Method for measuring a gap between a proximity probe and a conductive target material

• US 6,847,217 B2
• Filed: 05/30/2003
• Issued: 01/25/2005
• Est. Priority Date: 10/22/1999
• Status: Expired due to Fees

• Current Assignee: Bently Nevada Incorporated (General Electric Company)
• Original Assignee: Bently Nevada Incorporated (General Electric Company)
• Inventors: Slates, Richard D.
• Primary Examiner(s): Tokar, Michael
• Assistant Examiner(s): KOBERT, RUSSELL MARC
• Application Number:
  US10/452,677
• Publication Number:
  US 20030206006A1
• Time in Patent Office: 606 Days
• Field of Search: 324/603, 324/662, 324/671, 324/699, 324/713, 324/716, 324/207.15, 324/207.16, 702/155, 702/158, 702/166
• US Class Current: 324/716
• CPC Class Codes: G01B 7/003 for measuring position, not involving coordinate determination coordinate measuring G01B7/004
• CPC Class Codes: G01B 7/023 for measuring distance between sensor and object G01B7/082 and G01B7/102 take precedence
• CPC Class Codes: G01D 18/00 Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
• CPC Class Codes: G01D 5/202 by movable a non-ferromagnetic conductive element G01D5/2033 takes precedence
• CPC Class Codes: G01N 27/9046 by analysing electrical signals

Abstract

A digital eddy current proximity system including a digital impedance measuring device for digitally measuring the proximity probes impedance correlative to displacement motion and position of a metallic target object being monitored. The system further including a cable-length calibration method, an automatic material identification and calibration method, a material insensitive method, an inductive ratio method and advanced sensing characteristics.

Claims

1. A method for measuring a gap between a proximity probe and a conductive target material, the steps including:

providing a database having a defined series of gap locus each representative of the same gap for different target materials stored therein;

measuring an impedance of a proximity probe located proximate a conductive target material to be monitored;

normalizing the measured probe impedance;

comparing the normalized probe impedance with the defined series of gap locus stored in the database for determining a gap locus which defines a gap between the proximity probe located proximate the conductive target material such that the defined gap is substantially correct for any conductive target material located proximate the proximity probe for providing a material insensitive method for measuring gaps between the proximity probe and different conductive target materials.

2. The method of claim 1 wherein the step of providing the database having the defined series of gap locus each representative of the same gap for different target materials includes using a lookup table to represent the defined series of gap locus.

3. The method of claim 1 wherein the step of providing the database having the defined series of gap locus each representative of the same gap for different target materials includes using at least one equation to represent the defined series of gap locus.

4. A method for measuring a gap between a proximity probe and a conductive target material, the steps including:

providing a representation of a defined series of gap locus each representative of the same gap for different target materials;

measuring an impedance of a proximity probe located proximate a conductive target material, the proximity probe including a probe cable;

compensating an impedance contribution of the probe cable from the measured probe impedance to define a measured coil impedance;

normalizing the measured coil impedance;

determining a gap value between the proximity probe and the conductive target material from the normalized coil impedance and the representation of the defined series of gap locus wherein the gap value is substantially correct for any conductive target material adjacent the proximity probe thereby providing a material insensitive method for measuring gap values between the proximity probe and different conductive target materials.

5. The method of claim 4 wherein the determining step further includes comparing the normalized coil impedance with the representation of the defined series of gap locus in the database for determining a gap locus that corresponds to the normalized impedance value of the coil for defining the gap value between the proximity probe and the conductive target material wherein the gap value is substantially correct for different conductive target materials adjacent the proximity probe thereby providing the material insensitive method for measuring gap values between the proximity probe and different conductive target materials.