Multiple local probe measuring device and method

• US 6,798,226 B2
• Filed: 09/24/2002
• Issued: 09/28/2004
• Est. Priority Date: 09/20/1999
• Status: Expired due to Fees

• Current Assignee: European Molecular Biology Laboratory
• Original Assignee: European Molecular Biology Laboratory
• Inventors: Altmann, Stephen Maximilian, Hörber, Johann Karl Heinrich
• Primary Examiner(s): TANG, MINH NHUT
• Application Number:
  US10/252,363
• Publication Number:
  US 20030020500A1
• Time in Patent Office: 735 Days
• Field of Search: 324/750, 324/754, 324/758, 324/767, 324/662, 324/761-762, 250/306-307, 731/05
• US Class Current: 850/19
• CPC Class Codes: G01Q 20/02 by optical means
• CPC Class Codes: G01Q 40/00 Calibration, e.g. of probes
• CPC Class Codes: G01Q 70/06 Probe tip arrays
• CPC Class Codes: Y10S 977/863 Atomic force probe
• CPC Class Codes: Y10S 977/869 Optical microscope
• CPC Class Codes: Y10S 977/874 Probe tip array
• CPC Class Codes: Y10S 977/875 with tip detail

Abstract

The invention provides a probe measuring device for effecting local measurements referring to a sample, having a first probe and a second probe, a measurement condition adjustment arrangement adapted to commonly adjust a first measurement condition of the first probe with respect to a sample or a reference surface and a second measurement condition of the second probe with respect to a sample or a reference surface, a detection arrangement having a first detection arrangement associated with the first probe adapted to independently detect first measurement data referring to local measurements effected by the first probe and a second detection arrangement associated with the second probe adapted to independently detect second measurement data referring to local measurements effected by the second probe. Also provided are methods for effecting local measurements and local manipulations using multiple probes.

Claims

1. A method of effecting local measurements referring to a sample, comprising:

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective measurement condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and

effecting a measurement with respect said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,

wherein at least one of the measurement conditions is roughly adjusted on the basis of the measurement of at least one of the probes and is finely adjusted on the basis of the measurement of at least one other of the probes.

2. The method according to claim 1, wherein the probes are attached to each other by a rigid mechanical coupling.

3. The method according to claim 2, wherein the rigid mechanical coupling extends over a coupling path between the probes having a path length in the order of magnitude of the dimensions of the probes themselves.

4. The method according to claim 1, wherein local measurement data are obtained comprising interaction data indicating a local interaction with said sample or reference surface sensed by at least one of the probes and associated distance data indicating a distance relation of at least one of the probes with respect to said sample or said reference surface, said distance data being obtained or calibrated on the basis of measurements concomitantly effected with respect to at least one other of the probes.

5. The method according to claim 1, wherein the probes are scanned in a height direction associated with said sample or said reference surface.

6. The method according to claim 5, wherein interaction-distance-profiles are sensed which indicate a dependency of a local interaction sensed by a respective probe of a distance of said respective probe from said sample or said reference surface.

7. The method according to claim 6, wherein the interaction-distance profiles comprise force-distance-profiles.

8. The method according to claim 6, wherein the interaction-distance profiles comprise current-distance-profiles.

9. The method according to claim 1, wherein thermal position fluctuations of at least one of the probes are detected.

10. The method according to claim 9, wherein the position fluctuations are detected for distance relations of said at least one of the probes with respect to said sample or said reference surface, which are defined by measurements concomitantly effected with respect to at least one other of the probes.

11. The method according to claim 1, wherein the sample is an atomic, a molecular, or a macromolecular sample.

12. The method according to claim 1, wherein the sample is a biological sample.

13. The method according to claim 1, wherein the sample is a semiconductor sample.

14. The method according to claim 1, wherein the sample is a magnetic storage disc type sample.

15. The method according to claim 1, further comprising the step of functionalize at least one of the probes with respect to the sample or the reference surface.

16. The method according to claim 15, wherein the step of functionalizing involves an attachment of functionalization material on the respective probe, a chemical modification of at least a surface part of the respective probe, or impressing an electric or magnetic field on the respective probe.

17. The method according to claim 16, wherein the functionalization material is molecular material.

18. The method according to claim 16, wherein the functionalization material is at least one single atom or at least one cluster of atoms.

19. The method according to claim 17, wherein the molecular material is biological material.

20. The method according to claim 17, wherein the molecular material comprises at least one protein.

21. The method according to claim 20, wherein the protein is adapted to interact with at least one associated protein of the sample.

22. The method according to claim 17, wherein the molecular material comprises receptor molecules or ligand molecules.

23. The method according to claim 1, wherein either an interaction field or an interaction medium is provided in interaction relation with at least one of the probes and with said sample or said reference surface.

24. The method according to claim 23, wherein the interaction field is an electromagnetic field, an optical field, a static magnetic field, or a static electric field.

25. The method according to claim 23, wherein the interaction medium is a liquid, a gas, a mixture of liquids, or a mixture of gases.

26. The method according to claim 1, wherein the probes and said sample or reference surface are held under vacuum during said local measurements.

27. The method of claim 1, wherein the probes are independently selected from the group consisting of a local probe, a cantilever probe, and a local probe of the scanning near-field optical microscopy type.

28. A method of effecting local manipulations referring to a sample, comprising;

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and

manipulating said sample by means of said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,

wherein at least one of the manipulation conditions is roughly adjusted on the basis of the measurement of at least one of the probes and is finely adjusted on the basis of the measurement of at least one other of the probes.

29. The method according to claim 28, wherein the probes are attached to each other by a rigid mechanical coupling.

30. The method according to claim 29, wherein the rigid mechanical coupling extends over a coupling path between the probes having a path length in the order of magnitude of the dimensions of the probes themselves.

31. The method according to claim 28, wherein the sample is an atomic, a molecular, or a macromolecular sample.

32. The method according to claim 28, wherein the sample is a chemical or biological sample.

33. The method according to claim 32, wherein the manipulation involves a stretching, an unfolding, or an unbinding of molecular bonds of proteins, polymers, or other biological or chemical molecules.

34. The method according to claim 28, further comprising the step of functionalizing at least one of the probes with respect to the sample or the reference surface.

35. The method according to claim 34, wherein the step of functionalizing involves an attachment of functionalization material on the respective probe, a chemical modification of at least a surface part of the respective probe, or impressing an electric or magnetic field on the respective probe.

36. The method according to claim 35, wherein the functionalization material is molecular material.

37. The method according to claim 35, wherein the functionalization material is at least one single atom or at least one cluster of atoms.

38. The method according to claim 36, wherein the molecular material is biological material.

39. The method according to claim 36, wherein the molecular material comprises at least one protein.

40. The method according to claim 39, wherein the protein is adapted to interact with at least one associated protein of the sample.

41. The method according to claim 36, wherein the molecular material comprises receptor molecules or ligand molecules.

42. The method according to claim 28, wherein an interaction field or an interaction medium is provided in interaction relation with at least one of the probes and with said sample or said reference surface.

43. The method according to claim 42, wherein the interaction field is an electromagnetic field, an optical field, a static magnetic field, or a static electric field.

44. The method according to claim 42, wherein the interaction medium is a liquid, a gas, a mixture of liquids, or a mixture of gases.

45. The method according to claim 28, wherein the probes and said sample or reference surface are held under vacuum during said local manipulations.

46. A method of effecting local measurements referring to a sample, comprising:

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective measurement condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes according to at least one time constant, and

effecting a measurement with respect said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes.

47. A method of effecting local measurements referring to a sample, comprising:

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective measurement condition for at least one of the probes on the basis of measurement effected with respect to said at least one of the probes, and

obtaining measurements for the resulting measurement condition for at least one of the other probes,

wherein the measurements for said at least one of the probes are a function of the measurements for said at least one of the other probes.

48. A method of effecting local measurements referring to a sample, comprising:

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective measurement condition for at least one of the probes on the basis of measurement effected with respect to at least one other of the probes, and

effecting a measurement with respect said at least one of the probes with reference to said measurement effected with respect to said at least one other of the probes,

wherein the respective measurement conditions are stabilized by a feedback control loop.

49. A method of effecting local measurements referring to a sample, comprising:

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective measurement condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and

effecting a measurement with respect said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,

wherein a distance between an interaction or measurement section of the probes in a height direction associated with said sample or reference surface is adjustable.

50. A method of effecting local measurements referring to a sample, comprising:

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective measurement condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and

effecting a measurement with respect said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,

wherein the said measurements effected with respect to at least one other of the probes are detected by a piezo-electric detection arrangement.

51. A method of effecting local manipulations referring to a sample, comprising;

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes according to at least one time constant, and

manipulating said sample by means for said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes.

52. A method of effecting local manipulations referring to a sample, comprising:

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to said at least one of the probes, and

obtaining measurements for the resulting manipulation condition for at least one of the other probes,

wherein the measurements for said at least one of the probes are a function of the measurements for said at least one of the other probes.

53. A method of effecting local manipulations referring to a sample, comprising;

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and

manipulating said sample by means for said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,

wherein the respective measurement conditions are stabilized with by a feedback control loop.

54. A method of effecting local manipulations referring to a sample, comprising;

providing at least to probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and

manipulating said sample by means for said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,

wherein a distance between an interaction or measurement section of the probes in a height direction associated with said sample or reference surface is adjustable.

55. A method of effecting local manipulations referring to a sample, comprising;

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective manipulation condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and

manipulating said sample by means for said at least one of the probes with reference to said measurements effected with respect to said at least one other of the probes,

wherein the said measurements effected with respect to at least one other of the probes are detected by a piezo-electric detection arrangement.

56. A method of effecting local measurements referring to a sample, comprising:

providing at least two probes in a positional relation with respect to a sample or a reference surface,

adjusting a respective measurement condition for at least one of the probes on the basis of measurements effected with respect to at least one other of the probes, and

effecting a measurement with respect said at least one of the probes with reference to said measurement effected with respect to said at least one other of the probes

wherein thermal position fluctuations of at least one of the probes are detected.

57. The method according to claim 56, wherein the thermal position fluctuations are detected for distance relations of said at least one of the probes with respect to said sample or said reference surface, which are defined by measurements concomitantly effected with respect to at least one other of the probes.

58. A method of effecting local measurements referring to a sample, comprising:

providing a first probe and at least one other probe in a positional relation with respect to a sample or reference surface,

adjusting a respective measurement condition for said first probe on the basis of measurements effected with respect to said at least one other probe in the course of scanning said first probe and said at least one other probe in a height direction associated with said sample or reference surface,

effecting measurements with respect to said first probe with reference to said at least one other probe in the course of scanning said first probe and said at least one other probe in said height direction, so that local measurement data are obtained comprising interaction data indicating a local interaction with said sample or reference surface sensed by said first probe and associated distance data indicating a distance relation of said first probe with respect to said sample or reference surface, said distance data being obtained or calibrated on the basis of measurements concomitantly effected with respect to said at least one other probe, said local measurement data being interaction-distance-profile data indicating a dependency of a local interaction sensed by said first probe of a distance of said first probe from said sample or reference surface.

59. A method of effecting local measurements referring to a sample, comprising:

providing a first probe and at least one other probe in a positional relation with respect to a sample,

scanning in a first scan said first probe over said sample and acquiring topographic data by measuring the topography of said sample with said first probe,

scanning in a second scan said at least one other probe over said sample,

in the course of said second scan, adjusting a respective measurement condition for said at least one other probe on the basis of measurements effected during said second scan with respect to said first probe and on the basis of said topographic data, and

in the course of said second scan, effecting measurements with respect to said at least one other probe with reference to said measurements effected with respect to said first probe.