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Circuit including a built-in self-test

  • US 6,836,866 B2
  • Filed: 10/22/2001
  • Issued: 12/28/2004
  • Est. Priority Date: 04/20/1999
  • Status: Expired due to Fees
First Claim
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1. A built-in self-test circuit to be connected to an external device, the circuit comprising:

  • a logic circuit having a structure to be tested;

    a structural testing device for testing said structure of said logic circuit;

    a functional circuit connected to said structural testing device through an indirect interface, said functional circuit driving said logic circuit through a direct interface;

    said functional circuit receiving test commands from the external device through a standard interface; and

    said functional circuit at least partially forwarding the test commands to said indirect interface for indirectly driving said logic circuit.

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