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System and method to facilitate pattern recognition by deformable matching

  • US 6,785,419 B1
  • Filed: 12/22/2000
  • Issued: 08/31/2004
  • Est. Priority Date: 12/22/2000
  • Status: Expired due to Fees
First Claim
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1. A method to facilitate pattern recognition between a first pattern and a second pattern, comprisingapplying to spatial derivative of the first pattern a substantially smooth deformation field having deformation coefficients to deform the first pattern and form a deformation component of the first pattern, the substantially smooth deformation field for the first pattern further comprises a displacement component for each dimension of a space associated with the first pattern, the displacement component having associated deformation coefficients;

  • aggregating the first pattern and the deformation component of the first pattern to define a first deformed pattern; and

    determining a minimum distance between the first deformed pattern and the second pattern relative to the deformation coefficients for the first pattern.

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