Test architecture for microcontroller providing for a serial communication interface

• US 6,823,282 B1
• Filed: 10/05/2001
• Issued: 11/23/2004
• Est. Priority Date: 10/26/2000
• Status: Expired due to Term

• Current Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Original Assignee: Cypress Semiconductor Corporation (Infineon Technologies AG)
• Inventors: Snyder, Warren
• Primary Examiner(s): Assouad, Patrick
• Application Number:
  US09/972,003
• Time in Patent Office: 1,145 Days
• Field of Search: 702/120, 702/117, 702/118, 702/119, 702/123, 714/30, 714/31, 714/36, 714/42, 714/718, 714/724, 714/733, 714/734
• US Class Current: 702/120
• CPC Class Codes: G06F 11/267 Reconfiguring circuits for testing, e.g. LSSD, partitioning
• CPC Class Codes: G06F 11/2733 Test interface between tester and unit under test

Abstract

A method for entering test mode of an integrated circuit device is disclosed. In one embodiment of the present invention, after a lockout period, a test controller generates a signal indicating the integrated circuit is willing to enter the test mode. After the signal, the test controller monitors a test interface during a predetermined period of time for a digital password. Then, in response to a valid password being received within the predetermined period, the test controller enters the test mode. In another embodiment, in addition to the above steps, in response to the valid password being received, the test controller generates an acknowledge signal. In one embodiment, the predetermined period of time takes place during a holdoff period after the lockout period. In another embodiment, the test interface is serial.

Claims

1. A circuit for providing test mode communication, said circuit comprising:

an external interface coupled to a test controller on a bus, wherein said external interface comprises pins which are usable for another function when said circuit is not in said test mode, wherein a first of said pins of said external interface is a bi-directional data pin when in said test mode;

a first memory coupled to said bus; and

a processor coupled to said bus for receiving instructions from said first memory, wherein said test controller is for receiving, serially, commands from said external interface and for causing said processor to execute said instructions.

2. The circuit of claim 1 wherein said test controller is further for transferring commands from said external interface to said first memory.

3. The circuit of claim 1 wherein:

said circuit further comprises a second memory coupled to said bus; and

data from said second memory is externally accessible by said test controller causing said commands received from said external interface to be executed by said processor, wherein data from said second memory is supplied over said external interface.

4. The circuit of claim 3 wherein said test controller is further for receiving data from said external interface.

5. The circuit of claim 4 wherein said test controller is further for transferring said data to said second memory.

6. The circuit of claim 1 wherein said circuit further comprises:

a second memory coupled to said processor for storing commands to be executed by said processor.

7. The circuit of claim 6 wherein said test controller is further for selecting which of a plurality of instruction sources are to be executed by said microprocessor, wherein said instructions sources comprise said first and second memories.

8. The circuit of claim 1 wherein a second of said pins is for a clock signal when in said test mode.

9. A circuit for providing test mode communication, said circuit comprising:

a test controller on a bus;

a two-pin external interface coupled to said test controller;

a microprocessor coupled to said bus;

an instruction queue coupled to said microprocessor;

said microprocessor for receiving instructions from said instruction queue;

said test controller for receiving, serially, commands and data from said external interface and for causing said microprocessor to execute said instructions.

10. The circuit of claim 9 further comprising:

a first memory for storing instructions to be executed by said microprocessor when in said test mode.

11. The circuit of claim 10 wherein said test controller is operable to select between said instruction queue and said first memory, wherein the instructions fed into said microprocessor are controllable by said test controller.

12. The circuit of claim 10 further comprising:

a second memory for storing instructions to be executed by said microprocessor when said microprocessor is not in said test mode.

13. The circuit of claim 9 further comprising:

peripheral registers coupled to said bus, wherein said peripheral registers are readable by executing, in said microprocessor, instructions read in from said external interface.

14. The circuit of claim 13 wherein the data in said peripheral registers are transferable across said external interface.

15. The circuit of claim 9, wherein a first pin of said two-pin external interface is a bi-directional data pin when said circuit is in test mode.

16. A circuit for providing test mode communication, said circuit comprising:

a test controller on a bus;

a two-pin external interface coupled to said test controller;

a microprocessor coupled to said bus for receiving instructions from said test controller;

wherein said test controller is for receiving, serially, commands and data from said two-pin external interface and for causing said microprocessor to execute said instructions.

17. The circuit of claim 16 further comprising:

an instruction queue coupled to said test controller and to said microprocessor; and

wherein said test controller is operable to transfer instructions from said external interface to said instruction queue.

18. The circuit of claim 16 further comprising:

a read only memory coupled to said microprocessor, said read only memory for storing instructions to be executed by said microprocessor when in said test mode.

19. The circuit of claim 16 further comprising:

a flash memory coupled to said microprocessor, said flash memory for storing instructions to be executed by said microprocessor when not in said test mode.

20. The circuit of claim 16 further comprising:

peripheral registers coupled to said bus, wherein said peripheral registers are readable and writeable by executing, in said microprocessor, instruction read in from said external interface.

21. The circuit of claim 20 further comprising a programmable analog and digital on-chip system.

22. The circuit of claim 16, wherein a first pin of said two-pin external interface is a bi-directional data pin when said circuit is in test mode.