Machine vision method and system for the inspection of a material
First Claim
1. A method of inspecting a continuous web material, the method comprising:
- illuminating the material using a light source;
defining an exposure control level based on at least one characteristic of the material;
defining a normalization level based on the at least one characteristic of the material;
using an imaging device with the defined exposure control level and the defined normalization level to provide image data corresponding to the material; and
adjusting the exposure control level of the imaging device based on the image data.
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Abstract
A machine vision method and system for inspecting a material. The system comprises a light source arranged to illuminate the material and an imaging device configured to acquire image data corresponding to at least one characteristic of the material while the material is being illuminated by the light source. An image processor is configured to normalize the image data and to control adjustment of an exposure control level for the imaging device based upon the normalized image data. An exemplary method of implementing the machine vision system may include illuminating a material using a light source and obtaining image data corresponding to the material using an imaging device. The image data may be normalized and the adjustment of an exposure control level of the imaging device may be controlled based on the normalized image data.
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Citations
15 Claims
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1. A method of inspecting a continuous web material, the method comprising:
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illuminating the material using a light source;
defining an exposure control level based on at least one characteristic of the material;
defining a normalization level based on the at least one characteristic of the material;
using an imaging device with the defined exposure control level and the defined normalization level to provide image data corresponding to the material; and
adjusting the exposure control level of the imaging device based on the image data. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A visual inspection system for inspecting a material, the system comprising:
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a light source arranged to illuminate the material;
an imaging device configured to acquire image data corresponding to the material while the material is being illuminated by the light source;
the imaging device having an exposure control level based on at least one characteristic of the material; and
an image processor configured to normalize the image data and to control adjustment of an exposure control level for the imaging device based on the image data. - View Dependent Claims (11, 12, 13, 14, 15)
a user interface configured to receive user input corresponding to an initial exposure control level.
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13. The system of claim 12, wherein the imaging device acquires image data using the initial exposure control level.
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14. The system of claim 13, wherein the image processor controls optional adjustment of the exposure control level away from the initial exposure control level based upon the intensity level of the image data.
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15. The system of claim 13, wherein the exposure control level is measured using a scale of 10% to 100% on a per-pixel basis.
Specification