Apparatus and method for calibrating voltage spike waveforms
First Claim
Patent Images
1. An apparatus for calibrating voltage spikes used in testing an electrical device, comprising:
- an input for receiving a voltage spike;
power supply inputs for receiving power for energizing the electrical device under test, the power supply inputs comprising a high voltage input, a common input and a ground input;
a plurality of outputs comprising a high voltage output, a common output, and a ground output, the plurality of outputs being configured for connection to corresponding high voltage, common and ground inputs of the electrical device, the common power supply input and ground power supply input being connected to the common output and ground output, respectively; and
a circuit joined to selectably connect and disconnect the power supply high voltage input to and from, respectively, the high voltage output, said circuit further joined to select a pair of the plurality of outputs, said circuit being capable of transforming the voltage spike received at the input into a predetermined voltage spike waveform for application to the selected pair of outputs.
2 Assignments
0 Petitions
Accused Products
Abstract
An apparatus and method for calibrating single phase voltage spikes used in testing single phase electrical equipment. Capacitance is selected from a capacitor network in order to adjust the single phase voltage spike so as to produce a predetermined voltage spike waveform having particular waveform characteristics that are required to perform survivability and compatibility tests.
-
Citations
17 Claims
-
1. An apparatus for calibrating voltage spikes used in testing an electrical device, comprising:
-
an input for receiving a voltage spike;
power supply inputs for receiving power for energizing the electrical device under test, the power supply inputs comprising a high voltage input, a common input and a ground input;
a plurality of outputs comprising a high voltage output, a common output, and a ground output, the plurality of outputs being configured for connection to corresponding high voltage, common and ground inputs of the electrical device, the common power supply input and ground power supply input being connected to the common output and ground output, respectively; and
a circuit joined to selectably connect and disconnect the power supply high voltage input to and from, respectively, the high voltage output, said circuit further joined to select a pair of the plurality of outputs, said circuit being capable of transforming the voltage spike received at the input into a predetermined voltage spike waveform for application to the selected pair of outputs. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
-
-
11. A method of testing an electrical device, comprising:
-
providing an electrical device under test having high voltage, common and ground inputs;
providing a power source for energizing the electrical device under test wherein the power source has high voltage, common and ground outputs and connecting the common and ground outputs of the power source to the common and ground inputs, respectively, of the electrical device under test;
selecting a pair of inputs of the electrical device;
connecting the power supply high voltage input to the high voltage input of the electrical device under test if the selected pair of inputs comprises the high voltage and common inputs of the electrical device;
generating a voltage spike;
transforming the voltage spike into a predetermined voltage spike waveform; and
applying the predetermined voltage spike waveform to the selected pair of inputs of the electrical device under test. - View Dependent Claims (12, 13, 14, 15, 16, 17)
-
Specification