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Electronic test system and method

  • US 6,839,650 B2
  • Filed: 11/19/2001
  • Issued: 01/04/2005
  • Est. Priority Date: 11/19/2001
  • Status: Active Grant
First Claim
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1. An electronic test system for testing an electronic device under test (DUT), said test system comprising:

  • an electronic processor;

    an electronic memory coupled to said electronic processor;

    a hierarchical program structure residing in said memory and executed by said processor, said hierarchical program structure having multiple levels including a measurement level corresponding to a measurement to be performed on said DUT, a test level corresponding to one or more of said measurements, and a procedure level corresponding to an ordered list of said tests to be performed on said DUT.

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