Apparatus and method for detecting items in objects

• US 6,839,406 B2
• Filed: 05/21/2001
• Issued: 01/04/2005
• Est. Priority Date: 11/13/1999
• Status: Expired due to Term

• Current Assignee: Smiths Heimann GmbH (Smiths Group International Holdings Ltd.)
• Original Assignee: Smiths Heimann GmbH (Smiths Group International Holdings Ltd.)
• Inventors: Schall, Patricia, Cordes, Frank, Hartick, Martin, Ries, Hermann
• Primary Examiner(s): Church, Craig E.
• Assistant Examiner(s): Kao, Chih-Cheng Glen
• Application Number:
  US09/860,593
• Publication Number:
  US 20030169843A1
• Time in Patent Office: 1,324 Days
• Field of Search: 378/57, 378/70, 378/83, 378/88, 378/147, 378/71, 378/82, 378/86
• US Class Current: 378/70
• CPC Class Codes: G01N 23/20 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
• CPC Class Codes: G01V 5/22 Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
• CPC Class Codes: G01V 5/222 measuring scattered radiation
• CPC Class Codes: G01V 5/224 Multiple energy techniques using one type of radiation, e.g. X-rays of different energies
• CPC Class Codes: G21K 5/04 with beam-forming means

Abstract

A method and an apparatus for detecting items in objects, such as in luggage, wherein a detector apparatus, functioning as a second detector is divided into a lower testing stage and a higher testing stage. In the lower testing stage, the coordinates of the object location are determined, and subsequently, a diffraction apparatus is moved to this location in the higher testing stage. In particular, X-ray diffraction can be employed to determine the explosive material of the item in the object. The diffraction apparatus comprises a collimator/detector arrangement, which is disposed to be adjusted height-wise and laterally in the higher testing stage, with a laterally-adjustable X-ray source, which is synchronized with the collimator/detector arrangement. The collimator/detector arrangement preferably has only one collimator and one detector. The collimator preferably has a conically-expanding ring slot, which a predetermined angle Θ_M of a scatter radiation.

Claims

1. A method for detecting an item in an object, comprising the steps of:

in a lower testing stage in a detection apparatus,

scanning the object with x-rays to detect said item;

determining the location of said item in said object, said location including only one set of first and second dimensional coordinates of said item, said location being representative of a point within said object; and

transmitting said location to a higher testing stage in said detection apparatus; and

in said higher testing stage,

directly testing said item at said location, with said direct testing comprising x-ray diffraction analysis, said diffraction apparatus comprising an x-ray source and a detector, the x-ray source being adjustably positioned in a plane parallel to a travel direction of said object, the detector being adjustably positioned in a plane parallel and in a plane perpendicular to the travel direction of said object,

wherein the x-ray source and detector are positioned separately and synchronously on the basis of said point.

2. The method of claim 1, wherein

said first dimensional coordinate of said location is determined from a detector associated with a beam path of a fanned x-ray beam, and

said second dimensional coordinate is determined from an initial belt position of the item on a transport device for transporting the object between the two testing stages.

3. The method of claim 1, wherein a spatial position and dimension of said item in said object is determined in said higher testing stage.

4. The method of claim 1, wherein said object is luggage.

5. The method of claim 1, wherein in said higher testing stage said item is directly tested at said location by positioning the diffraction apparatus at said location.

6. The method according to claim 1, wherein said item is directly tested at said location in said higher testing stage with a pencil shaped X-ray beam.

7. A method for detecting an item in an object, comprising the steps of:

in a lower testing stage in a detection apparatus, scanning the object with x-rays to detect said item;

determining the location of said item in said object, said location including only one set of first, second, and third dimensional coordinates of said item, said location being representative of a point within said object; and

transmitting said location to a higher testing stage in said detection apparatus; and

in said higher testing stage,

directly testing said item at said location, with said direct testing comprising x-ray diffraction analysis with a diffraction apparatus, said diffraction apparatus comprising an x-ray source and a detector, the x-ray source being adjustably positioned in a plane parallel to a travel direction of said object, the detector being adjustably positioned in a plane parallel and in a plane perpendicular to the travel direction of said object,

wherein the x-ray source and detector are positioned separately and synchronously on the basis of said point, and

wherein said third dimensional coordinate is determined from a fanned X-ray beam in said lower testing stage.

8. The method of claim 7, wherein said step of directly testing includes moving the diffraction apparatus in said higher testing stage directly to interrogate the location described by said first, second, and third dimensional coordinates, and converting scattered radiation resultant from this location into a signal that can be evaluated and subjected to processing.

9. The method of claim 7, wherein a spatial position and dimension of said item in said object is determined in said higher testing stage.

10. The method of claim 7, wherein said object is luggage.

11. A method for detecting an item in an object, comprising the steps of:

in a lower testing stage in a detection apparatus,

scanning the object with x-rays to detect said item;

determining the location of said item in said object, said location including only one set of first and second dimensional coordinates of said item, said location being representative of a point within said object; and

transmitting said location to a higher testing stage in said detection apparatus; and

in said higher testing stage,

directly testing said item at said location, with said direct testing comprising x-ray diffraction analysis with a diffraction apparatus, said diffraction apparatus comprising an x-ray source and a detector, the x-ray source being adjustably positioned in a plane parallel to a travel direction of said object, the detector being adjustably positioned in a plane parallel and/or in a plane perpendicular to the travel direction of said object,

wherein the x-ray source and detector are positioned synchronously on the basis of said point,

wherein said first dimensional coordinate of said location is determined from a detector associated with a beam path of a fanned x-ray beam,

wherein said second dimensional coordinate is determined from an initial belt position of the item on a transport device for transporting the object between the two testing stages, and

wherein said step of directly testing includes moving the diffraction apparatus in said higher testing stage directly to interrogate the location of said item, with said diffraction apparatus being further moved at least one of vertically and laterally along the beam path determined in said lower testing stage, and converting scattered radiation resultant from the detection of the item in the higher testing stage into a signal that can be evaluated and subjected to processing.

12. A method for detecting an item in an object, comprising the steps of:

in a lower testing stage in a detection apparatus,

scanning the object with x-rays to detect said item;

determining the location of said item in said object, said location including only one set of first and second dimensional coordinates of said item, said location being representative of a point within said object; and

transmitting said location to a higher testing stage in said detection apparatus;

in said higher testing stage,

directly testing said item at said location, with said direct testing comprising x-ray diffraction analysis with a diffraction apparatus; and

determining an average atomic number of the material of said item, said determining comprising using first and second detection devices disposed inside said diffraction apparatus,

wherein said first dimensional coordinate of said location is determined from a detector associated with a beam path of a fanned x-ray beam, and said second dimensional coordinate is determined from an initial belt position of the item on a transport device for transporting the object between the two testing stages, and

wherein said step of directly testing includes moving the diffraction apparatus in said higher testing stage directly to interrogate the location of said item, with said diffraction apparatus being further moved at least one of vertically and laterally along the beam path determined in said lower testing stage, and converting scattered radiation resultant from the detection of the item in the higher testing stage into a signal that can be evaluated and subjected to processing.

13. A method for detecting an item in an object, comprising the steps of:

in a lower testing stage in a detection apparatus,

scanning the object with x-rays to detect said item;

determining the location of said item in said object, said location including only one set of first, second, and third dimensional coordinates of said item, said location being representative of a point within said object; and

transmitting said location to a higher testing stage in said detection apparatus; and

in said higher testing stage,

directly testing said item at said location, with said direct testing comprising x-ray diffraction analysis with a diffraction apparatus, and

determining an average atomic number of the material of said item, said determining comprising using first and second detection devices disposed inside said diffraction apparatus,

wherein said third dimensional coordinate is determined from a second fanned X-ray beam in said lower testing stage, and

wherein said step of directly testing includes moving the diffraction apparatus in said higher testing stage directly to interrogate the location described by said first, second, and third dimensional coordinates, and converting scattered radiation resultant from this location into a signal that can be evaluated and subjected to processing.

14. An apparatus for detecting an item in an object, comprising:

a detection apparatus having a lower testing stage, a higher testing stage, and a computer;

said lower testing stage comprising a first X-ray source, a detector device, a transport device for an object disposed between the source and detector device, and a marking device for indicating a position of an object on the transport device, with said detector device and said marking device being connected to said computer,

said higher testing stage being located downstream from said lower testing stage and comprising a diffraction apparatus, with said diffraction apparatus being adjustably positionable in said higher testing stage and being controlled by said computer,

wherein said diffraction apparatus is positioned based on a location, which is representative of a point within said object, said diffraction apparatus comprising a second x-ray source and a detector, the second x-ray source being adjustably positioned in a plane parallel to a travel direction of said object, the detector being adjustably positioned in a plane parallel and in a plane perpendicular to the travel direction of said object, and

wherein the second x-ray source and detector are positioned separately and synchronously on the basis of said point.

15. The apparatus of claim 14, wherein

said detector of said diffraction apparatus is a collimator/detector apparatus,

said second X-ray source being adjustable laterally by a first adjustment element controlled by the computer;

said collimator/detector apparatus is oriented toward said second X-ray source; and

said collimator/detector is mounted on a second adjustment element controlled by the computer to adjust the height of said collimator/detector relative to said second X-ray source, and to adjust the collimator/detector laterally and synchronously with lateral adjustments of said second X-ray source.

16. The apparatus of claim 15, wherein said collimator/detector arrangement comprises a collimator and a detector having an X-ray sensitive surface disposed behind said collimator, said collimator defining a conically-expanding round slot, which simulates a predetermined angle, said round slot being oriented toward the X-ray sensitive surface of said detector.

17. The apparatus of claim 14, wherein said detector of said diffraction apparatus is a collimator/detector apparatus, and said diffraction apparatus further comprises:

a first adjustment element for laterally adjusting said second X-ray source, said first adjustment element being controlled by said computer;

a second adjustment element for laterally and vertically adjusting said collimator/detector, said second adjustment element being controlled by said computer,

whereby a spacing between said collimator/detector and said second X-ray source is adjustable, and the collimator/detector is laterally adjustable synchronously with lateral adjustments of said second X-ray source.

18. An apparatus for detecting an item in an object, comprising:

a detection apparatus having a lower testing stage, a higher testing stage, and a computer;

said lower testing stage comprising a first X-ray source, a detector device, a transport device for an object disposed between the source and detector device, and a marking device for indicating a position of an object on the transport device, with said detector device and said marking device being connected to said computer; and

said higher testing stage being located downstream from said lower testing stage and comprising a diffraction apparatus, with said diffraction apparatus being adjustably positionable in said higher testing stage and being controlled by said computer,

wherein said diffraction apparatus is positioned based on a location, which is representative of a point within said object,

wherein said diffraction apparatus comprises a second X-ray source and a collimator/detector apparatus, said second X-ray source being adjustable laterally by a first adjustment element controlled by the computer,

wherein said collimator/detector apparatus is oriented toward said second X-ray source, and said collimator/detector is mounted on a second adjustment element controlled by the computer to adjust the height of said collimator/detector relative to said second X-ray source, and to adjust the collimator/detector laterally synchronously with lateral adjustments of said second X-ray source,

wherein said collimator/detector arrangement comprises a collimator and a detector having an X-ray sensitive surface disposed behind said collimator, said collimator defining a conically-expanding round slot, which simulates a predetermined angle, said round slot being oriented toward the X-ray sensitive surface of said detector, and

wherein said collimator additionally has a central blind-bore opening containing first and second exactly spaced detection devices.

19. The apparatus of claim 18, wherein said first and second detection devices detect relatively lower and higher energy X-rays, respectively.

20. The apparatus of claim 18, wherein the collimator/detector arrangement is oriented toward a primary beam of the second X-ray source and aligned thereto using the first and second detection devices.

21. An X-ray examining apparatus for detecting an item in an object, comprising:

a transport device for transporting the object through the X-ray examining apparatus;

a lower testing stage having a first X-ray source for producing a fan shaped X-ray beam and a L-shaped detector, the object being transported by the transport device through the fan shaped X-ray beam; and

a higher testing stage being located downstream from the lower testing stage, the higher testing stage including a second X-ray source, a second detector, and a collimator, the collimator allowing an X-ray beam to pass therethrough from the second X-ray source to the second detector,

wherein upon detection of an item in the object in the lower testing stage, the lower testing stage provides the higher testing stage with a point location of the item within the object,

wherein the second X-ray source, the second detector, and the collimator are synchronously and adjustably positioned based upon the point location of the item within the object,

wherein the second x-ray source is adjustably positioned in a plane parallel to a travel direction of said object, the detector and collimator are adjustably positioned in a plane parallel and in a plane perpendicular to the travel direction of said object, and

wherein the second X-ray source and the second detector are adjustable separately from one another.

22. A method for detecting an item in an object, comprising the steps of:

transporting an object through an X-ray examining apparatus;

detecting, in a lower testing stage, the item in the object, the lower testing stage utilizing at least a first X-ray source, which produces a fan shaped X-ray beam, and a L-shaped detector for detecting the item;

determining a point location of the detected item in the object;

providing a higher testing stage with the point location of the detected item, the higher testing stage having a second X-ray source, a second detector, and a collimator;

adjusting a position of the second X-ray source and the second detector separately and synchronously based upon the point location of the item within the object, the second x-ray source being adjustably positioned in a plane parallel to a travel direction of said object, the detector and collimator being adjustably positioned in a plane parallel and in a plane perpendicular to the travel direction of said object; and

examining, in the higher testing stage via the second X-ray source, the second detector, and the collimator, the object at the point location of the item within the object.

23. An X-ray examining apparatus comprising:

a lower testing stage having a first x-ray source and a first detector associated therewith, the lower testing stage scanning an object with x-rays and determining a location of an item within the object; and

a higher testing stage being provided downstream from the lower testing stage and receiving the object from the lower testing stage via a transport device, the higher testing stage having a second x-ray source and a second detector, the second x-ray source and second detector being adjustably and separately positioned from one another in a plane parallel or in a plane perpendicular to a travel direction of the object on the basis of the location of the item within the object, the higher testing stage directly examining the item within the object via x-ray diffraction analysis.