Sorting a group of integrated circuit devices for those devices requiring special testing
First Claim
1. A manufacturing process for grouping a plurality of integrated circuit devices of a type having an identification code into a group of integrated circuit devices to undergo a first process and another group of integrated circuit devices to undergo a second process different than the first process after an inspection process of integrated circuit devices, the manufacturing process comprising:
- storing data in association with an individual identification code of each of the integrated circuit devices indicating each of the integrated circuit devices undergoes one of the first process and the second process, the data including at least one of fabrication deviation data, probe data, standard test data, special test data, and enhanced reliability testing data in association with the individual identification code of at least some of the integrated circuit devices;
reading the individual identification code of each of the integrated circuit devices;
accessing the data stored in association with the individual identification code of each of the integrated circuit devices; and
grouping the integrated circuit devices in accordance with the accessed data into those integrated circuit devices to undergo the first process and those integrated circuit devices to undergo the second process.
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Accused Products
Abstract
A method for sorting integrated circuit (IC) devices of the type having a fuse identification (ID) into those devices requiring enhanced reliability testing and those requiring standard testing includes storing fabrication deviation data, probe data, and test data in association with the fuse ID of each of the devices indicating each of the devices requires either enhanced reliability testing or standard testing. The fuse ID of each of the devices is then automatically read before, during, or after standard testing of the devices. The testing process requirement data stored in association with the fuse ID of each of the devices is then accessed, and the devices are sorted in accordance with the accessed data into those devices requiring enhanced reliability testing and those requiring standard testing.
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Citations
25 Claims
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1. A manufacturing process for grouping a plurality of integrated circuit devices of a type having an identification code into a group of integrated circuit devices to undergo a first process and another group of integrated circuit devices to undergo a second process different than the first process after an inspection process of integrated circuit devices, the manufacturing process comprising:
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storing data in association with an individual identification code of each of the integrated circuit devices indicating each of the integrated circuit devices undergoes one of the first process and the second process, the data including at least one of fabrication deviation data, probe data, standard test data, special test data, and enhanced reliability testing data in association with the individual identification code of at least some of the integrated circuit devices;
reading the individual identification code of each of the integrated circuit devices;
accessing the data stored in association with the individual identification code of each of the integrated circuit devices; and
grouping the integrated circuit devices in accordance with the accessed data into those integrated circuit devices to undergo the first process and those integrated circuit devices to undergo the second process. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. An inspection process for integrated circuit devices from semiconductor wafers in a manufacturing process for integrated circuit devices, the inspection process comprising:
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providing a plurality of semiconductor wafers;
fabricating a plurality of integrated circuit devices on each of the semiconductor wafers;
causing each of the integrated circuit devices on each of the semiconductor wafers to store an individual identification code;
separating each of the integrated circuit devices on each of the semiconductor wafers to form one of a plurality of integrated circuit devices;
storing data in association with the individual identification code associated with each of the integrated circuit devices that indicates each of the integrated circuit devices to undergo one of a first process and a second process, storing of data including storing an individual identification code by programming each of the integrated circuit devices on each of the semiconductor wafers to permanently store a unique fuse identification;
reading the individual identification code associated with each of the separated integrated circuit devices;
accessing the data stored in association with the individual identification code that is associated with each of the separated integrated circuit devices;
grouping the integrated circuit devices in accordance with the accessed data into those integrated circuit devices to undergo the first process and those integrated circuit devices to undergo the second process; and
testing the grouped integrated circuit devices using the first process and the second process. - View Dependent Claims (20, 21)
further comprising causing the grouped integrated circuit devices to advance through the first process and the second process according to their grouping.
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21. The process of claim 19, wherein the integrated circuit devices modules are selected from a group comprising Single In-Line Memory Modules (SIMMs) and Dual In-line Memory Modules (DIMMs).
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22. An integrated circuit manufacturing process for separating integrated circuit devices to undergo special testing from a group of integrated circuit devices undergoing standard test procedures, the integrated circuit devices being of the type to have an identification code, the process comprising:
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storing data in association with an individual identification code of each of the integrated circuit devices indicating each of the integrated circuit devices undergoes one of special testing and standard testing;
reading the individual identification code of each of the integrated circuit devices;
accessing the data stored in association with the individual identification code of each of the integrated circuit devices; and
sorting the integrated circuit devices during the standard testing in accordance with the accessed data for those integrated circuit devices undergoing the special testing.
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23. An integrated circuit manufacturing process for separating integrated circuit devices undergoing special testing from a group of integrated circuit devices undergoing standard test procedures, the integrated circuit devices having an identification code, the process comprising:
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storing fabrication deviation data in association with an individual identification code of at least one of the integrated circuit devices indicating the at least one integrated circuit device undergoes the special testing;
reading the individual identification code of the at least one integrated circuit device;
accessing the fabrication deviation data stored in association with the individual identification code of the at least one integrated circuit device; and
sorting the integrated circuit devices in accordance with the accessed data for the at least one integrated circuit device undergoing the special testing.
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24. An integrated circuit manufacturing process for separating integrated circuit devices undergoing special testing from a group of integrated circuit devices that have undergone standard test procedures, the integrated circuit devices having an identification code, the process comprising:
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storing data in association with an individual identification code of at least one of the integrated circuit devices that indicates the at least one integrated circuit device undergoes the special testing;
reading the individual identification code of the at least one integrated circuit device;
accessing the data stored in association with the individual identification code of the at least one integrated circuit device; and
sorting the integrated circuit devices in accordance with the accessed data for the at least one integrated circuit device undergoing the special testing.
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25. An integrated circuit manufacturing process for using special test data generated by a first group of integrated circuit devices undergoing special testing to sort a second group of integrated circuit devices into those integrated circuit devices to undergo the special testing and those integrated circuit devices to undergo standard testing after the inspection of the integrated circuit devices, the integrated circuit devices having an identification code, the process comprising:
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storing data in association with an individual identification code of at least one of the second group of integrated circuit devices indicating the at least one of the second group of integrated circuit devices undergoes the special testing;
storing special test data generated by the first group of integrated circuit devices in association with the individual identification code of the at least one of the second group of integrated circuit devices indicating the at least one of the second group of integrated circuit devices undergoes the standard testing instead of the special testing;
reading the individual identification code of the at least one of the second group of integrated circuit devices;
accessing the data stored in association with the individual identification code of the at least one of the second group of integrated circuit devices; and
sorting the second group of integrated circuit devices in accordance with the accessed data so the at least one of the second group of integrated circuit devices undergoes the standard testing.
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Specification