×

Test head including displaceable switch element

  • US 6,794,887 B1
  • Filed: 11/15/2001
  • Issued: 09/21/2004
  • Est. Priority Date: 11/15/2001
  • Status: Expired due to Fees
First Claim
Patent Images

1. A test head for a semiconductor integrated circuit tester, comprising:

  • a support frame, a plurality of contact tins connected to tester channels of the tester, each contact pin having a free end for engaging a load board, a plurality of pin cards mounted in the support frame for implementing the tester channels, wherein the plurality of contact pins are attached to a pin card, and a conductive switch element displaceable between a first position, in which the switch element is electrically isolated from one or more contact pins, and a second position, in which the switch element is in electrically conductive contact with one or more contact pins.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×