Automatic hi-pot, megohmeter and continuity, circuit tester
First Claim
1. An apparatus used to perform an automatic high potential (hi-pot), megohmeter and continuity, circuit test, said apparatus comprising:
- a) a power source;
b) a central processing unit (cpu) connectable to said power source, said cpu containing (i) a floppy drive, (ii) a hard drive, (iii) an analog to digital (A/D) printed circuit board, and (iv) a predetermined number of digital I/O printed circuit boards;
c) a data entry means connectable to said cpu for providing input into said cpu;
d) a visual display means connected to said cpu for displaying predetermined data;
e) a power supply means connected to said power source for providing a power supply;
f) a hi-pot means connected to said power source and to said A/D printed circuit board and to at least one of said predetermined number of digital I/O printed circuit boards contained in said cpu for providing a predetermined voltage of a predetermined magnitude;
g) a multiplexer means connected to said power supply and to at least one of said predetermined number of digital I/O printed circuit boards and said hi-pot means for receiving said predetermined voltage of a predetermined magnitude and for communicating a predetermined quantity of signals indicative of said predetermined voltage of a predetermined magnitude; and
h) a predetermined number of external circuits connected to said multiplexer means for providing two-way communication of said predetermined quantity of signals.
1 Assignment
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Accused Products
Abstract
Provided is an apparatus and method used to perform automatic high potential (hi-pot), megohmeter and continuity, circuit test which includes a power source connected to a central processing unit (cpu) having a floppy drive, a hard drive, an analog to digital (A/D) printed circuit board (pcb), and a predetermined number of digital I/O pcb'"'"'s, a hi-pot device, and a power supply. A data entry device is connected to the cpu for providing input thereto. A display device is provided for displaying data. A hi-pot device is connected to the A/D pcb and to a digital I/O pcb for providing an input voltage of a predetermined magnitude. A multiplexer is connected to the power supply and to a digital I/O pcb and the hi-pot device for communicating the input voltage to a predetermined number of external circuits to provide testing of the external circuits.
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Citations
19 Claims
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1. An apparatus used to perform an automatic high potential (hi-pot), megohmeter and continuity, circuit test, said apparatus comprising:
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a) a power source;
b) a central processing unit (cpu) connectable to said power source, said cpu containing (i) a floppy drive, (ii) a hard drive, (iii) an analog to digital (A/D) printed circuit board, and (iv) a predetermined number of digital I/O printed circuit boards;
c) a data entry means connectable to said cpu for providing input into said cpu;
d) a visual display means connected to said cpu for displaying predetermined data;
e) a power supply means connected to said power source for providing a power supply;
f) a hi-pot means connected to said power source and to said A/D printed circuit board and to at least one of said predetermined number of digital I/O printed circuit boards contained in said cpu for providing a predetermined voltage of a predetermined magnitude;
g) a multiplexer means connected to said power supply and to at least one of said predetermined number of digital I/O printed circuit boards and said hi-pot means for receiving said predetermined voltage of a predetermined magnitude and for communicating a predetermined quantity of signals indicative of said predetermined voltage of a predetermined magnitude; and
h) a predetermined number of external circuits connected to said multiplexer means for providing two-way communication of said predetermined quantity of signals. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method for performing an automatic hi-pot, megohmeter and continuity circuit test, said method comprising the steps of:
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a) providing a power source;
b) connecting a cpu to said power source;
c) connecting a hi-pot means to said power source;
d) connecting a power supply means to said power source;
e) determining test parameters;
f) entering said test parameters determined in step (e) into said cpu;
g) generating a digital control signal indicative of said test parameters within said cpu;
h) communicating said digital control signal generated in step g) to said hi-pot means;
i) generating an analog signal in said hi-pot means indicative of said digital control signal;
j) communicating said analog signal generated in step i) to an A/D printed circuit board;
k) verifying said analog signal;
l) generating a digital signal with said A/D printed circuit board upon receipt of said analog signal;
m) generating a high voltage signal within said hi-pot means indicative of said digital control signal;
n) communicating said high voltage signal generated in step m) to a multiplexer means;
o) utilizing said high voltage signal communicated in step n) to perform a predetermined test on an external circuit;
p) generating a predetermined test result signal indicative of said predetermined test;
q) communicating said predetermined test result signal generated in step p) to a predetermined digital I/O printed circuit board;
r) generating a display signal upon receipt of said predetermined test result signal communicated in step q);
s) communicating said display signal generated in step r) to a visual display means; and
t) visually displaying test results. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19)
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Specification