Integrated circuit with power supply test interface
First Claim
1. A device for detecting a current in a connection of an integrated circuit, comprising:
- a semi-conductor integrated circuit chip with a power supply connection;
a carrier to which the integrated circuit chip is attached;
an external power supply terminal;
a current path on the carrier, which connects the external power supply terminal and the power supply connection;
a magnetic field sensor on the carrier in a vicinity of the current path, but outside the integrated circuit chip, wherein the magnetic field sensor senses a magnetic field generated by the current through the current path;
measurement conductor operatively coupled to the magnetic field sensor, for testing presence of the current.
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Accused Products
Abstract
An integrated circuit assembly contains a carrier and a semi-conductor integrated circuit chip 10. A current path on the carrier supplies power to power supply connection of the chip. A magnetic field sensor is provided on the carrier in a vicinity of the current path, for sensing a magnetic field generated by a current through the current path. The assembly contains test-accessible electronic interface to the magnetic field sensor, for testing presence of the current. Preferably the sensors are integrated on the carrier by depositing magneto resistive material and patterning the material so as to provide sensors in the vicinity of current paths. Also preferably, the carrier is an interposer 12 with connecting wiring, which is packaged with one or more integrated circuit chips before mounting the interposer on a printed circuit board 19.
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Citations
13 Claims
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1. A device for detecting a current in a connection of an integrated circuit, comprising:
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a semi-conductor integrated circuit chip with a power supply connection;
a carrier to which the integrated circuit chip is attached;
an external power supply terminal;
a current path on the carrier, which connects the external power supply terminal and the power supply connection;
a magnetic field sensor on the carrier in a vicinity of the current path, but outside the integrated circuit chip, wherein the magnetic field sensor senses a magnetic field generated by the current through the current path;
measurement conductor operatively coupled to the magnetic field sensor, for testing presence of the current. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
another intergrated circuit chip mounted on the carrier, and an electronic processing part integrated in the further integrated circuit chip for reading the magnetic field sensor and transferring a result of said reading to an output terminal of the carrier.
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10. A device according to claim 9, further comprising:
another magnetic field sensor on the carrier in a vicinity of a further current path to a power supply connection of the further integrated circuit chip, wherein the another magnetic field sensor senses a magnetic field generated by a current through the further current path.
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11. A device according to claim 8, wherein the magnetic field sensors are coupled to a scan chain interface, which serially reads-out test results from respective ones of the magnetic field sensors.
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12. A device according to claim 1, wherein the carrier contains a substrate, and the current path includes a through connection through the substrate, the sensor being provided in the vicinity of the through connection.
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13. A method of testing an Integrated circuit assembly with an integrated circuit chip attached to a carrier with current paths for giving access to circuits in the integrated circuit chip, the method comprising:
- measuring an electric voltage representative of a magnetic field generated by a power supply current on an interposer, wherein a sensor far the magnetic field is used that is integrated on the carrier, outside the integrated circuit.
Specification