System for and method of testing a microelectronic device using a dual probe technique

• US 6,791,344 B2
• Filed: 12/28/2000
• Issued: 09/14/2004
• Est. Priority Date: 12/28/2000
• Status: Expired due to Fees

• Current Assignee: International Business Machines Corporation
• Original Assignee: International Business Machines Corporation
• Inventors: Cook, Donald J., Allard, Harvey
• Primary Examiner(s): Karlsen, Ernest
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US09/751,355
• Publication Number:
  US 20020084795A1
• Time in Patent Office: 1,356 Days
• Field of Search: 324/754, 324/755, 324/757, 324/758, 324/761, 324/762, 324/158.1, 324/537, 324/765
• US Class Current: 324/754.05
• CPC Class Codes: G01R 31/2844 using test interfaces, e.g. adapters, test boxes, switches, PIN drivers G01R31/2889 takes precedence

Abstract

A system (10) for and method of testing a device under test (DUT) (12) having a plurality of probe pads (14) utilizing a dual probe technique to overcome contact resistance that may be present. The system comprises a plurality of sensing probes (30) and a plurality of forcing probes (32) arranged in pairs consisting of one sensing probe and one forcing probe. Each pair of sensing and forcing probes is provided for contacting one of the probe pads on the DUT. Each forcing probe is in electrical communication with a power supply (20) via a switching matrix (24), and each sensing probe is in electrical communication with a voltage meter (52) via the switching matrix. During testing, at least one of the power supplies provides a voltage to a corresponding forcing probe in contact with a particular probe pad. The sensing electrode at that particular probe pad senses a voltage, which is measured by the voltmeter and is used by a feedback controller (56) to adjust the voltage supplied by the corresponding power supply to the forcing probe.

Claims

1. A system for testing a DUT having a plurality of probe pads, comprising:

a. a forcing probe for contacting and applying an electrical signal to a first portion of a first one of the plurality of probe pads;

b. a sensing probe for contacting a second portion of said first one of the plurality of probe pads spaced from said first portion and sensing said electrical signal after said electrical signal has passed from said first portion to said second portion via said first one of said plurality of probe pads; and

c. a feedback system operatively configured for adjusting the magnitude of said electrical signal applied by said forcing probe as a function of said electrical signal sensed at said sensing probe so as to achieve a desired value of said electrical signal at said second portion.

2. A system according to claim 1, further comprising a plurality of forcing probes and a plurality of feedback systems, each of said forcing probes being in electrical communication with a corresponding one of said plurality of feedback systems.

3. A system according to claim 1, wherein said feedback system includes a voltmeter for measuring said electrical signal.

4. A system according to claim 1, further comprising a probe card, said probe card supporting said forcing probe and said sensing probe.

5. A system according to claim 1, further comprising first and second sensing electrodes and a sensing instrument, said first sensing electrode in electrical communication with said feedback system, said second sensing electrode in electrical communication with said sensing instrument.

6. A system according to claim 5 wherein said sensing instrument is a current meter.

7. A system according to claim 1, further comprising a plurality of forcing probes, a plurality of feedback systems and a switching matrix, said plurality of forcing probes being selectively connectable to said plurality of feedback systems via said switching matrix.

8. A system according to claim 1, wherein said feedback system includes a feedback controller operatively configured for automatically achieving said desired value of said electrical signal.

9. A method of testing a DUT having a plurality of probe pads, comprising the steps of:

a. providing a first electrical signal to a first portion of one of the plurality of probe pads;

b. sensing said first electrical signal at a second portion of said one of the plurality of probe pads spaced from said first portion after said first electrical signal has passed through said one of the plurality of probe pads; and

c. adjusting the magnitude of said first electrical signal applied to said first portion as a function of said first electrical signal as sensed at said second portion so as to achieve a desired value of said first electrical signal as sensed at said second portion.

10. A method according to claim 9, further comprising the step of measuring a second electrical signal at a second one of the plurality of probe pads when said first electrical signal sensed at said second portion is equal to said desired value.

11. A method according to claim 9, comprising the steps of:

a. providing a plurality of first electrical signals to a number of the plurality of probe pads;

b. sensing said plurality of first electrical signals at said number of the plurality of the probe pads; and

adjusting said plurality of first electrical signals provided based upon corresponding ones of said plurality of first electrical signals sensed.

12. A method according to claim 11, wherein said plurality of first electrical signals is provided via a plurality of forcing probes and a plurality of power supplies each in electrical communication with a corresponding one of said plurality of forcing probes.

13. A method according to claim 12, farther comprising the step of selectively coupling said forcing probes to said power supplies via a switching matrix.

14. A method according to claim 12, wherein each or said power supplies includes a feedback system for adjusting a corresponding one of said plurality of first electrical signals sensed at said second portion of said one of the plurality of probe pads to a corresponding desired value.

15. A method according to claim 9, wherein said first electrical signal is provided via a forcing probe and a power supply in electrical communication with said forcing probe.

16. A method according to claim 15, further comprising a sensing probe and wherein said power supply includes a feedback system for adjusting the magnitude said first electrical signal applied by said forcing probe to said first portion of said one of the plurality of probe pads based upon said first electrical signal sensed by said sensing probe at said second portion of said one of the plurality of probe pads.

17. A method according to claim 9, further comprising the step of providing a feedback signal in proportion to said first electrical signal sensed at said second portion of said one of the plurality of probe pads for adjusting said first electrical signal applied at said first portion of said one of the plurality of probe pads.