Systems and methods for wideband differential probing of variably spaced probe points

• US 6,828,768 B2
• Filed: 04/16/2002
• Issued: 12/07/2004
• Est. Priority Date: 04/16/2002
• Status: Expired due to Fees

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: McTigue, Michael
• Primary Examiner(s): KARLSEN, ERNEST F
• Application Number:
  US10/123,610
• Publication Number:
  US 20030193341A1
• Time in Patent Office: 966 Days
• Field of Search: 324/72.5, 324/149, 324/754
• US Class Current: 324/72.5
• CPC Class Codes: G01R 1/06738 related to tip portion
• CPC Class Codes: G01R 1/06766 Input circuits therefor
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18

Abstract

Systems and methods for wideband differential probing of variably spaced probe points are provided. One such embodiment includes a probe housing at least partially surrounding a first probe barrel and a second probe barrel. A first probe barrel end cap and a second probe barrel end cap extend respectively from the first and second probe barrels and also at least partially surround respectively a first probe tip and a second probe tip. The longitudinal axes of the first and second probe tips are offset respectively from the longitudinal axes of the first and second probe barrels. Methods are also provided.

Claims

1. An apparatus for wideband differential probing of variably spaced probe points, comprising:

a probe housing;

a first probe barrel at least partially surrounded by said probe housing;

a first probe barrel end cap extending from said first probe barrel;

a first probe tip at least partially surrounded by said first probe barrel end cap and having a longitudinal axis at a first offset angle from the longitudinal axis of said first probe barrel, wherein said first offset angle is not user-adjustable;

a second probe barrel at least partially surrounded by said probe housing;

a second probe barrel end cap extending from said second probe barrel; and

a second probe tip at least partially surrounded by said second probe barrel end cap and having a longitudinal axis at a second offset angle from the longitudinal axis of said second probe barrel, wherein said second offset angle is not user-adjustable.

2. The apparatus of claim 1, wherein said first probe barrel and said second probe barrel are each at least partially retractable within said probe housing.

3. The apparatus of claim 2, further comprising:

a first elastic compressible element engaged between said first probe barrel and said probe housing that causes said first probe barrel to at least partially extend out of said probe housing when said first probe barrel is not caused to retract within said probe housing; and

a second elastic compressible element engaged between said second probe barrel and said probe housing that causes said second probe barrel to at least partially extend out of said probe housing when said second probe barrel is not caused to retract within said probe housing.

4. The apparatus of claim 1, wherein said first probe barrel is rotatable about its longitudinal axis and said second probe barrel is rotatable about its longitudinal axis.

5. The apparatus of claim 1, wherein said first probe barrel, said first probe tip, said second probe barrel, and said second probe tip are cylindrical, and said first probe barrel end cap and said second probe barrel end cap are conical.

6. The apparatus of claim 1, wherein the longitudinal axis of said first probe barrel end cap is in-line with the longitudinal axis of said first probe tip, and the longitudinal axis of said second probe barrel end cap is in-line with the longitudinal axis of said second probe tip.

7. The apparatus of claim 1, wherein said first offset angle and said second offset angle are each at least fifteen degrees and at most twenty-five degrees.

8. The apparatus of claim 1, further comprising:

a first cable extending from said probe housing and having at least two conductors, wherein a first of said conductors is in electrical communication with said first probe tip and a second of said conductors is in electrical communication with said first probe barrel; and

a second cable extending from said probe housing and having at least two conductors, wherein a first of said conductors is in electrical communication with said second probe tip and a second of said conductors is in electrical communication with said second probe barrel.

9. The apparatus of claim 1, wherein said first probe barrel is in electrical communication with said second probe barrel.

10. An apparatus for wideband differential probing of variably spaced probe points, comprising:

a probe housing;

a first probe barrel at least partially surrounded by said probe housing;

a first probe barrel end cap extending from said first probe barrel;

a first probe tip at least partially surrounded by said first probe barrel end cap and having a longitudinal axis at a first offset angle from the longitudinal axis of said first probe barrel;

a second probe barrel at least partially surrounded by said probe housing;

a second probe barrel end cap extending from said second probe barrel; and

a second probe tip at least partially surrounded by said second probe barrel end cap and having a longitudinal axis at a second offset angle from the longitudinal axis of said second probe barrel;

a first opening in said probe housing at least partially exposing a side of said first probe barrel and a first positioning element attached to said first probe barrel and extending at least partially out of said first opening, wherein said first positioning element is configured to rotate said first probe barrel; and

a second opening in said probe housing at least partially exposing a side of said second probe barrel and a second positioning element attached to said second probe barrel and extending at least partially out of said second opening, wherein said second positioning element is configured to rotate said second probe barrel.

11. An apparatus for wideband differential probing, the apparatus comprising:

a probe housing;

a first probe barrel at least partially surrounded by said probe housing;

a first probe barrel end cap extending from said first probe barrel;

a first probe tip at least partially surrounded by said first probe barrel end cap and having a longitudinal axis at a first offset angle from the longitudinal axis of said first probe barrel; and

a first opening in said probe housing at least partially exposing a side of said first probe barrel and a first positioning element attached to said first probe barrel and extending at least partially out of said first opening, wherein said first positioning element is configured to rotate said first probe barrel.

12. The apparatus of claim 11, wherein said first probe barrel is at least partially retractable within said probe housing.

13. The apparatus of claim 11, further comprising:

a first elastic compressible element engaged between said first probe barrel and said probe housing that causes said first probe barrel to at least partially extend out of said probe housing when said first probe barrel is not caused to retract within said probe housing.

14. The apparatus of claim 11, further comprising:

a second probe barrel at least partially surrounded by said probe housing;

a second probe barrel end cap extending from said second probe barrel;

a second probe tip at least partially surrounded by said second probe barrel end cap and having a longitudinal axis at a second offset angle from the longitudinal axis of said second probe barrel; and

a second opening in said probe housing at least partially exposing a side of said second probe barrel and a second positioning element attached to said second probe barrel and extending at least partially out of said second opening, wherein said second positioning element is configured to rotate said second probe barrel.

15. The apparatus of claim 11, wherein at least one of said first offset angle and said second offset angle is set by a user.

16. An apparatus for variably-spaced wideband differential probing, the apparatus comprising:

a probe housing;

a first probe barrel at least partially surrounded by said probe housing;

a first probe barrel end cap extending from said first probe barrel;

a first probe tip at least partially surrounded by said first probe barrel end cap and having a longitudinal axis at a first offset angle from the longitudinal axis of said first probe barrel; and

a ground tip unit comprising;

a ground tip connector rotatably attached to said probe housing to provide rotation about the longitudinal axis of said first probe barrel;

a ground tip receptacle attached to said ground tip connector; and

a ground tip housed in said ground tip receptacle, wherein rotating said ground tip connector about the longitudinal axis of said first probe barrel provides variable spacing between said ground tip and said first probe tip.

17. The apparatus of claim 16, wherein said ground tip is at least partially retractable within said ground tip receptacle.