Semiconductor die analysis via fiber optic communication
First Claim
1. A system for analyzing circuitry in a semiconductor die, the system comprising:
- a stimulation arrangement adapted to stimulate circuitry in the die;
an optical signal generator adapted to generate optical signals in response to the stimulated circuitry and including a plurality of laser diodes and a multiplexer, wherein at least one of the laser diodes is adapted to convert a detected electrical characteristic into one of the optical signals; and
an analysis device adapted to receive the optical signals and analyze the circuitry therefrom.
1 Assignment
0 Petitions
Accused Products
Abstract
Semiconductor analysis is improved via the use of fiber optic communications. According to an example embodiment of the present invention, a stimulation device is adapted to stimulate an integrated circuit die, and the die generates a response to the stimulation. An optical signal generator, either incorporated into the die or coupled to the die, detects the response, converts the response to an optical signal and transmits the optical signal. The optical signal is received at a testing arrangement adapted to analyze the die therefrom. The optical signal is used to analyze the die, improving signal quality and the ability to perform high-speed analysis of the die.
-
Citations
7 Claims
-
1. A system for analyzing circuitry in a semiconductor die, the system comprising:
-
a stimulation arrangement adapted to stimulate circuitry in the die;
an optical signal generator adapted to generate optical signals in response to the stimulated circuitry and including a plurality of laser diodes and a multiplexer, wherein at least one of the laser diodes is adapted to convert a detected electrical characteristic into one of the optical signals; and
an analysis device adapted to receive the optical signals and analyze the circuitry therefrom. - View Dependent Claims (2, 3, 4, 5, 6, 7)
-
Specification