Method and device for near-field measuring of non-controlled radiation
First Claim
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1. Apparatus for determining radio-electric radiation characteristics emitted by a device, the apparatus comprising:
- at least one sensor so disposed and arranged relative to the device to produce a plurality of sets of simultaneous near field radiation measurements in a measurement surface in the radiation field of the apparatus;
means for determining an ensemble of measurement points sampling the measurement surface, to choose the number of points for simultaneous measurement which will be measured for each set of measurements, and to produce successive measurements on all the combinations of sets of measurement points which can be produced in the ensemble of determined points; and
a processor arranged responsive to said sets of measurements for estimating at least one statistical property of the radiated fields at a point outside the measurement surface.
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Abstract
An electric field emitted by an electronic equipment is measured by producing at least one radiation measurement in the radiating field of the equipment. Several sets of simultaneous near-field measurements, within a measuring surface located at a short distance from the equipment, are performed. The sets of performed measurements are processed by estimating the statistical properties of the radiated field at any point outside the measuring surface.
40 Citations
60 Claims
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1. Apparatus for determining radio-electric radiation characteristics emitted by a device, the apparatus comprising:
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at least one sensor so disposed and arranged relative to the device to produce a plurality of sets of simultaneous near field radiation measurements in a measurement surface in the radiation field of the apparatus;
means for determining an ensemble of measurement points sampling the measurement surface, to choose the number of points for simultaneous measurement which will be measured for each set of measurements, and to produce successive measurements on all the combinations of sets of measurement points which can be produced in the ensemble of determined points; and
a processor arranged responsive to said sets of measurements for estimating at least one statistical property of the radiated fields at a point outside the measurement surface. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. Method for determining radio-electric radiation characteristics emitted by an apparatus, of the type comprising producing at least one radiation measurement in the radiation field of the apparatus, wherein said method comprises the steps of:
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carrying out a plurality of sets of simultaneous near field measurements, within a measurement surface located close to the apparatus, by determining an ensemble of measurement points sampling the measurement surface, to choose the number of points for simultaneous measurement which will be measured for each set of measurements, and to produce successive measurements on all the combinations of sets of measurement points which can be produced in the ensemble of determined points; and
applying a processing method of said sets of measurements carried out comprising estimating the statistical properties of the radiated fields at any point outside the measurement surface. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19, 20)
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21. Method for determining radio-electric radiation characteristics emitted by an apparatus, of the type comprising producing at least one radiation measurement in the radiation field of the apparatus, wherein said method comprises the steps of:
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carrying out a plurality of sets of simultaneous near field measurements, within a measurement surface located close to the apparatus, wherein said sets of simultaneous measurements are constituted of couples of simultaneous measurements; and
applying a processing method of said sets of measurements carried out comprising estimating the statistical properties of the radiated fields at any point outside the measurement surface. - View Dependent Claims (22, 23, 24, 25, 26, 27, 28, 29, 30, 31)
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32. Method for determining radio-electric radiation characteristics emitted by an apparatus, of the type comprising producing at least one radiation measurement in the radiation field of the apparatus, wherein said method comprises the steps of:
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carrying out a plurality of sets of simultaneous near field measurements, within a measurement surface located close to the apparatus, wherein said sets of simultaneous measurements are constituted of a number of simultaneous measurements greater than two, such as triplets or quadruplets of simultaneous measurements; and
applying a processing method of said sets of measurements carried out comprising estimating the statistical properties of the radiated fields at any point outside the measurement surface. - View Dependent Claims (33, 34, 35, 36, 37, 38, 39, 40, 41, 42)
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43. Apparatus for determining radio-electric radiation characteristics emitted by a device, the apparatus comprising:
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at least one sensor so disposed and arranged relative to the device to produce a plurality of sets of simultaneous near field radiation measurements in a measurement surface in the radiation field of the apparatus, wherein said sets of simultaneous measurements are constituted of couples of simultaneous measurements; and
a processor arranged responsive to said sets of measurements for estimating at least one statistical property of the radiated fields at a point outside the measurement surface. - View Dependent Claims (44, 45, 46, 47, 48, 49, 50, 51)
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52. Apparatus for determining radio-electric radiation characteristics emitted by a device, the apparatus comprising:
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at least one sensor so disposed and arranged relative to the device to produce a plurality of sets of simultaneous near field radiation measurements in a measurement surface in the radiation field of the apparatus, wherein said sets of simultaneous measurements are constituted of number of simultaneous measurements greater than two, such as triplets or quadruplets of simultaneous measurement; and
a processor arranged responsive to said sets of measurements for estimating at least one statistical property of the radiated fields at a point outside the measurement surface. - View Dependent Claims (53, 54, 55, 56, 57, 58, 59, 60)
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Specification