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Test probe

  • US 6,847,224 B2
  • Filed: 10/15/2002
  • Issued: 01/25/2005
  • Est. Priority Date: 10/15/2002
  • Status: Expired due to Fees
First Claim
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1. A probe for detecting abnormalities in an electrical device having a structure through which leakage flux passes, comprising:

  • a sense coil; and

    a probe core disposed with the sense coil and configured so that first and second sensing end portions of the core are supported in a spaced contact-free relationship between and facing opposed adjacent surfaces of portions of the electrical device to form first and second air gaps between the first and second sensing end portions of the core and the respective opposed adjacent surfaces.

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