Reforming wet-tantalum capacitors in implantable defibrillators and other medical devices

• US 6,761,728 B2
• Filed: 07/06/2001
• Issued: 07/13/2004
• Est. Priority Date: 12/01/1999
• Status: Expired due to Term

• Current Assignee: Greatbatch Limited (Greatbatch Incorporated)
• Original Assignee: Wilson Greatbatch Technologies, Inc.
• Inventors: Balczewski, Ron, Munson, Gregory Scott, Paris, Michael Wesley, Linder, William J., Harguth, Robert S.
• Primary Examiner(s): Getzow, Scott M.
• Application Number:
  US09/900,595
• Publication Number:
  US 20010047190A1
• Time in Patent Office: 1,103 Days
• Field of Search: 607/1, 607/2, 607/3, 607/4, 607/5, 607/6, 607/7, 607/8, 607/9
• US Class Current: 607/1
• CPC Class Codes: A61N 1/3956 Implantable devices for applying electric shocks to the heart, e.g. for cardioversion

Abstract

Miniature defibrillators and cardioverters detect abnormal heart rhythms and automatically apply electrical therapy to restore normal heart function. Critical components in these devices are aluminum electrolytic capacitors, which store and deliver one or more life-saving bursts of electric charge to a heart of a patient. This type of capacitor requires regular “reform” to preserve its charging efficiency over time. Because reform expends valuable battery life, manufacturers developed wet-tantalum capacitors, which are generally understood not to require reform. Yet, the present inventors discovered through extensive study that wet-tantalum capacitors exhibit progressively worse charging efficiency over time. Accordingly, to address this problem, the inventors devised unique reform techniques for wet-tantalum capacitors. One exemplary technique entails charging wet-tantalum capacitors to a voltage equal to about 90% of their rated voltage and maintaining this voltage for about five minutes before discharging them.

Claims

1. A method of maintaining one or more wet-tantalum capacitors in an implantable medical device, with each capacitor having a rated voltage or a maximum-energy voltage, the method comprising:

maintaining at least one of the wet-tantalum capacitors at a high voltage relative its rated voltage or maximum-energy voltage for a time; and

discharging, after the time, the one of the wet-tantalum capacitors through a non-therapeutic load, wherein discharging includes;

allowing the one of the wet-tantalum capacitors to float for a first time period; and

discharging the one or more of the wet-tantalum capacitors through a non-therapeuitic load after expiration of the first time period.

2. The method of claim 1, wherein the high voltage is about 90 percent of the rated voltage or a maximum-energy voltage for the capacitors.

3. The method of claim 1, wherein the implantable medical device has a housing and the non-therapeutic load is a resistor within the housing.

4. The method of claim 1, wherein the one wet-tantalum capacitor comprises a tantalum anode and a non-tantalum cathode.

5. The method of claim 1 further including determining a value related to a capacitor leakage current, wherein the time is based on the value related to the capacitor leakage current.

6. The method of claim 1, wherein the time is greater than or equal to 15 seconds.

7. The method of claim 1, wherein the implantable device functions as a defibrillator, a cardioverter, or a pacemaker.

8. The method of claim 1, wherein each of the one or more capacitors has a 185-volts surge rating, a first nominal leakage-current rating of about 60 microamps at about 175 volts, a second nominal leakage-current rating of about 90 microamps at about 185 volts, an AC capacitance of about 490 microfarads, and an equivalent-series resistance of about 1.2 ohms.

9. The method of claim 1, wherein the first time period is about 60 seconds.

10. The method of claim 1:

wherein the implantable device includes a lead system for coupling to living tissue; and

wherein discharging the one wet-tantalum capacitor through the non-therapeutic load comprises discharging the one wet-tantalum capacitor through the lead system at a non-therapeutic level.

11. A method of maintaining one or more wet-tantalum capacitors in an implantable medical device, with each capacitor having a rated voltage, the method comprising:

maintaining at least one of the wet-tantalum capacitors at a high voltage relative its rated voltage for a time greater than or equal to 15 seconds;

discharging, after the time, the one or more of the wet-tantalum capacitors, wherein discharging includes;

allowing the one of the wet-tantalum capacitors to float for a first time period; and

discharging the one or more of the wet-tantalum capacitors through a non-therapeuitic load after expiration of the first time period.

12. The method of claim 11, wherein the high voltage is about 90 percent of the rated voltage.

13. The method of claim 11, wherein the one wet-tantalum capacitor comprises a tantalum anode and a non-tantalum cathode.

14. The method of claim 11, wherein the first time period is about 60 seconds.

15. The method of claim 11, wherein the implantable device includes a lead system for coupling to living tissue;

and

wherein discharging the one wet-tantalum capacitor through the non-therapeutic load comprises discharging the one wet-tantalum capacitor through the lead system at a non-therapeutic level.

16. A method of maintaining one or more wet-tantalum capacitors in an implantable medical device, with each capacitor having a rated voltage, a tantalum anode, and a non-tantalum cathode, the method comprising:

maintaining at least one of the wet-tantalum capacitors at a voltage equal to about 90% of its rated voltage for a time of about five minutes;

discharging, after the time, the one or more of the wet-tantalum capacitors, wherein discharging includes;

allowing the one of the wet-tantalum capacitors to float for a first time period; and

discharging the one or more of the wet-tantalum capacitors through a non-therapeuitic load after expiration of the first time period.

17. The method of claim 16, wherein the implantable device includes a lead system for coupling to living tissue;

and

wherein discharging the one wet-tantalum capacitor through the non-therapeutic load comprises discharging the one wet-tantalum capacitor through the lead system at a non-therapeutic level.

18. An implantable heart rhythm management device comprising:

one or more leads for sensing electrical signals of a patient or for applying electrical energy to the patient;

a monitoring circuit for monitoring heart activity of the patient through one or more of the leads; and

a therapy circuit for delivering electrical energy through one or more of the leads to a heart of the patient, wherein the therapy circuit includes a capacitor system having one or more wet-tantalum capacitors, each having a rated voltage;

means for maintaining at least one of the wet-tantalum capacitors at a high voltage relative its rated voltage for a time greater than or equal to about 5 minutes; and

means for discharging, after the time, the one or more of the wet-tantalum capacitors through a non-therapeutic load.

19. The implantable heart rhythm management device of claim 18 wherein the means for maintaining at least one of the wet-tantalum capacitors at a high voltage includes:

means for determining a charge time or leakage current of the one wet-tantalum capacitor;

means, responsive to the means for measuring, for charging the one capacitor to the high voltage when the determined charge time or leakage current exceeds a threshold; and

means for topping off the one capacitor.

20. The device of claim 19, wherein the charge time corresponds to a time for charging the one capacitor to a maximum-energy state.

21. The device of claim 19, wherein the means for discharging the one or more wet-tantalum capacitors initiates discharge in response to the determined charge time or leakage current falling within a specific range.

22. The device of claim 18, wherein discharging the one wet-tantalum capacitor through the non-therapeutic load comprises discharging the one wet-tantalum capacitor through one or more of the leads at a non-therapeutic level.

23. A method of maintaining one or more capacitors in an implantable medical device, with each capacitor having a rated voltage or a maximum-energy voltage, the method comprising:

maintaining at least one of the capacitors at a high voltage relative its rated voltage or maximum-energy voltage for a time greater than one minute; and

discharging, after the time, the one or more of the capacitors through a non-therapeutic load, wherein discharging includes;

allowing the one of the wet-tantalum capacitors to float for a first time period; and

discharging the one or more of the wet-tantalum capacitors through a non-therapeutic load after expiration of the first time period.

24. The method of claim 23, wherein the the one of the capacitors is a hybrid capacitor or wet-tantalum capacitor.

25. The method of claim 23, wherein the non-therapeutic load is a resistor.

26. A method of maintaining one or more wet-tantalum capacitors in an implantable medical device, with each capacitor having a rated voltage, a tantalum anode, and a non-tantalum cathode, the method comprising:

maintaining at least one of the wet-tantalum capacitors at a voltage equal to about 90% of its rated voltage for a time of greater than or equal to about five minutes;

discharging, after the time, the one or more of the wet-tantalum capacitors through a non-therapeutic load.

27. A method of maintaining one or more wet-tantalum capacitors in an implantable medical device, with each capacitor having a rated voltage or a maximum-energy voltage, the method comprising:

maintaining at least one of the wet-tantalum capacitors at a high voltage relative its rated voltage or maximum-energy voltage for a time; and

discharging, after the time, the one of the wet-tantalum capacitors through system leakage.

28. The method of claim 27, wherein the high voltage is about 90 percent of the rated voltage or a maximum-energy voltage for the capacitors.

29. The method of claim 27, wherein the one wet-tantalum capacitor comprises a tantalum anode and a non-tantalum cathode.

30. The method of claim 27, further including determining a value related to a capacitor leakage current, wherein the time is based on the value related to the capacitor leakage current.

31. The method of claim 27, wherein the time is greater than or equal to 15 seconds.

32. The method of claim 27, wherein the implantable device functions as a defibrillator, a cardioverter, or a pacemaker.

33. The method of claim 27, wherein each of the one or more capacitors has a 185-volts surge rating, a first nominal leakage-current rating of about 60 microamps at about 175 volts, a second nominal leakage-current rating of about 90 microamps at about 185 volts, an AC capacitance of about 490 microfarads, and an equivalent-series resistance of about 1.2 ohms.

34. A method of maintaining one or more wet-tantalum capacitors in an implantable medical device, with each capacitor having a rated voltage, the method comprising:

maintaining at least one of the wet-tantalum capacitors at a high voltage relative its rated voltage for a time greater than or equal to 15 seconds;

discharging, after the time, the one or more of the wet-tantalum capacitors through system leakage.

35. The method of claim 34, wherein the high voltage is about 90 percent of the rated voltage.

36. The method of claim 34, wherein the one wet-tantalum capacitor comprises a tantalum anode and a non-tantalum cathode.

37. A method of maintaining one or more wet-tantalum capacitors in an implantable medical device, with each capacitor having a rated voltage, a tantalum anode, and a non-tantalum cathode, the method comprising:

maintaining at least one of the wet-tantalum capacitors at a voltage equal to about 90% of its rated voltage for a time greater than or equal to about five minutes;

discharging, after the time, the one or more of the wet-tantalum capacitors through system leakage.

38. A method of maintaining one or more capacitors in an implantable medical device, with each capacitor having a rated voltage or a maximum-energy voltage, the method comprising:

maintaining at least one of the capacitors at a high voltage relative its rated voltage or maximum-energy voltage for a time greater than one minute; and

discharging, after the time, the one or more of the capacitors through system leakage,

wherein the the one of the capacitors is a hybrid capacitor or wet-tantalum capacitor.