Method and apparatus for optimizing exposure time in image acquisitions

• US 6,765,619 B1
• Filed: 04/04/2000
• Issued: 07/20/2004
• Est. Priority Date: 04/04/2000
• Status: Expired due to Term

• Current Assignee: Pixim, Inc. (Sony Group Corp.)
• Original Assignee: Pixim, Inc. (Sony Group Corp.)
• Inventors: Deng, Zhonghan, Ewedemi, Odutola Oluseye, Motta, Ricardo Jansson, Peng, Xi, Wei, Yi-Hen, Yang, David Xiao Dong
• Primary Examiner(s): Vu, Ngoc-Yen, Vu, Ngoc-Yen
• Assistant Examiner(s): Henn, Timothy J.
• Application Number:
  US09/542,196
• Time in Patent Office: 1,568 Days
• Field of Search: 348/362, 348/229.1, 348/230.1, 348/296, 348/297, 348/298, 348/312, 250/208.1
• US Class Current: 348/362
• CPC Class Codes: H04N 23/71 Circuitry for evaluating the brightness variation
• CPC Class Codes: H04N 23/73 by influencing the exposure time

Abstract

A method of optimizing the exposure times of regions of pixels of an image sensor array during exposure is accomplished by utilizing time interval sampling of an image sensor array comprising of pixels configured to generate digital image signals. Luminance values are extracted from each digital image signal and analyzed to determine if a pixel has reached the optimal exposure. If a pixel has reached the optimal exposure, subsequent digital image signals from this pixel will not be recorded. This preserves the recording of the optimal digital image signal generated by the pixel at the time when the pixel reached its optimal exposure. This process of selectively terminating the recording of digital image signals based on optimal exposures of the pixels can be performed on individual pixels or can be performed on a region of pixels.

Claims

1. A method for optimizing an exposure time of an image sensor during an exposure of a target, the method comprising:

a) obtaining a number of digital image signals from a corresponding number of pixels from said image sensor;

b) performing statistical analysis on luminance values derived from said number of digital image signals;

c) deriving one or more control parameters from the statistical analysis; and

d) using said one or more control parameters to alter the exposure time for said pixels in said image sensor during said exposure of a target;

wherein said exposure time comprises a number of preset time intervals and wherein said obtaining of a number of digital signals is accomplished by repeatedly sampling said number of digital signals at an end of one of said preset time intervals; and

wherein said using said control parameter to alter the exposure time comprises causing a last one of said preset time intervals to be reduced to avoid some of said digital signals reaching saturation.

2. The method as claimed in claim 1 wherein each of said pixels includes a photodetector and a circuit, said photodetector producing an analog signal when exposed to said target and said circuit converting said analog signal to one of said digital image signals.

3. The method as claimed in claim 2 wherein said photodetector in each of said pixels is fabricated on complementary metal-oxide semiconductor (CMOS).

4. The method as claimed in claim 1 wherein said statistical analysis is performed by a digital signal processor.

5. The method as claimed in claim 1 wherein said one or more control parameters is indicative of whether a pixel has reached a saturation ceiling.

6. The method as claimed in claim 1 wherein said statistical analysis is a peak value statistical analysis.

7. The method as claimed in claim 1 wherein said statistical analysis is an average value statistical analysis.

8. The method as claimed in claim 1 wherein said statistical analysis is a histogram distribution statistical analysis.

9. The method as claimed in claim 1 wherein the exposure time is altered by selectively terminating recording of digital signals from each of said number of pixels or from a region of pixels based on said one or more control parameters derived from said statistical analysis.

10. An image sensor system with an optimized exposure time having an image sensor comprising:

an array of pixel elements, each of said pixel elements having a saturation ceiling, said pixel elements producing digital signals when being exposed to a target;

a monitoring unit for sampling the digital signals at each of preset time intervals, wherein an exposure time includes a number of said preset time intervals; and

a control circuit in communication with said monitoring unit for terminating a recording of said digital signals from said pixel elements during an exposure in response to one or more control parameters derived by a statistical analysis from the sampled digital signals from said pixel elements, wherein each of said pixel elements includes a photodetector and an analog-to-digital circuit, said photodetector generating an analog signal when being exposed to a target, said analog-to-digital circuit converting said analog signal to said digital signal;

wherein said control circuit causes a last one of said preset time intervals to be reduced to avoid some of said photodetectors from being saturated based on said one or more control parameters.

11. The system as claimed in claim 10 wherein said photodetectors are based on complementary metal-oxide semiconductor (CMOS).

12. The system as claimed in claim 10 wherein said digital signal is written into a memory unit.

13. The system as claimed in claim 10 wherein said pixel elements are grouped into regions, each region having a regional saturation level and a regional saturation ceiling.

14. The system as claimed in claim 13 wherein each of said regions generates said one or more control parameters.

15. The system as claimed in claim 13 wherein said pixel elements are sampled at each of said preset time intervals during said exposure time to determine each of said photodetector'"'"'s saturation level.

16. The system as claimed in claim 13 wherein said termination of recording of said digital image signals can be performed on each of said photodetectors or for each of said regions of photodetectors.

17. The system as claimed in claim 13 wherein said controller generates said one or more control parameters based on said statistical analysis to determine if each of said regional saturation levels have reached each of said corresponding regional saturation ceilings.

18. The system as claimed in claim 17 wherein said statistical analysis is to determine a peak value within each of said regions.

19. The system as claimed in claim 17 wherein said statistical analysis is to determine an average value within each of said regions.

20. The system as claimed in claim 17 wherein said statistical analysis is to perform a histogram distribution statistical analysis.