Circuit board testing apparatus and method for testing a circuit board

• US 6,777,949 B2
• Filed: 02/19/2002
• Issued: 08/17/2004
• Est. Priority Date: 02/19/2001
• Status: Expired due to Fees

• Current Assignee: Nihon Densan Kabushiki Kaisha
• Original Assignee: Nidec-Read Corporation (Nidec Corporation)
• Inventors: Tsuji, Yoshio, Yamada, Masayoshi
• Primary Examiner(s): Le, N.
• Assistant Examiner(s): Teresinski, John
• Application Number:
  US10/076,458
• Publication Number:
  US 20020113598A1
• Time in Patent Office: 910 Days
• Field of Search: 324/501, 324/751, 324/752, 324/750, 324/753, 324/96
• US Class Current: 324/501
• CPC Class Codes: G01R 31/2805 Bare printed circuit boards
• CPC Class Codes: G01R 31/309 of printed or hybrid circuits or circuit substrates

Abstract

A circuit board testing apparatus for testing continuity and/or short-circuit of wirings formed on a circuit board, includes an electromagnetic wave irradiator which irradiates first terminals of the wirings with an electromagnetic wave so that electrons are discharged from the first terminals by photoelectric effect. Discharged electrons are trapped by an electrode which is electrically biased to have a higher potential than that of the second terminals of the wirings, thereby causing an electric current to flow through the wirings via the electrode. Existence of open-circuit and/or short-circuit of the wirings is judged based on the current flowing the wirings.

Claims

1. A circuit board testing apparatus for testing a plurality of wirings formed on a circuit board, each wiring having a first terminal and second terminal at opposite ends of each of the wirings, the apparatus comprising:

an electromagnetic wave irradiator which irradiates an electromagnetic wave onto a first terminal of a selected one of the wirings to discharge electrons from the irradiated terminal by photoelectric effect;

an electrode disposed at such a position as to trap discharged electrons;

a voltage supplier operatively connected between the electrode and the second terminal of the selected wiring to apply voltage therebetween so that the electrode has a higher potential than the second terminal of the selected wiring, the voltage supplier including a probe operatively connected to the voltage supplier and connectable to the second terminal of the selected wiring;

a current detector which detects an electric current that passes through the electrode, the probe and the second terminal of the selected wiring; and

a judger which determines existence of an open-circuit in the selected wiring based on the current detected by the current detector.

2. The circuit board testing apparatus according to claim 1, wherein the electromagnetic wave irradiator includes a deflector which changes the direction of the electromagnetic wave in such a manner as to selectively and successively irradiate the first terminals of the plurality of wirings with the electromagnetic wave.

3. The circuit board testing apparatus according to claim 1, wherein the voltage supplier includes a power source, and wherein the probe is a connector which electrically connects the power source, the electrode, the second terminal of the selected wiring, and the current detector with one another to thereby constitute a closed circuit including a space between the electrode and the first terminal of the selected wiring through which the discharged electrons flow.

4. The circuit board testing apparatus according to claim 3, wherein the connector includes a plurality of probes which are to be brought into contact with the respective second terminals of the plurality of wirings to establish electrical connections therewith, and a switch which selectively connects one of the plurality of probes to the power source.

5. The circuit board testing apparatus according to claim 1, further comprising a housing which encloses the first terminals of the plurality of wirings to constitute an airtight closed space, and a depressurizer which depressurizes the airtight closed space.

6. The circuit board testing apparatus according to claim 5, wherein the upper portion of the housing is transparent, the electric magnetic wave irradiator is located above the housing to irradiate the first terminals through the upper portion of the housing, and the electrode is formed on the housing.

7. The circuit board testing apparatus according to claim 6, wherein the electrode includes a transparent electrode formed on an upper portion of the housing.

8. The circuit board testing apparatus according to claim 6, wherein the electrode portion includes a meshed electrode formed on the upper portion of the housing, and the electromagnetic wave irradiator irradiates the first terminal through the upper portion of the housing not covered by the meshed electrode.

9. The circuit board testing apparatus according to claim 6, wherein the side wall of the housing is made of electrically conductive material and is electrically connected to the voltage supplier so as to be applied with the higher potential and function as the electrode to trap the discharged electrons.

10. The circuit board testing apparatus according to claim 1, wherein the voltage supplier includes a power source having a plus terminal and a minus terminal, and a connector which connects the selected wiring to the minus terminal of the power source, and at least a part of the unselected wirings to the the plus terminal of the power source so that the wirings connected with the plus terminal of the power source serve as the electrode to trap the discharged electrons.

11. The circuit board testing apparatus according to claim 1, wherein the voltage supplier includes a power source having a plus terminal and a minus terminal, and a switch arrangement which connects the selected wiring to the minus terminal of the power source, and all unselected wirings to the plus terminal of the power source so that the wirings connected with the plus terminal of the power source serve as the electrode to trap the discharged electrons.

12. The circuit board testing apparatus according to claim 1, wherein the voltage supplier includes a power source, and a switch which connects the second terminal of the selected wiring to the power source.

13. A circuit board testing apparatus for testing continuity and/or a short-circuit in wirings formed on a circuit board, each wiring having first and second terminals at opposite ends of the wiring, the apparatus comprising:

an electromagnetic wave irradiator which irradiates the first terminals of the wirings with an electromagnetic wave to allow electrons to be discharged from the first terminals by photoelectric effect;

an electrode arranged to trap discharged electrons;

a voltage supplier including a probe operatively connected to the voltage supplier and connectable to at least one of the second terminals of the wirings, the voltage supplier being operatively connected between the electrode and the at least one of the second terminals to apply voltage therebetween so that the electrode has a higher potential than the at least one of the second terminals;

a current detector which detects an electric current that passes through the electrode, the probe and the at least one of the second terminals; and

a judger which determines existence of an open-circuit and/or a short-circuit in at least one of the wirings based on the current detected by the current detector.

14. The circuit board testing apparatus according to claim 13, wherein the electromagnetic wave irradiator is arranged to alternatively irradiate the terminals one at a time, and the voltage supplier is to be alternatively connected with the second terminals of the wirings one at a time.

15. A circuit board testing apparatus for testing a plurality of wirings formed on a circuit board, each wiring having a first and second terminals at opposite ends of the wiring and the first terminals of the wirings being exposed on one surface of the circuit board, comprising:

an electromagnetic wave irradiator which collectively irradiates the first terminals of the wirings with electromagnetic wave to discharge electrons from the first terminals by photoelectric effect;

an electrode arranged to trap discharged electrons;

a selector for selecting one of the wirings;

a voltage supplier including a probe operatively connected to the voltage supplier and connectable to at least one of the second terminals of the wirings, the voltage supplier operatively connected between the electrode and the at least one of the second terminals to apply voltage therebetween so that the electrode has a higher potential than the at least one of the second terminals;

a current detector which detects an electric current that passes through the electrode, the probe, and the at least one of the second terminals; and

a judger which judges continuity and/or a short-circuit in at least one of the wirings based on the electric current detected by the current detector.

16. The circuit board testing apparatus according to claim 15, wherein the voltage supplier includes a power source having a plus pole connected to the electrode and a minus pole connected to the second terminal of the selected wiring, and the selector includes a switch arrangement for electrically connects the second terminals of the wirings other than the selected wiring, to the plus pole of the power source.

17. The circuit board testing apparatus according to claim 15, wherein the voltage supplier includes a power source having a plus pole connected to the electrode and a minus pole connected to the second terminal of the selected wiring, and the selector has a switch arrangement for electrically connecting the second terminal of the selected wiring to the minus pole of the power source by way of the current detector, and the respective second terminals of the wirings other than the selected wiring to the minus pole of the power source bypassing the current detector.

18. The circuit board testing apparatus according to claim 17, wherein the selector includes a switch to select one state where the second terminal of the selected wiring is electrically connected to the minus pole of the power source by way of the current detector and the second terminals of the wirings other than the selected wiring are electrically connected to the minus pole of the power source bypassing the current detector, and another state where the second terminal of the selected wiring is electrically connected to the minus pole of the power source by way of the current detector and the second terminals of the wiring other than the selected wiring are electrically connected to the plus pole of the power source.

19. The circuit board testing apparatus according to claim 15, further comprising a housing which encloses the second terminals of the plurality of wirings to form an airtight closed space, and a depressurizer which depressurizes the airtight closed space.

20. The circuit board testing apparatus according to claim 19, wherein the upper wall of the housing is transparent, the electromagnetic wave irradiator is located above the housing to irradiate the first terminals through the transparent wall, and the electrode is formed on the housing in the manner allowing the passage of the electromagnetic wave through the transparent wall.

21. A method for testing continuity and/or a short-circuit in at least one wiring formed on a circuit board, each wiring having first and second terminals, the method comprising the steps of:

providing an electrode operatively connected to a probe which is selectively connectable to at least one of the second terminals;

irradiating at least one of the first terminals of the wirings with an electromagnetic wave to discharge electrons from the at least one of the first terminals into a space by photoelectric effect;

trapping discharged electrons by the electrode having a potential higher than at least one of the second terminals of the wirings and allowing a current caused by trapped electrons to flow through the electrode, the probe and the at least one of the second terminals;

detecting the current that flows through the electrode, the probe and the at least one of the second terminals; and

judging continuity and/or a short-circuit in at least one of the wirings based on the current flowing through the wiring.

22. The method according to claim 21, further comprising the following steps which are carried out prior to said step of irradiating:

enclosing the space into which electrons are discharged; and

depressurizing the space.

23. The method according to claim 21, wherein said step of irradiating includes selectively and successively irradiating the first terminals of the wirings one by one, and an electrical potential difference is produced between the electrode and the respective second terminal of the wiring being irradiated in such a manner that the electrode has a potential higher than that of the respective second terminal.

24. The method according to claim 21, wherein said step of irradiating includes selectively and successively irradiating the first terminals of the wirings one by one, and a difference of electric potential is produced between the electrode and a second terminal of a wiring adjacent to the wiring being irradiated in such a manner that the electrode has a potential higher than that of the second terminal of the wiring adjacent to the wiring being irradiated.

25. The method according to claim 21, wherein said step of irradiating includes selectively and successively irradiating the first terminals of the wirings, and a difference of electric potential is produced between the electrode and the at least one of the second terminals or between the electrode and at least one of the second terminals of the wirings adjacent to the wiring being irradiated in such a manner that the electrode has a potential higher than that of the at least one of the second terminals.

26. A circuit board testing apparatus for testing a plurality of wirings formed on a circuit board, each wiring having a first terminal and second terminal at opposite ends of each of the wirings, the apparatus comprising:

an electromagnetic wave irradiator which irradiates an electromagnetic wave onto a first terminal of a first selected wiring to discharge electrons from the irradiated terminal by photoelectric effect;

an electrode disposed at such a position as to trap discharged electrons;

a voltage supplier operatively connected between the electrode and a second terminal of a second selected wiring to apply voltage therebetween so that the electrode has a higher potential than the second terminal of the second selected wiring, the voltage supplier including a probe operatively connected to the voltage supplier and connectable to the second terminal of the second selected wiring;

a current detector which detects an electric current that passes through the electrode, the probe and the second terminal of the second selected wiring; and

a judger which determines existence of a short-circuit in the first selected wiring based on the current detected by the current detector.

27. The circuit board testing apparatus according to claim 26, wherein the electromagnetic wave irradiator includes a deflector which changes the direction of the electromagnetic wave in such a manner as to selectively and successively irradiate the first terminals of the plurality of wirings with the electromagnetic wave.

28. The circuit board testing apparatus according to claim 26, wherein the voltage supplier includes a power source, and wherein the probe is a connector which electrically connects the power source, the electrode, the second terminal of the second selected wiring, and the current detector with one another to thereby constitute a closed circuit including a space between the electrode and the first terminal of the selected wiring through which the discharged electrons flow.

29. The circuit board testing apparatus according to claim 28, wherein the connector includes a plurality of probes which are to be brought into contact with the respective second terminals of the plurality of wirings to establish electrical connections therewith, and a switch which selectively connects one of the plurality of probes to the power source.

30. The circuit board testing apparatus according to claim 26, further comprising a housing which encloses the first terminals of the plurality of wirings to constitute an airtight closed space, and a depressurizer which depressurizes the airtight closed space.

31. The circuit board testing apparatus according to claim 30, wherein the upper portion of the housing is transparent, the electric magnetic wave irradiator is located above the housing to irradiate the first terminals through the upper portion of the housing, and the electrode is formed on the housing.

32. The circuit board testing apparatus according to claim 31, wherein the electrode includes a transparent electrode formed on an upper portion of the housing.

33. The circuit board testing apparatus according to claim 31, wherein the electrode portion includes a meshed electrode formed on the upper portion of the housing, and the electromagnetic wave irradiator irradiates the first terminal through the upper portion of the housing not covered by the meshed electrode.

34. The circuit board testing apparatus according to claim 31, wherein the side wall of the housing is made of electrically conductive material and is electrically connected to the voltage supplier so as to be applied with the higher potential and function as the electrode to trap the discharged electrons.

35. The circuit board testing apparatus according to claim 26, wherein the voltage supplier includes a power source having a plus terminal and a minus terminal, and a connector which connects the first selected wiring to the minus terminal of the power source, and at least a part of the unselected wirings to the plus terminal of the power source so that the wirings connected with the plus terminal of the power source serve as the electrode to trap the discharged electrons.

36. The circuit board testing apparatus according to claim 26, wherein the voltage supplier includes a power source having a plus terminal and a minus terminal, and a switch arrangement which connects the first selected wiring to the minus terminal of the power source, and all unselected wirings to the plus terminal of the power source sp that the wirings connected with the plus terminal of the power source serve as the electrode to trap the discharged electrons.

37. The circuit board testing apparatus according to claim 26, wherein the voltage supplier includes a power source, and a switch which connects the power source to the second terminal of the second selected wiring, and wherein the second selected wiring is adjacent to the first selected wiring.