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Sorting a group of integrated circuit devices for those devices requiring special testing

  • US 6,788,993 B2
  • Filed: 03/03/2003
  • Issued: 09/07/2004
  • Est. Priority Date: 02/17/1997
  • Status: Expired due to Fees
First Claim
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1. A manufacturing process for grouping a plurality of integrated circuit devices of a type having an identification code into a group of integrated circuit devices to undergo a first process and another group of integrated circuit devices to undergo a second process different than the first process after an inspection process of integrated circuit devices, the manufacturing process comprising:

  • storing data in association with an individual identification code of each of the integrated circuit devices indicating each of the integrated circuit devices undergoes one of the first process and the second process, the data including at least one of fabrication deviation data, probe data, standard test data, special test data, and enhanced reliability testing data in association with the individual identification code of at least some of the integrated circuit devices;

    reading the individual identification code of each of the integrated circuit devices;

    accessing the data stored in association with the individual identification code of each of the integrated circuit devices; and

    grouping the integrated circuit devices in accordance with the accessed data into those integrated circuit devices to undergo the first process and those integrated circuit devices to undergo the second process.

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