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Verifying proximity of ground metal to signal traces in an integrated circuit

  • US 6,769,102 B2
  • Filed: 07/19/2002
  • Issued: 07/27/2004
  • Est. Priority Date: 07/19/2002
  • Status: Expired due to Term
First Claim
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1. A computer-implemented method comprising steps of:

  • (A) identifying a segment of a signal trace in a first layer of an integrated circuit design; and

    (B) determining whether there is a signal return path, in a second layer of the integrated circuit design, within a predetermined threshold distance from the signal trace segment by performing steps of;

    (1) identifying coordinates of a first signal return path in the second layer of the integrated circuit design; and

    (2) determining whether the segment coordinates differ from the first signal return path coordinates by more than the predetermined threshold distance.

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