values that are to be sensed by an array of sensors are forecast or simulated, for use as a reference, by calculation using computer files corresponding to a board under test and to an array of sensors.
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Citations
38 Claims
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1. A tester for electrically testing a board under test (BUT) for defects, comprising:
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a sensor operative to provide detection outputs corresponding to a sensed electrical characteristic for selected locations on a BUT; and
a defect processor configured to receive;
said detection outputs, and a reference representing anticipated values corresponding to the detection outputs for the selected BUT locations, said reference including anticipated values that are calculated from information representing said BUT and that take into account an electric effect of said sensor; and
said defect processor being operative to output an indication of a possible electrical defect in said BUT by comparing said detection outputs to said reference anticipated values. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A tester for electrically testing a board under test (BUT) for defects, comprising:
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a sensor operative to provide a detection output, said detection output including a sensed electrical characteristic for selected locations on a BUT; and
a defect processor configured to receive;
said detection output, and a reference representing anticipated values corresponding to an electrical characteristic to be sensed by said sensor at selected locations on the BUT, said reference including anticipated values calculated from at least one computerized CAM file representing a three dimensional model of said BUT and said sensor, and said defect processor being operative to output an indication of a possible electrical defect in said BUT in response to comparing said detection output to said reference. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A method for electrically testing a board under test (BUT) for defects, comprising:
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sensing a BUT with a sensor at a multiplicity of selected locations;
outputting sensed values indicating an electrical characteristic sensed at the selected locations;
comparing said sensed values to corresponding anticipated values, said anticipated values being calculated from a CAM file representing said BUT and information representing said sensor, said calculated values being calculated to take into account an electric effect of said sensor; and
determining a defect in said BUT in response to said comparing. - View Dependent Claims (23, 24, 25, 26, 27)
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28. A method for electrically testing a board under test (BUT) for defects, comprising:
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sensing a BUT with a sensor at a multiplicity of locations;
outputting sensed values indicating an electrical characteristic sensed by said sensor at selected locations;
comparing said sensed values to corresponding anticipated values, said anticipated values including values that are calculated from at least one computer file representing a three dimensional model of said BUT and said sensor; and
determining a defect in said BUT in accordance with said comparison. - View Dependent Claims (29, 30, 31, 32, 33)
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34. A method for calculating a reference map representing a BUT for use in an electrical tester having a plurality of sensors, comprising:
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calculating an electrical charge for selected conductive portions of a BUT using at least one computer file representing said BUT;
calculating an electrical charge for selected sensors using a computer file representing said sensors;
calculating electromagnetic values affected by selected conductive portions using the calculated electrical charge for said conductive portions of said BUT and the calculated electrical charge for said selected sensors, said electromagnetic values taking into account an electric effect of said selected sensors; and
collecting the calculated electromagnetic values into a reference map.
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35. A method for-calculating a reference map representing a BUT for use in an electrical tester having at least one sensor, comprising:
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(a) identifying various conductive portions on a BUT;
(b) calculating a capacitance between a selected sensor and a selected conductive portion on the BUT;
(c) multiplying said capacitance by a voltage;
(d) summing the result of the multiplication in (c) with respect to a selected sensor for each of a plurality of selected conductive portions on the BUT, and multiplying said sum with a current phase to determine a value for current; and
(e) collecting a plurality of current values calculated in (d) to form a reference map representing a BUT. - View Dependent Claims (36, 37, 38)
calculating a capacitance between a selected sensor and another sensor.
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37. The method claimed in claim 36 and further comprising changing a spatial orientation between a computer file representing said BUT and a computer file representing said sensor.
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38. The method claimed in claim 35 and further comprising changing a spatial orientation between a computer file representing said BUT and a computer file representing said sensor.
Specification