Non-invasive electrical measurement of semiconductor wafers

• US 6,842,029 B2
• Filed: 04/11/2002
• Issued: 01/11/2005
• Est. Priority Date: 04/11/2002
• Status: Expired due to Fees

• Current Assignee: Semiconductor Physics Laboratory, Inc.
• Original Assignee: Solid State Measurements, Inc.
• Inventors: Howland, William H.
• Primary Examiner(s): Le, N.
• Assistant Examiner(s): Lair, Donald M.
• Application Number:
  US10/120,661
• Publication Number:
  US 20030227292A1
• Time in Patent Office: 1,006 Days
• Field of Search: 324/716, 324/719, 324765-767, 324/769, 324/158.1, 324/754, 324/715, 324/500, 438/14, 438/15, 438/17, 438/18, 257 40- 48
• US Class Current: 324/750.25
• CPC Class Codes: G01R 31/2886 Features relating to contacting the IC under test, e.g. probe heads; chucks G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06
• CPC Class Codes: G01R 31/312 by capacitive methods
• CPC Class Codes: H01L 22/14 for electrical parameters, e.g. resistance, deep-levels, CV, diffusions by electrical means
• CPC Class Codes: H01L 2924/00 Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Abstract

A multi-probe assembly includes a chuck assembly configured to receive a back or front surface of a semiconductor wafer. A multi-probe holder has a plurality of probes each having an elastically deformable conductive tip movable into contact with a front surface of a dielectric or a front surface of a semiconducting material. A means applies an electrical stimulus to each tip, measures a response to the electrical stimulus, and determines at least one electrical property of the dielectric and/or the semiconducting material. A method for measuring at least one electrical property applies a probe (or plurality of probes) having an elastically deformable conductive tip to a scribe line(s). An electrical stimulus is applied to the probe or one of the probes with the remaining probes grounded. A response to the electrical stimulus is measured and at least one electrical property of the semiconductor wafer is determined from the response.

Claims

1. A semiconductor wafer multi-probe assembly, comprising:

a chuck assembly configured to receive a surface of a semiconductor wafer;

a multi-probe holder having a plurality of probes, each of the plurality of probes having an elastically deformable conductive tip movable into contact with (i) a front surface of a dielectric formed on a front surface of semiconducting material forming the semiconducting wafer or (ii) a front surface of the semiconducting material; and

a means for selectively applying an electrical stimulus to each elastically deformable conductive tip, for measuring a response to the electrical stimulus, and for determining from the response at least one electrical property of the dielectric and/or the semiconducting material,

wherein when each elastically deformable conductive tip is in contact with the semiconducting material, said means applies a capacitance-voltage (CV), a capacitance-time (Ct), a conductance-voltage (GV) or current-voltage (IV) type electrical stimulus and measures the respective CV, Ct, GV or IV response of the semiconducting material to the electrical stimulus.

2. The semiconductor wafer multi-probe assembly as set forth in claim 1, wherein the chuck assembly receives a back surface of the semiconductor wafer.

3. The semiconductor wafer multi-probe assembly as set forth in claim 2, wherein the multi-probe holder further includes a plate with a plurality of apertures, with each probe slidably received in a corresponding aperture.

4. The semiconductor wafer multi-probe assembly as set forth in claim 3, wherein:

the multi-probe holder further includes a sleeve extending from the plate in the same direction as the conductive probes, and

when the plate is positioned over the semiconductor wafer, the sleeve contacts the chuck assembly to locate each of the tips of the plurality of probes in contact with the front surface of the dielectric or the front surface of the semiconducting material.

5. The semiconductor wafer multi-probe assembly as set forth in claim 3, wherein:

the multi-probe holder further includes a plurality of legs extending from the plate in the same direction as the conductive probes, and

when the plate is positioned over the semiconductor wafer, the plurality of legs contacts the chuck assembly to locate each of the tips of the plurality of probes in contact with the front surface of the dielectric or the front surface of the semiconducting material.

6. The semiconductor wafer multi-probe assembly as set forth in claim 2, wherein the multi-probe holder further includes an arm with a plurality of apertures, with each probe slidably received in a corresponding aperture.

7. The semiconductor wafer multi-probe assembly as set forth in claim 6, wherein:

the multi-probe holder further includes a sleeve extending from the arm in the same direction as the conductive probes, and

when the arm is positioned over the semiconductor wafer, the sleeve contacts the vacuum chuck to locate each of the tips of the plurality of probes in contact with the front surface of the dielectric or the front surface of the semiconducting material.

8. The semiconductor wafer multi-probe assembly as set forth in claim 6, wherein:

the multi-probe holder further includes a plurality of legs extending from the arm in the same direction as the conductive probes, and

when the plate is positioned over the semiconductor wafer, the plurality of legs contacts the vacuum chuck to locate each of the tips of the plurality of probes in contact with the front surface of the dielectric or the front surface of the semiconducting material.

9. The semiconductor wafer multi-probe assembly as set forth in claim 1, wherein the chuck assembly receives a front surface of the semiconductor wafer.

10. The semiconductor wafer multi-probe assembly as set forth in claim 9, wherein the multi-probe holder further includes a plate with each probe affixed to the plate by a spring configured to apply a spring force axially along a length of the probe in a direction away from the plate.

11. The semiconductor wafer multi-probe assembly as set forth in claim 9, wherein the multi-probe holder further includes an arm with each probe affixed to the arm by a spring configured to apply a spring force axially along a length of the probe in a direction away from the plate.

12. The semiconductor wafer multi-probe assembly as set forth in claim 9, wherein the chuck assembly further includes a plurality of apertures extending therethrough, with each probe slidably received within a corresponding aperture.

13. The semiconductor wafer multi-probe assembly as set forth in claim 12, wherein the multi-probe holder further includes a plurality of sleeves, with each sleeve received in a corresponding aperture such that each probe is slidably received in a corresponding sleeve.

14. The semiconductor wafer multi-probe assembly as set forth in claim 9, wherein the multi-probe holder is coupled with a lifting mechanism which raises the multi-probe holder into a position where each of the tips of the plurality of probes presses against the front surface of the dielectric or the front surface of the semiconducting material.

15. A method of measuring at least one electrical property of a semiconductor wafer, the method comprising the steps of:

(a) providing a probe having an elastically deformable conductive tip;

(b) forming a first electrical contact between the tip and a scribe line of the semiconductor wafer;

(c) forming a second electrical contact with the semiconductor wafer;

(d) applying a capacitance-voltage (CV), a capacitance-time (Ct), a capacitance-voltage (GV) or current-voltage (IV) type electrical stimulus between the first electrical contact and the second electrical contact;

(e) measuring a CV, Ct, GV or IV response of the semiconductor wafer to the electrical stimulus; and

(f) determining from the response at least one electrical property of the semiconductor wafer.

16. The method as set forth in claim 15, wherein:

in step (a) a plurality of probes is provided;

in step (b) one tip of one of the plurality of probes forms a first electrical contact with a scribe line of the semiconductor wafer; and

in step (c) the remaining tips of the plurality of probes form the second electrical contact with scribe lines of the semiconductor wafer, wherein the second electrical contact is a series of ground contacts.

17. The method as set forth in claim 16, further including the step of repeating steps (b)-(f) for each of the plurality of probes.