×

Method for measuring a gap between a proximity probe and a conductive target material

  • US 6,798,194 B2
  • Filed: 05/30/2003
  • Issued: 09/28/2004
  • Est. Priority Date: 10/22/1999
  • Status: Expired due to Fees
First Claim
Patent Images

1. A method for measuring a gap between a proximity probe and a conductive target material, the steps including:

  • providing a database of normalized impedance curve representations for different conductive target materials;

    measuring an impedance of a proximity probe located proximate a conductive target material being identified;

    normalizing the measured probe impedance;

    utilizing the normalized probe impedance and the database of normalized impedance curve representations for identifying the conductive target material;

    determining a gap value between the proximity probe and the conductive target material from the normalized probe impedance and the identified target material.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×