System and software for database structure in semiconductor manufacturing and method thereof
First Claim
1. A method comprising the steps of:
- storing information representing a first semiconductor process measurement in a first table of a relational database, the first semiconductor process measurement associated with a first unit having a first aggregation level; and
storing information representing a second semiconductor process measurement in the first table, the second semiconductor process measurement associated with a second unit having a second aggregation level different from the first aggregation level.
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Abstract
The functionality of various process control and data collection system embodiments may be improved by employing the database methodology disclosed herein during the requirements-analysis phase for data collection and process control in a semiconductor manufacturing environment. The relational database storage technology as disclosed herein consists of a set of interconnected tables, where each table has a field or an amalgamation of fields (primary key) that uniquely identifies each record (tuple) in the table. In addition, the method as disclosed herein utilizes foreign keys, which represent the value of a primary key for a related table. Aggregation levels are also employed in the method as disclosed herein to associate data from various production
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Citations
44 Claims
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1. A method comprising the steps of:
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storing information representing a first semiconductor process measurement in a first table of a relational database, the first semiconductor process measurement associated with a first unit having a first aggregation level; and
storing information representing a second semiconductor process measurement in the first table, the second semiconductor process measurement associated with a second unit having a second aggregation level different from the first aggregation level. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A system comprising:
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a processor;
memory operably associated with said processor;
a program of instructions to be stored in said memory and executed by said processor, said program of instructions including instructions to;
store information representing a first semiconductor process measurement in a first table of a relational database, the first semiconductor process measurement associated with a first unit having a first aggregation level; and
store information representing a second semiconductor process measurement in the first table, the second semiconductor process measurement associated with a second unit having a second aggregation level different from the first aggregation level. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A computer readable medium tangibly embodying a program of instructions, said program of instructions including instructions to:
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store information representing a first semiconductor process measurement in a first table of a relational database, the first semiconductor process measurement associated with a first unit having a first aggregation level; and
store information representing a second semiconductor process measurement in the first table, the second semiconductor process measurement associated with a second unit having a second aggregation level different from the first aggregation level. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32, 33, 34)
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35. A method comprising the steps of:
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storing, in a first table of a relational database, a first primary key identifying a semiconductor production run;
storing, in a second table of a relational database, a second primary key identifying a production unit;
storing, in the second table, a first foreign key to associate the production unit with the semiconductor production run;
storing, in the second table, information identifying an aggregation level of the production unit;
storing, in a third table of the relational database, process measurement information;
storing, in the third table, a third primary key identifying a production unit reading;
storing, in the third table, the first foreign key to associate process measurement information with the semiconductor production run; and
storing, in the third table, the second foreign key to associate the process measurement information with the production unit. - View Dependent Claims (36, 37, 38, 39, 40, 41, 42, 43, 44)
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Specification