Method and apparatus for producing an electrical property image using a charge correlation matrix

• US 6,763,263 B2
• Filed: 07/26/2001
• Issued: 07/13/2004
• Est. Priority Date: 07/26/2000
• Status: Expired due to Term

• Current Assignee: WiSys Technology Foundation, Inc.
• Original Assignee: Wisys Technology Foundation Incorporated
• Inventors: Gregory, William D., Gregory, Christopher William
• Primary Examiner(s): Smith, Ruth S.
• Application Number:
  US09/916,821
• Publication Number:
  US 20020038096A1
• Time in Patent Office: 1,083 Days
• Field of Search: 600/547, 324/692, 324/693, 324/713, 324/715, 324/717, 324/722
• US Class Current: 600/547
• CPC Class Codes: G01V 3/088 operating with electric fields G01V3/082 takes precedence

Abstract

An electrical property imaging system includes an array of sensors placed around an object to measure the surface charges thereon as a sinusoidal voltage is applied thereacross. The resulting distribution of charges inside the object are calculated using a stored charge correlation matrix. Electrical property images are produced from the internal charge distribution image.

Claims

1. A method for producing an image of an electrical characteristic of an object, the steps comprising:

a) applying a voltage to the surface of the object with an array of sensor elements;

b) measuring the surface charge at each sensor element that results from the applied voltage;

c) transforming the surface charge measurements;

d) calculating the distribution of charges inside the object by multiplying the transformed surface charge measurements by a stored charge correlation matrix; and

e) producing an image of an electrical property of the object from the internal charge distribution data calculated in step d).

2. The method as recited in claim 1 in which the array of sensor elements includes a first set of sensor elements disposed on one side of the object and a second set of sensor elements disposed on the other side of the object, and step a) is performed by applying the voltage across said first and second set of sensor elements.

3. The method as recited in claim 2 in which the surface charge is measured at each sensor element by measuring the current flowing therethrough over a preselected time interval.

4. The method as recited in claim 3 in which step b) includes combining the surface charge measurements from corresponding sensor elements in the first and second sets of sensor elements.

5. The method as recited in claim 4, in which the surface charge measurements are combined by addition.

6. The method as recited in claim 1 which includes inserting an impedance matching media between the sensor elements and the surface of the object.

7. The method as recited in claim 1 in which the image produced in step e) indicates the electrical conductivity throughout the object.

8. The method as recited in claim 1 in which the image produced in step e) indicates the dielectric constant throughout the object.

9. The method as recited in claim 1 in which the image produced in step e) is produced by setting the intensity of each pixel in the image to a level corresponding to the value of the electrical property at the corresponding location in the object.

10. The method as recited in claim 1 in which the image produced in step e) is produced by setting the color of each pixel in the image as a function of the value of the electrical property at the corresponding location in the object.

11. The method as recited in claim 1 in which the transformation performed in step c) is a Fourier transformation.

12. An imaging system for producing an image of an electrical property of an object which comprises:

an array of sensor elements for placement in electrical contact with the surface of the object;

means for applying a voltage to the array of sensor elements;

means for measuring the electrical charge at each of the sensor elements while the voltage is applied;

means for transforming the measured electrical charges to a set of transformed surface charges;

a memory storing a charge correlation matrix which relates transformed surface charges at the sensor element to internal charges at an internal array of locations in the object;

means for calculating the distribution of charges at the internal array of locations in the object by multiplying the set of transformed surface charges by the stored charge correlation matrix; and

means for producing an image from the charge distribution by calculating the value of an electrical property at each location in the internal array of locations.

13. The imaging system as recited in claim 12 in which a plurality of charge correlation matrices are provided, each charge correlation matrix being associated with a selected arrangement of sensor elements and a selected internal array of locations.

14. The imaging systems as recited in claim 13 which includes means for selecting one of the plurality of charge correlation matrices based on a prescribed image resolution.