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Method of forming field effect transistor comprising at least one of a conductive metal or metal compound in electrical connection with transistor gate semiconductor material

  • US 6,830,975 B2
  • Filed: 01/31/2002
  • Issued: 12/14/2004
  • Est. Priority Date: 01/31/2002
  • Status: Active Grant
First Claim
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1. A method of forming a line of field effect transistors respectively having a gate comprising a conductive metal or metal compound received over conductively doped semiconductive material, the method comprising:

  • forming transistor gate semiconductive material into an elongated continuous gate line over a semiconductive material channel region, the gate line comprising elongated continuous semiconductive material sidewalls of the line of field effect transistors being formed;

    oxidizing the elongated continuous semiconductive material sidewalls of the gate line; and

    after the oxidizing, forming at least one of a conductive metal or metal compound in electrical connection with the transistor gate semiconductive material to comprise a substantially coextensive elongated portion of a final construction of the elongated continuous gate line of the field effect transistors being formed, the coextensive elongated portion comprising both the transistor gate semiconductive material and the at least one of the conductive metal or metal compound.

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