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Method and apparatus for selectively compacting test responses

  • US 6,829,740 B2
  • Filed: 01/29/2003
  • Issued: 12/07/2004
  • Est. Priority Date: 11/23/1999
  • Status: Expired due to Term
First Claim
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1. An apparatus used in testing of an integrated circuit, comprising:

  • a circuit under test that is part of the integrated circuit;

    at least one spatial compactor to compress test responses from the circuit under test; and

    a selector circuit coupled to the circuit under test and coupled to the spatial compactor and wherein the selector circuit controls the masking of one or more of the test responses that are received from the circuit under test.

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