Optical probes and methods for spectral analysis
First Claim
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1. A probe head for use with a spectrometer to analyze a material, the probe head comprising:
- a light source arranged to irradiate a sample volume of the material proximate the probe head and thereby irradiate any material disposed in the same volume, an optical pick-up arranged to receive light emitted from the irradiated sample volume and transmit the emitted light to the spectrometer for analysis, an optical blocking element positioned in the optical path between the light source and the optical pick-up to force the optical path into the sample volume, and a reference shutter for selectively blocking light emitted from the irradiated sample volume from reaching the optical pick-up to facilitate calibration of the spectrometer; and
a housing that includes a sample window, into contact with which the blocking element is biased, which window is so positioned with respect to the light source, the sample volume, and the optical pick-up that the light source irradiates the sample volume through the sample window, and the light emitted from the sample volume to the optical pick-up travels through the sample window.
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Abstract
The present invention relates to spectral analysis systems and methods for determining physical and chemical properties of a sample by measuring the optical characteristics of light emitted from the sample. In one embodiment, a probe head for use with a spectrometer includes an optical blocking element for forcing the optical path between the light source and an optical pick-up optically connected to the spectrometer into the sample. The probe head also includes a reference shutter for selectively blocking light emitted from the sample from reaching the optical pick-up to facilitate calibration of the spectrometer.
173 Citations
36 Claims
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1. A probe head for use with a spectrometer to analyze a material, the probe head comprising:
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a light source arranged to irradiate a sample volume of the material proximate the probe head and thereby irradiate any material disposed in the same volume, an optical pick-up arranged to receive light emitted from the irradiated sample volume and transmit the emitted light to the spectrometer for analysis, an optical blocking element positioned in the optical path between the light source and the optical pick-up to force the optical path into the sample volume, and a reference shutter for selectively blocking light emitted from the irradiated sample volume from reaching the optical pick-up to facilitate calibration of the spectrometer; and
a housing that includes a sample window, into contact with which the blocking element is biased, which window is so positioned with respect to the light source, the sample volume, and the optical pick-up that the light source irradiates the sample volume through the sample window, and the light emitted from the sample volume to the optical pick-up travels through the sample window. - View Dependent Claims (2, 3, 4, 5)
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6. A method of spectroscopically analyzing a material comprising:
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irradiating a sample volume of the material with light from a light source, transmitting light emitted from the irradiated sample volume to an optical pick up that is optically connected to a spectrometer, forcing an optical path between the light source and the optical pick-up into the sample volume, so positioning an optical blocking element as thereby to inhibit reflections from a sample window within the optical path from reaching the optical pick-up, selectively blocking light emitted from the irradiated sample volume from reaching the optical pick-up to facilitate calibration of the spectrometer. - View Dependent Claims (7)
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8. A probe head for use with a spectrometer to analyze a material, the probe head comprising:
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a housing having a first chamber, which includes a solid transparent first window and is separated from a second chamber, which includes a solid transparent second window, a light source disposed in the first chamber and arranged to irradiate a sample volume of the material with a plurality of wavelengths of light, a wavelength separator disposed in the second chamber, the wavelength separator receiving light reflected from the irradiated sample volume to produce spatially separated light of different wavelengths, and a detector disposed in the second chamber and positioned to receive the spatially separated light from the wavelength separator, the detector transmitting a signal representative of the intensity of the spatially separated light received from the wavelength separator;
wherein the first and second window are in substantially the same plane.- View Dependent Claims (9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A spectrometer for analyzing a material, the spectrometer comprising:
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a probe head comprising a housing having a first chamber, which includes a solid transparent first window separated from a second chamber, which includes a solid transparent second window, a light source disposed in the first chamber arranged to irradiate a sample volume of the material with a plurality of wavelengths of light, a wavelength separator disposed in the second chamber, the wavelength separator receiving light reflected from the irradiated sample volume to produce spatially separated light of different wavelengths, and a detector disposed in the second chamber and positioned to receive the spatially separated light from the wavelength separator, the detector generating a signal representative of the intensity of the spatially separated light received from the wavelength separator, and a computer coupled to the detector and housed separately from the probe head, the computer receiving the signal generated by the detector and analyzing the sample volume based on the signal;
wherein the first window and second window are in substantially the same plane.- View Dependent Claims (23, 24)
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25. A method of spectroscopically analyzing a material with a spectrometer, the method comprising:
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irradiating a sample volume of the material with a plurality of wavelengths of light from a light source positioned in a first chamber, receiving light reflected from the irradiated sample volume in a second chamber, so positioning an optical blocking element as thereby to inhibit reception of light that has been reflected from the sample'"'"'s surface, and separating wavelengths of the received light to produce spatially separated light of different wavelengths, and detecting intensity of the spatially separated light with a detector positioned in the second chamber and connected to the spectrometer. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32, 33, 34, 35)
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36. A method of spectroscopically analyzing a material flowing within a sample containment apparatus, the method comprising:
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positioning a probe head of a spectrometer on the sample containment apparatus. irradiating a sample volume of the material within the sample containment apparatus with a plurality of wavelengths of light from a light source positioned in a first chamber of the probe head, receiving light reflected from the irradiated sample volume in a second chamber of the probe head, separating wavelengths of the received light to produce spatially separated light of different wavelengths, and detecting intensity of the spatially separated light with a detector positioned in the second chamber.
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Specification