Self-calibrating inertial measurement system method and apparatus

• US 6,778,924 B2
• Filed: 11/06/2001
• Issued: 08/17/2004
• Est. Priority Date: 11/06/2001
• Status: Expired due to Fees

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Hanse, Joel G.
• Primary Examiner(s): NOLAND, THOMAS
• Application Number:
  US10/011,459
• Publication Number:
  US 20030084704A1
• Time in Patent Office: 1,015 Days
• Field of Search: 73/17--, 73/13.7, 73/13.8, 73/18.8, 702/85-88, 702/92-94, 702/96-97, 702/FOR.158, 702/FOR.159, 702/FOR.160, 702/FOR.162, 702/FOR.163, 335/02, 333/26, 333/56
• US Class Current: 702/88
• CPC Class Codes: G01C 25/005 initial alignment, calibration or starting-up of inertial devices
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups

Abstract

A system for testing inertial measurement devices on a multi-axis rate table without having to utilize slip rings to transfer signals between the inertial measurement devices and remote processors by incorporating a processor internal to the inertial measurement devices and transferring the signals directly to the processors for determining and storing the calibration coefficients of the inertial measurement devices internally so that they are self calibrating.

Claims

1. Calibration test apparatus for use with a plurality of inertial measurement units to be mounted on a multi axis rate table and subject to various known environmental conditions to determine any differences between the outputs of the inertial measurement units and the known environmental conditions and to compute a plurality of correction coefficients to be used to modify the outputs to achieve greater accuracy, comprising:

a plurality of processors, wherein each of the plurality of processors is connected internally to a respective inertial measurement unit and programmed to have the known environmental conditions;

a connector that supplies the outputs of each inertial measurement unit to the processor located within the inertial measurement unit that supplied the outputs, wherein the outputs do not pass through slip rings; and

the plurality of processors are operable to compare the known environmental conditions with the outputs and compute the plurality of correction coefficients.

2. The calibration test apparatus of claim 1, wherein the known environmental conditions include input motion.

3. The calibration test apparatus of claim 2, wherein the environmental conditions include temperatures.

4. The calibration test apparatus of claim 3, wherein the environmental conditions include vibration.

5. The calibration test apparatus of claim 3, wherein the environmental conditions include altitude.

6. A system for calibrating an inertial measurement unit, comprising:

an inertial measurement unit that generates an output signal;

a memory device internal to the inertial measurement unit that stores a calibration coefficient;

a prep-station;

test software downloaded into the memory device from the prep-station prior to calibrating the inertial measurement unit;

a rate table that subjects the inertial measurement unit to a known plurality of motion conditions and a known plurality of environmental conditions;

a plurality of values representing the known plurality of motion conditions and the known plurality of environmental conditions;

a processor internal to the inertial measurement unit that compares the output signal to the plurality of values to compute an updated calibration coefficient, wherein the processor modifies the output signal based on the updated calibration coefficient; and

a signal path for transferring signals from the inertial measurement unit to the processor and from the processor to the inertial measurement unit, wherein the signal path does not include slip rings.

7. The system of claim 6, wherein the motion conditions include rate of motion about at least one predetermined axis.

8. The system of claim 6, wherein the motion conditions include rates of motion about three mutually perpendicular axes.

9. The system of claim 8, wherein the environmental conditions include temperatures.

10. The system of claim 9, wherein the temperatures are provided by a heater.

11. The system of claim 9, wherein the temperatures are provided by a cooler.

12. The system of claim 9, wherein the updated calibration coefficient is stored in the memory device.