Optical systems and methods for rapid screening of libraries of different materials
First Claim
1. A method of characterizing members in an array of materials, comprising the steps of:
- providing a substrate;
depositing an array of different inorganic materials onto predefined regions of said substrate, said inorganic materials differing across said substrate in a characteristic selected from composition, stoichiometry or thickness;
illuminating said array of inorganic materials while on said substrate;
monitoring luminescence output of said array of inorganic materials, with respect to spatial location within the array, with an optical imaging system;
comparing members of said array with respect to said luminescence; and
identifying materials for large scale preparation based upon said comparing step.
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Abstract
Methods and apparatus for screening diverse arrays of materials are provided. In particular, techniques for rapidly characterizing compounds in arrays of materials in order to discover and/or optimize new materials with specific desired properties are provided. The substrate can be screened for materials having useful properties, and/or the resulting materials can be ranked, or otherwise compared, for relative performance with respect to useful properties or other characterizations. In particular, systems and methods are provided for screening a library of magnetic materials for their bulk magnetization, saturation magnetization, and coercivity by imaging their individual optical Kerr rotation, screening a library of dielectric materials for their dielectric coefficients by imaging their individual electro-optical rotation and screening a library of luminescent materials by imaging their individual luminescent properties under a variety of excitation conditions. Optical or visible luminescence systems are also provided as well as their application to screening libraries of different materials.
26 Citations
20 Claims
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1. A method of characterizing members in an array of materials, comprising the steps of:
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providing a substrate;
depositing an array of different inorganic materials onto predefined regions of said substrate, said inorganic materials differing across said substrate in a characteristic selected from composition, stoichiometry or thickness;
illuminating said array of inorganic materials while on said substrate;
monitoring luminescence output of said array of inorganic materials, with respect to spatial location within the array, with an optical imaging system;
comparing members of said array with respect to said luminescence; and
identifying materials for large scale preparation based upon said comparing step. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A method of characterizing members in an array of materials, comprising the steps of:
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providing a substrate;
depositing an array of different materials on said substrate;
applying a voltage for illuminating said array of materials while on said substrate;
monitoring intensity of luminescence of said array of materials with respect to spatial location within the array with an optical imaging system;
comparing members of said array with respect to said luminescence; and
identifying materials for large scale preparation based upon said comparing step. - View Dependent Claims (16, 17)
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18. A method of characterizing members in an array of materials, comprising the steps of:
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providing a substrate;
depositing an array of different materials on said substrate, said materials differing across said substrate in a characteristic selected from composition, stoichiometry or thickness;
applying a voltage for illuminating said array of materials while on said substrate;
monitoring intensity of luminescence of said array of materials with respect to spatial location within the array with an optical imaging system;
comparing members of said array with respect to said luminescence;
comparing members of said array with a reference standard material; and
identifying materials for large scale preparation based upon said comparing steps. - View Dependent Claims (19, 20)
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Specification