Test head including displaceable switch element
First Claim
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1. A test head for a semiconductor integrated circuit tester, comprising:
- a support frame, a plurality of contact tins connected to tester channels of the tester, each contact pin having a free end for engaging a load board, a plurality of pin cards mounted in the support frame for implementing the tester channels, wherein the plurality of contact pins are attached to a pin card, and a conductive switch element displaceable between a first position, in which the switch element is electrically isolated from one or more contact pins, and a second position, in which the switch element is in electrically conductive contact with one or more contact pins.
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Abstract
A pin card for mounting in a test head of a semiconducter integrated circuit tester to implement test channels of the tester includes contact pins connected to terminals of respective test channels. Each contact pin has a free end for engaging a load board. A conductive switch element is displaceable between a first position, in which the switch element is electrically isolated from one or more of the contact pins, and a second position, in which the switch element is in electrically conductive contact with one or more of the contact pins.
21 Citations
9 Claims
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1. A test head for a semiconductor integrated circuit tester, comprising:
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a support frame, a plurality of contact tins connected to tester channels of the tester, each contact pin having a free end for engaging a load board, a plurality of pin cards mounted in the support frame for implementing the tester channels, wherein the plurality of contact pins are attached to a pin card, and a conductive switch element displaceable between a first position, in which the switch element is electrically isolated from one or more contact pins, and a second position, in which the switch element is in electrically conductive contact with one or more contact pins. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A test head for a semiconductor integrated circuit tester, comprising:
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a plurality of contact pins connected to tester channels of the tester, each contact pin having a free end for engaging a load board, and a conductive switch element displaceable between a first position, in which the switch element is electrically isolated from one or more contact pins, and a second position, in which the switch element is in electrically conductive contact with one or more contact pins, and wherein the switch element includes a spring member that is configured so that when the switch element is in the first position, the spring member is spaced from said one contact pin and when the switch element is in its second position the spring member is in electrically conductive pressure contact with said one contact pin.
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8. A semiconductor integrated circuit tester comprising:
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a test head comprising a plurality of contact pins connected to tester channels of the tester, each contact pin having a free end for engaging a load board, and a conductive switch element displaceable between a first position, in which the switch element is electrically isolated from one or more contact pins, and a second position, in which the switch element is in electrically conductive contact with one or more contact pins, wherein the switch element is displaceable linearly between its first position and its second position and the test head includes a follower attached to the switch element and a bias spring urging the switch element towards its first position, a load board attached to the test head and engaged by the contact pins, and an actuation element that is attached to the load board and engages the follower and urges the switch element to its second position against resistance of the bias spring.
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9. A test head for a semiconductor integrated circuit tester, comprising:
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a support frame, and a plurality of pin cards mounted in the support frame, each pin card including;
a plurality of contact pins connected to tester channels of the tester, each contact pin having a free end for engaging a load board, and a conductive switch element displaceable between a first position, in which the switch element is electrically isolated from one or more contact pins, and a second position, in witch the switch element is in electrically conductive contact with one or more contact pins.
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Specification