Comparator with high-voltage inputs in an extended CMOS process for higher voltage levels

• US 6,788,114 B1
• Filed: 07/07/2003
• Issued: 09/07/2004
• Est. Priority Date: 06/27/2003
• Status: Expired due to Term

• Current Assignee: Dialog Semiconductor GmbH (Renesas Electronics Corporation)
• Original Assignee: Dialog Semiconductor GmbH (Renesas Electronics Corporation)
• Inventors: Killat, Dirk, Krenzke, Rainer
• Primary Examiner(s): TON, MY TRANG
• Application Number:
  US10/614,663
• Time in Patent Office: 428 Days
• Field of Search: 327/52, 327/56, 327/60, 327/63, 327/69-70, 327/72-73, 327/77-83, 327/88-90, 323/315-316
• US Class Current: 327/70
• CPC Class Codes: H03K 5/08 by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding H03K5/07 takes precedence; comparing one pulse with another H03K5/22; providing a determined threshold for switching H03K17/30
• CPC Class Codes: H03K 5/2481 with at least one differential stage

Abstract

A circuit and method are given, to realize a high voltage comparator, which generates an output signal for follow-up processing in the low-voltage domain. The high-voltage comparison task is essentially replaced by a current comparison, implemented as a combination of a voltage to current transforming stage with a CMOS current comparator circuit, where only very few parts are working in the high voltage domain. Using the intrinsic advantages of that solution the circuit of the invention is manufactured with standard CMOS technology and only four discrete or integrated extended drain MOS components at low cost. This solution reduces the complexity of the circuit and in consequence also power consumption and manufacturing cost.

Claims

1. A method for realizing a high voltage comparator comprising:

transforming static high supply voltage levels into static currents;

transforming a high-voltage input signal into a proportional current signal;

transforming a high-voltage reference into a proportional current reference;

combing said static currents and proportional current signal into a resulting current input signal;

combining said static currents and said proportional current reference into resulting reference current input;

feeding said resulting current input signal and said resulting reference current input into a current comparator circuit operating in a low-voltage domain;

comparing said resulting current input signal and said resulting reference current input within said current comparator circuit; and

generating a low voltage output signal representing the result of said current comparator circuit.

2. The method according to claim 1 wherein said step of transforming the static high voltage supply levels into the static currents is implemented using a resistor.

3. The method according to claim 1 wherein said step of transforming the static high voltage supply levels into the static currents is implemented using an equivalent resistor circuit built of semiconductor circuits.

4. The method according to claim 1 wherein said step of transforming the high-voltage input signal into the proportional current signal is implemented using a voltage to current conversion stage.

5. The method according to claim 1 wherein in said step of transforming the high-voltage reference into the proportional current reference uses a voltage proportional to the high voltage supply.

6. The method according to claim 5 wherein said voltage proportional to the high voltage supply is realized with a resistive divider consisting of two resistors.

7. The method according to claim 5 wherein said voltage proportional to the high voltage supply is realized with an equivalent resistive divider built of semiconductor circuits.

8. The method according to claim 1 wherein in said step of transforming the high-voltage reference into the proportional current reference uses an absolute reference voltage.

9. The method according to claim 8 wherein in said absolute reference voltage is implemented with the help of a separate internal semiconductor reference circuit.

10. The method according to claim 4 wherein said voltage to current conversion stage is implemented using a PMOS transistor, configured as a source follower working together with an NMOS transistor, which is employed as decoupling element for the low voltage domain.

11. The method according to claim 4 wherein said gain stage is implemented using a PMOS transistor with extended drain, configured as a source follower working together with an NMOS transistor, which is employed as decoupling element for the low voltage domain.

12. The method according to claim 4 wherein said gain stage is implemented using a PMOS transistor, configured as a source follower working together with an NMOS transistor with extended drain, which is employed as decoupling element for the low voltage domain.

13. The method according to claim 4 wherein said gain stage is implemented using a PMOS transistor with extended drain, configured as a source follower working together with an NMOS transistor with extended drain, which is employed as decoupling element for the low voltage domain.

14. A circuit, capable of comparing higher voltage signals, comprising:

means for transforming a static high voltage supply level into static currents;

means for transforming a high voltage input signal into a proportional current signal;

means for transforming a high voltage reference input into a proportional current reference;

means for combining said static current and said proportional current signal into a resulting current input signal;

means for combining said static current and said proportional reference current into a resulting reference current input;

means for feeding said resulting current input signal and said resulting reference current into a current comparison circuit;

means for comparing said resulting current input signal and said resulting reference current, designated as said current comparison circuit; and

means for generating a low voltage output signal describing the relation of said high voltage input signal and high voltage reference input representing the result of said current comparison circuit.

15. The circuit according to claim 14 wherein said means for transforming the static high voltage supply level into the static currents is a resistor.

16. The circuit according to claim 14 wherein said means for transforming the static high voltage supply level into the static currents is an equivalent resistor circuit built of semiconductor circuits.

17. The circuit according to claim 14 wherein said means for transforming the high voltage reference input into the proportional current reference uses a voltage proportional to the high voltage supply.

18. The circuit according to claim 17 wherein said voltage proportional to the high voltage supply is realized with a resistive divider consisting of two resistors.

19. The circuit according to claim 17 wherein said voltage proportional to the high voltage supply is realized with an equivalent resistive divider circuit built of semiconductor circuits.

20. The circuit according to claim 14 wherein said means for transforming the high-voltage reference into the proportional current reference uses an absolute reference voltage.

21. The circuit according to claim 20 wherein said absolute reference voltage is implemented with the help of a separate internal semiconductor reference circuit.

22. The circuit according to claim 14 manufactured with the help of discrete active and passive components.

23. The circuit according to claim 14 manufactured with the help of discrete components and integrated circuits.

24. The circuit according to claim 14 manufactured in integrated circuit technology.

25. The circuit according to claim 14 manufactured in monolithic integrated circuit technology.

26. The circuit according to claim 14 manufactured in monolithic integrated CMOS technology.

27. The circuit according to claim 14 manufactured in monolithic integrated CMOS circuit technology with additional discrete PMOS and NMOS transistors.

28. The circuit according to claim 27 manufactured in monolithic integrated CMOS circuit technology with additional discrete PMOS and NMOS transistors with extended drain technology.

29. The circuit according to claim 14 manufactured in monolithic integrated CMOS technology with additional PMOS and NMOS transistors, assembled in Chip-On-Chip technology.

30. The circuit according to claim 29 manufactured in monolithic integrated CMOS technology with additional PMOS and NMOS transistors with extended drain technology, assembled in Chip-On-Chip technology.

31. The circuit according to claim 14 wherein said means for comparing said current input signal and said reference current, designated as current comparator, is implemented in low voltage CMOS technology.