Properties of structure-formers for self-cleaning surfaces, and the production of the same
First Claim
1. A self-cleaning surface which has an at least partially hydrophobic, surface structure comprising elevations and depressions, where the elevations and depressions are formed by particles secured to the surface, wherein the particles have a fissured structure with elevations and/or depressions wherein the average height of the elevations and/or depressions of the particles is from 20 to 500 nm, and wherein the distance between the elevations and/or depressions of the particles is below 500 nm, and wherein the particles are secured to the surface by a physical method.
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Abstract
A self-cleaning surface which has an artificial, at least partially hydrophobic, surface structure made from elevations and depressions, where the elevations and depressions are formed by particles secured to the surface, wherein the particles have a fissured structure with elevations and/or depressions in the nanometer range; a process for making such a surface; and particles having a fissured structure with elevations and/or depressions in the nanometer range.
116 Citations
19 Claims
- 1. A self-cleaning surface which has an at least partially hydrophobic, surface structure comprising elevations and depressions, where the elevations and depressions are formed by particles secured to the surface, wherein the particles have a fissured structure with elevations and/or depressions wherein the average height of the elevations and/or depressions of the particles is from 20 to 500 nm, and wherein the distance between the elevations and/or depressions of the particles is below 500 nm, and wherein the particles are secured to the surface by a physical method.
- 10. A process for producing self-cleaning surfaces having an at least partially hydrophobic, surface structure, which comprises securing particles which have fissured structures with elevations and/or depressions on a surface by a physical method, wherein the average height of the elevations and/or depressions of the particles is from 20 to 500 nm, and wherein the distance between the elevations and/or depressions of the particles is below 500 nm.
Specification